[dernière mise à jour : janvier 2011]
Articles et communications publiés dans des revues à comité de lecture
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Abel M., Robach Y., Porte L.- Stress induced surface structures and reactivity of thin layer Pd/Cu(110) deposits.- Surface Science, vol. 498, p. 244-, 2002
Afanas’ev V.V., Houssa M., Stesmans A., Adriaenssens G.J., Heyns M.M.- Band alignment at the interface of Al2O3 and ZrO2-based insulators with metals and Si.- Journal of Non-Crystalline Solids, vol. 303, p. 69-77, 2002
Aguir K., Lemire C., Lollman D.B.B.- Electrical properties of reactively sputtered WO3 thin films as ozone gas sensor.- Sensors and Actuators B, vol. 4208, p. 1-5, 2002
Auriac N., Martinuzzi S.- Trap profiling at nanocavity bands in silicon wafers by means of capacitance-voltage measurements, .- J. of Physics, Condensed Matter., 14, 13087-94 (2002)
Barakel D., Périchaud I., Ulyashin A., Martinuzzi S.- N-P junction formation in p-type silicon by H ion implantation .- Solar Energy Material and Solar Cells 72, 285 (2002)
Barrère J., Chabriel G.- A compact sensor array for blind separation of sources.- IEEE Transactions on Circuits and Systems, Part I, vol. 49, n° 5, p. 565 -574, 2002
Barthélemy H., Fabre A.- A second generation current controlled conveyor with negative intrinsic resistance.- IEEE Transaction on Circuits and Systems I, vol. 49, n° 1, p. 63-65, 2002
Barthélemy H., Meillère S., Kussener E.- CMOS sinusoidal oscillator based on currrent-controled current conveyors.- Electronics Letters, vol. 38, n° 21, p.1254-1256, 2002
Bechade J-L., Brenner R., Goudeau P., Gailhanou M.- Influence of temperature on X-ray diffraction analysis of ZrO2 oxide layers formed on zirconium based alloys using synchrotron radiation.- Mat. Science Forum, 404-407, 803-8 (2002)
Bedoya C., Muller C., Jacob F., Gagou Y., Fremy M-A., Elkaim E.- Magnetic field-induced orientation in Co-doped SrBi2Ta2O9 ferroelectric oxide.- Journal of Physics : Condensed Matter, vol. 14, p. 11849-11857, 2002
Belhi R., Mliki N., Jomni S., Ayadi M., Abdelmoula K., Gergaud P., Clugnet G., Charai A.- The correlation between mechanical stress and magnetic properties of cobalt ultra thin films.- Thin Solid Films, 414, 119-122 (2002)
Bendahan M., Lauque P., Lambert-Mauriat C., Carchano H., Seguin J.L.- Sputtered thin films of CuBr for ammonia microsensors : morphology, composition and ageing.- Sensors and Actuators B, vol. 84, p. 6-11, 2002
Benielli D., Bergeon N., Jamgotchian H., Billia B., Voge P.- Free growth and instability morphologies in directional melting of alloys.- Physical Review E, vol. 65, p. 051604-, 2002
Bennour F., Rogez J., Mathieu J. C.- Enthalpie de formation de l'hydrate Na2SiO3 5H2O .- Ann. Chim. Sc. Mat. 27, 107-114 (2002)
Bernard F., Paris S., Vrel D., Gailhanou M., Gachon J.C., Gaffet E.- Time-resolved XRD experiments adapted to SHS reactions: autoreview.- Intern. Journ. of Self-Propagating High-Temperature Synthesis, 11, no.2, 181-90 (2002)
Bernardini J., Monchoux J.P., Chatain D, Rabkin E.- Liquid metal penetration in metallic polycrystals : new tools for a challenging unsolved problem of materials science.- Journal de Physique IV, n° 12, p. 229-237, 2002
Beszeda I., Imre A.W., Gontier-Moya E.G., Moya F., Beke D.L., Si Ahmed A.- Kinetics of morphological changes in nanoscale metallic films followed by Auger Electron Spectroscopy.- Defect and Diffusion Forum, volumes 216-217, p. 269-, 2002
Bigault T., Bocquet F., Labat S., Thomas O., Renevier H.- Chemically diffuse interface in (111) Au-Ni multilayers: an anomalous X-Ray diffraction analysis.- Appl. Surf. Science 188, 110-114 (2002)
Cavassilas N., Aniel F., Fishman G., Adde R.- Full-band matrix solution of the Boltzmann transport equation and electron impact ionization in GaAs.- Solid State Electronics, vol. 46, no. 4, p. 559-566, 2002
Cavassilas N., Autran J. L., Aniel F., Fishman G.- Energy and temperature dependence of electron effective mass in silicon.- Journal of Applied Physics, vol. 92, p. 1431-1433, 2002
Celestini F., Debierre J.M.- Measuring kinetic coefficients by molecular dynamics simulation of zone melting.- Physical Review E, vol. 65, p. 041605-1-7, 2002
Chamard V., Metzger T. H., Bellet-Amalric E., Daudin B., Mariette H.- Investigation of GaN quantum dot stacking in multilayers with x-ray grazing incidence techniques.- Mat. Sci. and Engin. B 93, 24 (2002)
Chamard V., Metzger T. H., Ferrero C., Bellet-Amalric E., Daudin B., Mariette H., Mula G., Structure and ordering of GaN quantum dot multilayer investigated by x-ray grazing incidence techniques,.- Physica E 13, 1115 (2002)
Chamard V., Setzu S., Romestain R.- Light assisted formation of porous silicon investigated by x-ray diffraction and reflectivity,.- Appl. Surf. Science 191, 319 (2002)
Charai A., Kutcherinenko I., Penisson J. M., Pontikis V., Priester L., Wolski K., Vystavel T.- Electron microscopy and Auger spectroscopy study of the wetting of the grain boundaries in the systems Mo-Pb, Mo-Sn, Mo-Ni and Ni-Pb.- J. de Physique IV, 12, 277-287 (2002)
Charrier A., A. Coati, T.Argunova, F. Thibaudau, Y. Garreau, R. Pinchaux, I. Forbeaux, J.M. Debever, M. Sauvage-Simkin, and J.M. Themlin.- Solid-state decomposition of silicon carbide for growing ultra-thin heteroepitaxial graphite films.- Journal of Applied Physics, vol. 92, n° 5, p. 2479-, 2002
Charrin L., Becquart-Gallissian A., Combe A., Gonzales G., Charai A.- Key experimental parameters for internal-band formation: relationship between stress and oxidation kinetics in silver-magnesium alloys.- Oxidation of metals 57, 81-98 (2002)
Chocyk D., Proszynki A., Gladyszewski G., Labat S., Gergaud P., Thomas O.- Stresses in multilayered systems: test of the sin2y method .- Adv. Eng. Materials 4, 557 (2002)
Chocyk D., Proszynsky A., Gladyszevski G. , Labat S., Gergaud P., Thomas O.- Determination of stress in Au/Ni multilayers by symmetric and asymmetric X-ray diffraction.- Optica Aplicata 32, 333-337 (2002)
Coulet M.-V., Céolin R., Bellissent R., Beuneu B., Bergman C., Ambroise J.-P., Bichara C.- A new experimental method for studying phase separation through neutron diffraction : the case of As-rich liquid alloys in the As-S system..- J. Non Cryst. Solids 312-314, 404-8 (2002)
Croix J., U. Goerlach, C. Hu-Guo, P. Schmitt, C. Colledani and Y. Hu.- Test of APV-DMILL circuit with silicon and MSGC microstrip detectors for CMS.- Nuclear Instruments and Methods in Physics Research, vol. A484, n° 3, p. 503-514, 2002
Drouard E., Huguet-Chantôme P., Escoubas L., Flory F.- Dn/dT measurements performed using guided waves and their application to the temperature sensitivity of WDM filters.- Applied Optics, vol. 41, n° 16, p. 3132-3136, 2002
Erdelyi Z., Beke D. L., Bernardini J., Girardeaux Ch , Rolland A.- Investigations of diffusion kinetics by Auger electron spectroscopy.- Diffusion and Defect Data. Solid State Data. Part A, Defect and Diffusion Forum, vol. 203-205, p. 131-146, 2002
Erdelyi Z., Girardeaux C., Tokei Zs., Beke D.L., Cserhati Cs., Rolland A.- Investigation of the interplay of nickel dissolution and copper segregation in Ni/Cu(111) system.- Surface Science, vol. 496, n° 1-2, p. 129-140, 2002
Ersen O., Pierron-Bohnes V., Ulhaq-Bouillet C., Pirri C., Tuilier M-H., Berling D., Bertoncini P., Gailhanou M., Thiaudiere D.- Epitaxy stabilised CaF2-type ternary Col-xFe xSi2 silicides on Si(111): DAFS and HRTEM measurements.- Applied Surface Science, 188, no.1-2, 146-50(2002)
Ersen O., Ulhaq-Bouillet C., Pierron-Bohnes V., Tuilier M-H., Berling D., Bertoncini P., Pirri C., Gailhanou M., Thiaudiere D.- Evidence of a ternary Co1-xFexSi2 phase with a CaF2-type structure: High-resolution transmission electron microscopy and diffraction anomalous fine structure study.- Appl. Phys. Letters, 81, no.13,. 2346-8(2002)
Escoubas L., Drouard E., Flory F.- Theoretical study of amplitude and phase filtering of guided waves.- Applied Optics, vol. 41, n° 16, p. 3084-3091, 2002
Flory F., Escoubas L., Lazaridès B.- Artificial anisotropy and polarizing filters.- Applied Optics, vol. 41, n° 16, p. 3332-3335, 2002
Gagou Y., C. Muller, N. Aliouane, E. Elkaim, G. Nihoul, P. Saint-Grégoire.- Structural and electrical properties of the new ferroelectric PbK2LiNb5O15.- Ferroelectrics, vol. 268, p. 417-422, 2002
Garros X., Leroux C., Autran J.L.- An efficient model for accurate C-V characterization of high-k gate dielectrics using a mercury probe.- Electrochemical and Solid-State Letters, vol. 5, n° 3, p. F4-F6, 2002
Gauthier V., Bernard F., Gaffet E., Vrel D., Gailhanou M., Larpin J.P.- Investigations of the formation mechanism of nanostructured NbAl 3 via MASHS reaction. Intermetallics, 10, no.4, 377-89 (2002)
Gavillet J., Loiseau A., Ducastelle F., Thair S., Bernier P., Stéphan O., Thibault J., Charlier J.-C. .- Microscopic mechanisms for the catalyst assisted growth of single wall carbon nanotubes .- Carbon 40 , 1649-1663 (2002)
Girardeaux C., Clugnet G., Erdelyi Z., Nyeki J., Bernardini J., Beke D. L., Rolland A.- How to measure accurately mass transport in thin films by AES.- Surface and Interface Analysis, vol. 34, p. 389-392, 2002
Haldenwang P., Guérin R.- Transverse thermal effects in directional solidification.- Journal of Crystal Growth, vol. 244, p. 108-122, 2002
Hamard C., Lancin M., Marhic C., Pena O.- Intergrowth between binary and ternary phases in Chevrel phase compounds RE-MO6Se8 containing heavy rare earth elements.- Mat. Sc.i Eng. A 333, 250-261 (2002)
Hayn R., Pashchenko V.A., Stepanov A., Masuda T. and Uchinokura K.- Magnetic anisotropy of BaCu2Si2O7 : theory and antiferromagnetic resonance.- Physical Review B, vol. 66, p.184414-, 2002
Hennet L., Thiaudiere D., Gailhanou M., Landron C., Coutures J-P., Price D.L.- Fast X-ray scattering measurements on molten alumina using a 120° curved position sensitive detector.- Rev. of Scient. Instruments, 73, no.1, 124-9 (2002)
Houssa M., Autran J.L., Stesmans A., Heyns M.M.- Model for interface defect and positive charge generation in ultrathin SiO2/ZrO2 gate dielectric stacks.- Applied Physics Letters, vol. 81, p. 709-711, 2002
Huguet-Chantôme P., Escoubas L., Flory F.- Guided-wave technique for the measurement of dielectric thin-film materials thermal properties.- Applied Optics, vol. 41, p. 3127-3131, 2002
Izard V., Record M.C., Tedenac J.C.- Mechanical alloying of a new promising thermoelectric material, Sb3Zn4 .- Journ. of Alloys and Compounds, 345, 257-264 (2002)
Jarmar T., Seger J., Ericson F., Mangelinck D., Smith U. and Zhang S.L.- Morphological and phase stability of nickel germanosilicide on Si1-xGex under thermal stress.- Journal of Applied Physics, vol. 92, p. 7193-, 2002
Labat S., Guichet C., Thomas O., Gilles B., Marty A.- Microstructural analysis of Au/Ni multilayers interfaces by SAXS and STM.- Appl. Surf. Science, 188, no.1-2, 182-7 (2002)
Lambert-Mauriat C., Lauque P., Seguin J.L., Albinet G., Bendahan M., Debierre J.M., Knauth P.- Solid state electrolysis in CuBr mixed ionic-electronic conductor thin films : observation and modelling of fractal growth.- ChemPhysChem, vol. 3, n° 1, p. 107-110, 2002
Lauque P., Laugier J.M., Jacolin C., Bendahan M., Lemire C. and Knauth P.- Impedance analysis of CuBr films for ammonia gas detection.- Sensors and Actuators B, vol. 87, p. 431-436, 2002
Lazar M., Raynaud C., Planson D., Locatelli M.L., Ottaviani L., Isoird K., Chante J.P., Nipoti R., Poggi A., Cardinali G.- A comparative study of high temperature Aluminium post-implantation annealing in 6H and 4H-SiC, non-uniformity temperature effects.- Mater. Sc. For. 389-393, 827 (2002)
Lee P.S., Mangelinck D., Pey K.L., Ding J., Chi D.Z., Dai J.Y., See A.- Enhanced stability of Ni monosilicide on MOSFETs poly-Si gate stack.- Microelectronic Engineering, vol. 60, p. 171-, 2002
Lee P.S., Pey K.L., Mangelinck D., Ding J., Chi D. Z., Dai J.Y., Chan L.- Phase and layer stability of Ni- and Ni(Pt)- silicides on narrow poly-Si lines.- Journal of the Electrochemical Society, vol. 149, p. G331-, 2002
Lee P.S., Pey K.L., Mangelinck D., Ding J., Osipowicz T., See A.- Layer inversion of Ni(Pt)Si on mixed phase Si films.- Electrochemical and Solid State Letters, vol. 5, p. G15-, 2002
Lemire C., Lollman D.B.B., Al Mohammad A., Gillet E., Aguir K.- Reactive R.F. magnetron sputtering deposition of WO3 thin films.- Sensors and Actuators B, vol. 4215, p. 1-6, 2002
Lesueur C., Chatain D., Bergman C., Gas P., Baque F.- Analysis of the stability of native oxide films at liquid/lead metal interfaces.- Journal de Physique IV, n° 12, p. 155-, 2002
Liebault J., Moya-Siesse D., Bernardini J., Moya G.- Charge trapping characterisation at the interface thin oxide layer/non-conductive substrate.- Surface and Interface Analysis, vol. 34, p. 668-671, 2002
Linard Y., Richet P., Rogez J., Yamashita I., Atake T.- Thermochemistry and stability of nuclear waste glasses .- J. of Jpn Soc of Cal. 29, 122-130, 2002
Lombardo P., Albinet G.- Transfer of spectral weight in the degenerate Hubbard model in infinite dimension.- Physical Review B, vol. 65, p. 115110-, 2002
Martinuzzi S., Périchaud I., Durand F., .- Multicrystalline silicon prepared by electromagnetically continuous pulling.- Solar Energy Material and Solar Cells 72 101 (2002)
Masson P., Autran J.L., Munteanu D.- DYNAMOS : a numerical MOSFET model including quantum-mechanical and near-interface trap transient effects.- Solid State Electronics, vol. 46, p. 1051-1059, 2002
Matko I., Gaidi M., Chenevier B., Charai A., Saikaly W., Labeau M.Pt doping of SnO2 thin films.- J. of the Electrochem. Soc., 149, 153-158 (2002)
Messina P., Dmitriev A., Lin N., Spillmann H., Abel M., Barth J.V., Kern K.- Direct observation of chiral metal-organic complexes assembled on a Cu(100) surface.- Journal of the American Chemical Society, n° 124, p. 14000-, 2002
Militaru L., Masson P., Geguan G.- Three level charge pumping on a single interface trap.- IEEE Electron Device Letters, vol. 23, no. 2, p. 94-96, 2002
Munteanu D., G. Le Carval, G. Guegan.- Impact of technological parameters on non-stationary transport in realistic 50nm MOS technology.- Solid State Electronics, vol. 46, p. 1045-1050, 2002
Munteanu D., G. Le Carval, G. Guegan.- Investigation of non-stationary transport and quantum effects in realistic deep submicron partially-depleted SOI technology.- Electrochemical and Solid State Letters, vol. 5, n° 5, p. G29-G31, 2002
Munteanu D., Ionescu A.M.- Modeling of drain current overshoot and recombination lifetime extraction in floating-body submicron SOI MOSFETs.- IEEE Transactions on Electron Devices, vol. 49, p. 1198-1205, 2002
Munteanu D., Le Carval G.- Assessment of anomalous behavior in hydrodynamic simulation of CMOS bulk and partially-depleted SOI devices.- Journal of the Electrochemical Society, vol. 149, p. G574-G580, 2002
Nicolas M., Deschamps A.- Precipitate microstructure in the HAZ of Al-Zn-Mg MIG-welds, evolution during post-welding heat treatments.- Materials Science Forum 396-402, 1561. (2002)
Niquet Y.M., Delerue C., Allan G., Lannoo M.- Interpretation and theory of tunneling experiments on single nanostructure.- Physical Review B, vol. 65, p. 165334-, 2002
Ottaviani L., Lazar M., Locatelli M.L., Chante J.P., Heera V., Skorupa W., Voelskow M., Torchio P.- Annealing Studies of Al-implanted 6H-SiC in an induction furnace.- Mater. Sc. Eng. B. 91/92, 325-328 (2002)
Ottaviani L., Lazar M., Locatelli M.L., Planson D., Chante J.P., Dubois C.- Characteristics of Aluminum-Implanted 6H-SiC Samples After Different Thermal Treatments.- Mater. Sc. Eng. B. 90, 301-308 (2002)
Ouslimani A., Gaubert J., Hafdallah H., Birafane A., Pouvil P., Leier H.- Direct determination of linear HBT model parameters using nine analytical expression bloks.- IEEE Transactions on Microwaves Theory and Techniques, vol. 50, n° 1, 2002
Palais O., Yakimov E.B., Martinuzzi S.- Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers.- Mater. Sc. Eng. B- 91-92, 216-19 (2002)
Panicaud B., Renault P.O., Grosseau-Poussard J.L., Dinhut J.F., Thiaudiere D., Gailhanou M. Measurement of stress in phosphated-iron oxide layers by in-situ diffraction of synchrotron radiation.- Mat. Science Forum, 404-407, 809-14(2002)
Paret V., Boher P., Geyl R., Vidal B., Putero-Vuaroqueaux M., Quesnel E., Robic J.Y.- Characterization of optics and masks for EUV lithography.- Microelectronic Engineering, vol. 61-62, p.145-155, 2002
Parmentier R., Lemarchand F., Cathelino M., Lesquine M., Amra C., Labat S., Bozzo S., Bocquet F., Charai A., Thomas O.- Piezoelectric tantalum pentoxide studied for optical tunable application.- Applied Optic 41, 3270-3276 (2002)
Patrone L., S. Palacin, J.-P. Bourgoin, J. Lagoute, T. Zambelli et S. Gauthier.- Direct comparison of the electronic coupling efficiency of Sulfur and Selenium anchoring groups for molecules adsorbed onto gold electrodes.- Chemical Physics, vol. 281, p. 325-332, 2002
Perichaud I., Yakimov E.B., Martinuzzi S., Dubois C.- Gold gettering by H+ or He ++ ion implantation induced cavities and defects in Cz silicon wafers.- Sol. Stat. Phenom. 82-84, 297-302 (2002)
Pichaud B., Burle N., Putero-Vuaroqueaux M., Curtil C.- Low misfit systems as tools for understanding dislocation relaxation mechanisms in semiconducting heteroepitaxial films.- J. of Phys. Cond. Matter. 14, 13255 (2002)
Priester L., Décamps B., Poulat S., Thibault J.- Interfacial defects and plastic deformation.- Ann. Chim. Sci. Mat. 27 , S77-88 (2002)
Putero-Vuaroqueaux M., Faïk H. and Vidal B.- A comparative study of the interfacial roughness correlation and propagation in Mo/Si multilayers deposited using RF-magnetron sputtering on silicon, ule and zerodur substrates.- Journal of Physics : Condensed Matter, vol.14, p.8955-8968, 2002
Rahajandraibe W., Dufaza C., Auvergne D., Cialdella B., Majoux B., Chowdhury V.- Bandgap reference optimisation from on-chip EG, XTI value extraction.- International Journal of Analog Integrated Circuits and Signal Processing, vol. 33, n° 2, p. 85-94, 2002
Regula G., Elbouayadi R., Pichaud B., Ntsoenzok E.- Nickel gettering in silicon: role of oxygen.- Sol. Stat. Phenom. 82-84, 355-360 (2002)
Rivero C., Bostrom O., Gergaud P., Thomas O., Boivin P., Mazuelas A.- In situ study of strain evolution during thin film Ti/Al(Si,Cu) reaction using synchrotron radiation .- Microelectronic Engineering 64, 81 (2002)
Rogez J., Garnier A., Knauth P.- Solution calorimetric investigation of AgCl-AgI ionic conductor composites at 298 K : observation of metastable AgI modifications .- J. Phys. Chem. of Solids 63, 9-14 (2002)
Roussel J.M., Bellon P.- Self-diffusion and solute diffusion in alloys under irradiation: Influence of ballistic jumps.- Phys. Rev. B 65, 144107, (2002)
Sanz N., Lomello-Taffin M., Valmalette J.C., Isa M., Galez Ph.- Preparation and characterization of Au/ZrO2 nanoparticles obtained by oxidation of Zr-Au alloy.- Materials Science & Engineering C, vol. 19, n° 1-2, p. 79-83, 2002
Schmidt U., Eisenschmidt C., Weiss M., Zahra C.Y., Zahra A.-M.- Decomposition of La- and Dy-rich amorphous alloys.- J. Non-Cryst. Solids 297, 1-12 (2002)
Schmidt U., Zahra A.-M.- Structure evolution of amorphous AlLnT alloys.- Recent Res. Devel. Mat. Sci. 3, 401-425 (2002)
Schülli T., Sztucki M., Chamard V., Metzger T. H., Schuh D.- Anomalous x-ray diffraction on InAs/GaAs quantum dot systems,.- Appl. Phys. Lett. 81, 448 (2002)
Seger J., Zhang S.L., Mangelinck D. and Radamson H. H.- Increased nucleation temperature of NiSi2 in the reaction of Ni thin films with Si1-xGex.- Applied Physics Letters, vol. 81, p. 1978-, 2002
Seguin J.L., Lambert-Mauriat C., Aguir K., Bendahan M., Jacolin C., Lauque P.- Degradation during sputter deposition of solid electrolyte thin films for microsystems.- Thin Solid Films, vol. 422, p. 87-91, 2002
Stesmans A., Afanas’ev V.V., Houssa M.- Electron spin resonance analysis of interfacial Si dangling bond type defects in stack of ultrathin SiO2, Al2O3, and ZrO2 layers on (100)Si.- Journal of Non-Crystalline Solids, vol. 303, p. 162-166, 2002
Texier M., Proult A., Bonneville J., Rabier J., Baluc N., Cordier P.- Microstructures of icosahedral AlPdMn quasicrystals deformed at room temperature in an anisotropic confining medium.- Phil.Mag. Lett., 82, 659 (2002)
Thomas O., Müller P., Labat S., Gergaud P.- Influence of segregation on the measurement of stress in thin films.- J. Appl. Phys. 91, 2951 (2002)
Thommerel E., Valmalette J.C., Musso J., Villain S., Gavarri J.R., Spada D.- Relations between microstructure, electrical percolation and corrosion in metal – insulator composites.- Materials Science & Engineering A, vol. 328, n° 1-2, p. 67-79, 2002
Valmalette J.C., Isa M.- Size effects on the stabilization of ultrafine zirconia nanoparticles.- Chemistry of Materials, vol. 14, n° 12 , p. 5098-5102, 2002
Valmalette J.C., Isa M., Passard M., Lomello-Tafin M.- Ultra-fast nanostructuring oxidation of crystallized intermetallic ZrAu at 25°C.- Chemistry of Materials, vol. 14, n° 5, p. 2048-2054, 2002
Ventura L., Pichaud B., Lanois F.- Impact of a cooling process on the dopant activity of platinum in silicon.- Sol. Stat. Phenom. 82-84, 412-422 (2002)
Villain S., Ch. Leroux, J. Musso, J.R. Gavarri, A. Kopia, M. Klimczak, J. Kusinski.- Nanoparticles and thin films of cerium dioxides: relations between elaboration process and microstructure.- Journal of Metastable and Nanocrystalline Materials, n° 12, p. 59-69, 2002
Villain S., Pischedda M.H., Nigrelli E., Godiart F., Gavarri J.R.- Degradation mechanism of composite electrodes subjected to alternating potentials : modelling and protection.- Corrosion Science, vol. 44, n° 4, p.657-673, 2002
Vrel D., Girodon-Boulandet N., Paris S., Mazue J.F., Couqueberg E., Gailhanou M., Thiaudiere D., Gaffet E., Bernard F.- A new experimental setup for the time resolved X-ray diffraction study of self-propagating high-temperature synthesis.- Rev. of Scient. Instruments, 73, no.2, 422-8 (2002)
Xerri B., Cavassilas J.F., Borloz B.- Passive Trajectography in underwater acoustics.- Signal Processing, vol. 82, p. 1067-1085, 2002
Xu Z., Houssa M., De Gendt S., Heyns M.M.- Polarity effect on the temperature dependence of leakage current through HfO2/SiO2 gate dielectric stacks.- Applied Physics Letters, vol. 80, p. 1975-1978, 2002
Xu Z., Houssa M., Naili M., Carter R., De Gendt S., Heyns M.M.- Constant voltage stress induced degradation in HfO2/SiO2 gate dielectric stacks.- Journal of Applied Physics, vol. 91, p. 10127-10129, 2002
Zahra A.-M., Zahra C.Y.- Comment on "Positron lifetime study of an Al-1.7 at.% Mg-1.1 at.% Cu alloy".- Phil. Mag. Lett. 82, 9-12 (2002)
Zhao C., Richard O., Bender H., Houssa M., Carter R., De Gendt S., Heyns M.M., Young E., Tsai W., Roebben G., Van Der Biest O., Haukka S.- Thermostability of the amorphous structure of zirconium aluminate high-k layers.- Journal of Non-Crystalline Solids, vol. 303, p. 144-149, 2002
Abel M., Dimitriev A., Fasel R., Lin N., Barth J.V., Kern K.- Scanning tunneling microscopy and x-ray photoelectron diffraction investigation of C_60 films on Cu(100).- Physical Review B, vol. 67, p. 245407-, 2003
Alfonso C., Fares L., Huiban Y., Gallet D., Ismeur M., Charai A.- Interfacial reactions in relation with adhesion failures in Al/TiN/Ti/SiO2 and Al/TiN/Ti/borophosphososilicate glass systems, .- Eur. Phys. J.: Appl. Phys. 22, 3 (2003)
Ananou B., Regnier S., Ksari Y., Marfaing J., Stepanov A., Touchard A., Rochette Y.- Detection of diluted marine tertiary tephra by electron spin resonance and magnetic measurements.- Geophysical Journal International, vol. 155, n° 2, p. 341-349, 2003
Autran J.L. and Munteanu D.- Tunneling component of the ballistic current in ultimate double-gate devices.- Electrochemical and Solid-State Letters, vol. 6, p. G95-G97, 2003
Autran J.L., Munteanu D.- Les architectures innovantes sur silicium mince : un second souffle pour la loi de Moore ? Revue de l’Electricité et de l’Electronique, n° 8, p. 21-31, 2003,
Autran J.L., Munteanu D., Dinescu R. and Houssa M.- Stretch-out of high-permittivity MOS capacitance voltage curves resulting from a lateral non-uniform oxide charge distribution.- Journal of Non-Crystalline Solids, vol. 322, n° 1-3, p. 219-224, 2003
Badèche T., Gagou Y., Roucau C., Frémy M.A., Mezzane D., Saint-Grégoire P.- HREM Study of the room temperature phase of PbK2LiNb5O15.- Ferroelectrics, vol. 290, p. 83-90, 2003
Barthélemy H.- Impedance projection based transconductance amplifier.- Electronics Letters, vol. 39, n° 14, p. 1027-1028, 2003
Barvinschi F., Stelian C., Delannoy Y., Mangelinck-Noël N., Duffar T.- Modeling the multi-crystalline silicon ingot solidification process in a vertical square furnace.- Journal of Optoelectronics and Advanced Materials, vol. 5, n° 1, p. 293-300, 2003
Bayle-Guillemaud P., Radtke G., Sennour M.- Electron spectroscopy imaging to study ELNES at a nanoscale.- J. of Microscopy, 210, (2003), 66
Bendahan M., Lauque P., Seguin J.L., Aguir K., Knauth P.- Development of an ammonia gas sensor.- Sensors and Actuators B, vol. 95, p. 170-176, 2003
Bergman C., Bichara C., Gaspard J.P., Tsuchiya Y.- Experimental investigation of the water-like density anomaly in liquid Ge15Te85 eutectic alloy.- Physical Review B, vol. 67, p. 104202-, 2003
Bernardini J., Girardeaux C., Rolland A. and Beke D.L.- Effect of grain boundary segregation and migration on diffusion profiles : analysis and experiments. Interface Science, vol. 11, p. 33-40, 2003
Bernardini J., Lexcellent C., Daroczi L., Beke D.L.- Ni diffusion in near equiatomic Ni-Ti and Ni-Ti (6Cu) alloys.- Philosophical Magazine, vol. 83, p. 329-338, 2003
Bescond M., Lannoo M., Goguenheim D. and Autran J.L.- Towards a full microscopic approach to the modeling of transistors with nanometer dimensions.- Journal of Non-Crystalline Solids, vol. 322, n° 1-3, p. 160-167, 2003
Beszeda I. , Imre A.W. , Gontier-Moya E.G., Moya F., Beke D.L., Si Ahmed A.- Kinetics of morphological changes in nanoscale metallic films followed by Auger Electron.- Diffusion, Segragation and Stresses in Materials, Defect and Diffusion Forum, vol. 216-217, p. 269-274 , 2003
Beszeda I., Gontier-Moya E. G., Beke D. L.- Investigation of mass transfer surface self diffusion on palladium.- Surface Science, vol. 547 p.229-238, 2003
Beszeda I., Szabo I.A., Gontier-Moya E.G.- Auger Electron Spectroscopy determination of surface self-diffusion coefficients from growth of voids in thin deposited films.- Applied Surface Science, vol. 212-213, p. 787-791, 2003
Bocquet F., Gergaud P. and Thomas O.- X-ray diffraction from inhomogeneous thin films of nanometre thickness : modelling and experiment .- J. Appl. Cryst. 36 , 154 (2003)
Bravaix A., Goguenheim D., Revil ., Rubaldo L.- Efficiency of interface trap generation under hole injection in 2.1nm thick gate-oxide P-MOSFET's. – Journal of Non-Crystalline Solids, vol. 322, p.139-146, 2003
Bravaix A., Trapes C., Goguenheim D., Revil N., Vincent E.- Carrier injection efficiency for the reliability study of 3.5-1.2nm thick gate-oxide CMOS technologies.- Microelectronic Reliability, vol. 43, p. 1241-1246, 2003
Canet P., Bouchakour R., Lalande F., Mirabel J.M.- EEPROM cell design : paradoxical choice of the coupling ratio.- Journal of Non-Crystalline Solids, vol. 322, p. 246-249, 2003
Casadei B., Husson D., Le Normand J.P., Cunin B., Hu Y.- Caractérisation d’une caméra rapide CMOS pour la détection d’impulsions lumineuses brèves.- Revue d’Electricité et d’Electronique, p. 33-38, 2003
Casadei B., Le Normand J.P., Cunin B., Hu Y.- Design and characterisation of fast CMOS multiple linear array For nanosecond light pulses detection.- IEEE Transactions on Instrumentation and Measurement, vol. 52, n° 6, p. 1892-1897, 2003
Chamard V., Metzger T. H., Sztucki M., Holý V., Tolan M., Bellet-Amalric E., Adelmann C., Daudin B., Mariette H.- On the driving forces for the vertical alignment in nitride quantum dot multilayers,.- Europhys. Lett. 63, 268 (2003)
Chamard V., Metzger T. H., Sztucki M., Tolan M., Bellet-Amalric E., Daudin B., Adelmann C., Mariette H.- Anomalous diffraction in grazing incidence to study the strain induced by GaN quantum dots stacked in an AlN multilayer.- Nuclear Instruments and Methods B 200, 95 (2003).-
Chatain S., Gueneau C., Labroche D., Rogez J., Dugne O.- Thermodynamic assessment of the Fe-U binary system .- J. of Phase Equilibria 24 , 122-131 (2003)
Chenevier B., Chaix- Pluchery O., Gergaud P., Thomas O., LaVia F.- Thermal expansion and stress development in the first stages of silicidation in Ti/Si thin films,.- J. Appl. Phys. 94 , 7083 (2003)
Chenevier B., Chaix-Pluchery O., Gergaud P., Thomas O., Madar R., LaVia F.- First stages of silicidation in Ti/Si thin films.- Microelectronic Engineering 70 , 455 (2003)
Choukroun J., Richard J.L., Stepanov A.- Electron paramagnetic resonance in weakly anisotropic Heisenberg magnets with a symmetric anisotropy.- Physical Review B, vol. 68, n° 14, p. 144415-, 2003
Coulet M.-V., Bellissent R., Bichara C.- Séparation de phases dans les liquides covalents : couplage entre structure et thermodynamique.- J. Phys. IV , 111, 147-166 (2003)
Coulet M.-V., Simonet V., Calzavara Y., Testemale D., Hazemann J.-L., Raoux D., Bley F., Simon J.-P.- Correlation between density variation and electrical conductivity in supercritical selenium probed by Small Angle X-ray Scattering.- J. Chem. Phys. 118, 11235-8 (2003)
Daré A.M., Hayn R. and Richard J.L.- Orbital and spin exchange in LiNiO2.- Europhysics Letters, vol. 61, p. 803-, 2003
Debierre J.M., Karma A., Celestini F., Guérin R.- Phase-field approach for faceted solidification.- Physical Review E, vol. 68, p. 041604-1-13, 2003
Decossas S., Patrone L., Bonnot A.M., Comin F., Derivaz M., Barski A. , Chevrier J.- Nanomanipulation by atomic force microscopy of carbon nanotubes on a nanostructured surface.- Surface Science, vol. 543, p. 57-62, 2003
Delerue C., Allan G., Lannoo M.- Dimensionality-dependent self-energy corrections and exchange-correlation potential in semiconductor nanostructures.- Physical Review Letters, vol. 90, n° 7, p. 076803-, 2003
Delerue C., Lannoo M., Allan G.- Concept of dielectric constant for nanosized systems.- Physical Review B, vol. 68, n° 11, p. 115411-, 2003
Den-Auwer C., Drot R., Simoni E., Conradson S.D. Gailhanou M., de-Leon J.M.- Grazing incidence XAFS spectroscopy of uranyl sorbed onto TiO2 rutile surfaces.- New Journal of Chemistry. 27 (3) 648-655 (2003)
Dorbolo S., Ausloo M., Vandevalle N., Houssa M.- Aging process of electrical contacts in granular matter.- Journal of Applied Physics, vol. 94, n° 12, p. 7835-7838, 2003
Drechsler S.L., Malek J., Hayn R., Knupfer M., Moskvin A.S., Fink J.- Low-energy excitations in an undoped cuprate-description beyond the standard pdsigma-model ? - International Journal of Modern Physics B, vol. 17, p. 3324-, 2003
Egry I., Herlach D., Kolbe M., Ratke L., Reutzel S., Perrin C., Chatain D.- Surface tension, phase separation, and solidification of undercooled Cobalt-Copper alloys.- Advanced Engineering Materials, vol. 5, p. 819-, 2003
Ersen O., Pierron-Bohnes V., Tuilier M-H., Pirri C., Khouchaf L., Gailhanou M.- Short- and long-range order in iron and cobalt disilicides thin films investigated by the diffraction anomalous fine structure technique.- Phy. Rev. B, 67, no.9,. 94116-1-12(2003)
Ersen O., Tuilier M-H., Thomas O., Gergaud P., Lagarde P.- Cubic local order around Al and intermixing in short period AlN/TiN multilayers studied by Al K-edge extended x-ray absorption fine structure spectroscopy and x-ray diffraction.- Appl. Phys. Letters 82, 3659 (2003)
Escoubas L., Huguet-Chantôme P., Jelínek M., Flory F., Drouard E., Lancok J., Simon J.J., Mazingue T.- Optical and electro-optical properties of pulse laser deposited PLZT thin films.- Optical Engineering, vol. 42, n° 12, p. 3584-, 2003
Escoubas L., Simon J.J., Loli M., Berginc G., Flory F., Giovannini H.- An antireflective silicon grating working in the resonance domain for the near infrared spectral region.- Optics Communications, vol. 226, p. 81-88 , 2003
Gas P.- François d’Heurle : Microelectronics ands basic research in materials science.- Microelectronics Engineering, vol. 70, p. 142-, 2003
Gas P., Girardeaux C., Mangelinck D., Portavoce A.- Reaction and diffusion at interfaces of micro and nanostructured materials.- Material Science and Engineering B, vol. 101, p. 43-, 2003
Gergaud P., Megdiche M., Thomas O., Chenevier B.- Influence of Si substrate orientation on stress development in Pd silicide films grown by solid-state reaction .- App.Phys. Lett. 83, 1334 (2003)
Gergaud P., Thomas O., Chenevier B.- Stresses arising from a solid state reaction between palladium films and Si(001) investigated by in situ combined X-ray diffraction and curvature measurements.- J. Appl. Phys. 94, 1584 (2003)
Gillet E., Lemire C., Gillet M.- Structural and electronic features of metal-oxide interfaces.- Key Engineering Materials, vol 253, p.1-16, Trans. Tech. Publications, Switzerland, 2003
Gillet M., Lemire C., Gillet E.- Influence of the surface structure on the growth of a metallic deposit on oxide Au / WO3.- Engineering Materials, vol. 253, p. 103-, 2003
Gillet M., Lemire C., Gillet E., Aguir K.- The role of surface oxygen vacancies upon WO3 conductivity.- Surface Science, vol. 532, p. 519-525, 2003
Gillet M., Masek K., Lemire C.- Oxidation of tungsten nanoclusters.- Thin Solid Films, vol. 444, p. 9-, 2003
Goguenheim D., Trapes C., Bravaix A.- Comparison of degradation modes in 1.2-2.1 nm thick oxides submitted to uniform and hot carrier injections in NMOSFETS.- Journal of Non-Crystalline Solids, vol. 322, p.183-190, 2003
Gutt C., Gadheri T., Chamard V., Madsen A., Seydel T., Tolan M., Sprung M., Grübel G., Sinha S. K.- Observation of heterodyne mixing in surface XPCS experiments, .- Phys. Rev. Lett. 91, 076104 (2003)
Hammi H., Musso J.A., M'Nif A., Rokbani R.- Solubility phase diagrams coupled to computer science (DPAO). Part II : Applied to isothermal evaporation of Tunisian natural brines.- Calphad-Computer Coupling of Phase Diagrams and Thermochemistry, vol. 27, n° 1, p. 71-77, 2003
Houssa M., Autran J.L., Heyns M.M., Stesmans A.- Model for defect generation at the (1 0 0)Si/SiO2 interface during electron injection in MOS structures.- Applied Surface Science, vol. 212-213, p. 749-752, 2003
Houssa M., Bizzari C., Autran J.L.- Simulation of threshold voltage instabilities in HfySiOx and SiO2/HfySiOx-based field-effect transistors.- Applied Physics Letters, vol. 83, p. 5065-5067, 2003
Houssa M., Parthasarathy C., Espreux N., Autran J.L., Revil N.- Impact of nitrogen on negative bias temperature instability in p-channel MOSFETs.- Electrochemical and Solid-State Letters, vol. 6, p. G146-G148, 2003
Houssa M., Parthasarathy C., Espreux N., Revil N. and Autran J.L.- Model for negative bias temperature instability in p-MOSFETs with ultrathin oxynitride layers.- Journal of Non-Crystalline Solids, vol. 322, n° 1-3, p. 100-104, 2003
Kaouache B., Gergaud P., Thomas O., Bostrom O., Legros M.- Impact of thermal cycling on the evolution of grain, precipitate and dislocation structure in Al 0.5%Cu 1%Si thin films .- Microelectronic Engineering 70 , 447 (2003)
Katan C., Rabiller P., Lecomte C., Guezo M., Oison V., Souhassou M.- Numerical computation of critical properties and atomic basins from three-dimensional grid electron densities.- Journal of Applied Crystallography A, vol. 36, p. 65-73, 2003
Klimczak-Chmielowska M., Chmielowski R., Kopia Z., Kusinski J., Leroux C., Villain S., Saiztek S., Gavarri J.R.- The influence of copper on microstructure and catalytic properties of CeO2 thin films deposited by pulsed laser deposition.- High Temperature Material Processes, vol. 7, n° 3, p. 333-342, 2003
Kovacevic Z., Plakida N.M., Hayn R.- Resonant states in high temperatures superconductors with impurities.- Theoretical and Mathematical Physics, vol. 136, p. 1155-, 2003
Kuzian R.O., Hayn R., Barabanov A.F.- Dispersion of the dielectric function of a charge-transfer insulator.- Physical Review B, vol. 68, p. 195106-, 2003
Kuzian R.O., Hayn R., Richter J.- Recursion method and one-hole spectral function of the Majumdar-Ghosh model.- European Physical Journal B, vol. 35, p. 21-, 2003
Laffont R., Masson P., Bernardini S., Bouchakour R., Mirabel J.M.- A new floating compact model applied to Flash memory cell.- Journal of Non-Crystalline Solids, vol. 322, n° 1-3, p. 250-255, 2003
Lannoo M., Delerue C., Allan G., Niquet Y.M.- Confinement effects and tunnelling through quantum dots.- Philosophical Transactions of the Royal Society of London A, vol. 361, n° 1803, p. 259-272, 2003
Lay S., Thibault J., Hamar-Thibault S.- Structure and role of the interfacial layers in VC rich WC-Co cermets.- Phil. Mag, 83, 117(-1190 (2003)
Lazar M., Raynaud C., Planson D., Chante J.P., Locatelli M.L., Ottaviani L., Godignon P.,.- Effect of Ion implantations parameters on Al dopant redistribution in SiC after annealing : Defect recovery and electrical properties of p-type layers.- J. Appl. Phys. 94, 2992-2998 (2003)
Lee P.S., Pey K.L., Mangelinck D., Ding J., Chan L.- In situ XRD analysis of Ni(Pt)/Si(100) reactions in low temperature regime < 400 degrees C.- Solid State Communications, vol. 128, n° 9-10, p. 325-328, 2003
Léonard S., Madigou V., Villain S., Nigrelli E. and Nihoul G.- Characterisation of thin films of the ferroelectric material SrBi2Ta2O9 obtained by sol-gel methods on Sr2RuO4 (001) single crystal substrate.- Ferroelectrics, vol. 288, p. 1-9, 2003
Li J. B., Record M.C., Tedenac J.C.- A thermodynamic assessment of the InSe system.- Zeitschrift für Metallkunde, 94, 381-389 (2003)
Li J. B., Tedenac J.C. , Record M.C.,.- Thermodynamic analysis of the Ga-Ti system.- Journ. of Alloys and Compounds, 358, 133-141(2003)
Liebault J., Zarbout K., Moya G., Kallel A.- Advanced measurement techniques of space- charge induced by an electron beam irradiation in thin dielectric layers.- Journal of Non-Crystalline Solids, vol.322, p. 213-218, 2003
Liebault J., Zarbout K., Moya-Siesse D., Bernardini J., Moya G.- New technique to characterise thin oxide films under electronic irradiation.- Applied Surface Science, vol. 212-213, p. 809-814, 2003
Liu C., Ntsoenzok E., Delamare R., Alquier D., Regula G.- The role of a top oxide layer in cavities formed by MeV He implantation into Si.- Europ. Phys. J. : Appl. Phys. 23, 45-48 (2003)
Lombardo P., Avignon M.- Disordered local moments formation in high-dimensional strongly correlated materials.- Physica B, vol. 337, p. 186-192, 2003
Loubens A. , Fortunier R., Fillit R., Thomas O.- Simulation of local mechanical stresses in lines on substrate .- Microelectronic Engineering 70, 455 (2003)
Mangelinck D., Gas P., T. Badeche T., Taing E., Nemouchi F., Perrin-Pellegrino C., Niel S., Mirabel J.-M., Farez L., Albarede P.H.- Formation of C49-TiSi2 in flash memories : a nucleation controlled phenomenon ? - Microelectronics Engineering, vol. 70, p. 220-, 2003
Marhag C., Said H., Satre P., Favotto C., Rogez J.- Etude thermodynamique du diagramme d'équilibre LIPO3-Pb(PO3)2. Conditions d'élaboration et métastabilité .- Journal of Thermal Analysis and Calorimetry 74, 275-285 (2003)
Martinuzzi S., Périchaud I., Warchol F.,.- Hydrogen passivation of defects in multicrystalline silicon solar cells.- Solar Energy Materials and SolarCells 80, 343-54 (2003)
Maurel C., Coratger R., Ajustron F., Beauvillain J., Gerard P.- Electrical characteristics of metal/semiconductor nanocontacts using light emission in a scanning tunneling microscope.- Journal of Applied Physics, vol. 94, n° 3, p. 1979-1982, 2003
Maurel C., Coratger R., Ajustron F., Seine G., Pechou R., Beauvillain J.- Effect of multiple tips on light emission induced by STM from gold nanostructures.- Surface Science, vol. 529, n° 3,p. 359-364, 2003
Maurel C., Coratger R., Ajustron F., Seine G., Pechou R., Beauvillain J.- Photon emission from STM of granular gold in UHV : comparison with air and study of spectra shifting with tip position.- European Physical Journal - Applied Physics, vol. 21, n° 2, p. 121-126, 2003
Megdiche M., Gergaud P., Curtil C., Thomas O., Chenevier B., Mazuelas A.- In situ study of stress evolution during solid state reaction of Pd with Si (001) using synchrotron radiation .- Microelectronic Engineering 70, 436 (2003)
Mliki N., Kaabi H., Bessaïs B., Yangui B., Saikaly W., Dominici C., Charai A.- Morphology and Microstructure at different scales of Porous Silicon prepared by a non conventional technique.- Journal of Nanoscience ans Nanotechnology 3, 413-19 (2003)
Moskvin A.S., Malek J., Knupfer M., Neudert R., Fink J., Hayn R., Drechsler S.-L., Motoyama N., Eisaki H., Uchida S.- Evidence for two types of low-energy charge transfer excitations in Sr2CuO3.- Physical Review Letters, vol. 91, p. 037001-, 2003
Moya G., Kansy J., Si Ahmed A., Liebault J., Moya F., Goeuriot D.- Positron lifetime measurements in sintered alumina.- Physica Status Solidi (a), vol.198, n°1, p.215-223, 2003
Muller C.- Diffraction des neutrons : principe, dispositifs expérimentaux et applications.- in "Ecole thématique de la Société Française de la Neutronique : Neutrons et Matériaux", Journal de Physique IV, vol. 103, p. 101–132, 2003
Muller C., Jacob F., Gagou Y., Elkaïm E.- Cation disorder, microstructure and dielectric response of ferroelectric SBT ceramics.- Journal of Applied Crystallography, vol. 36, n° 3, p. 880–889, 2003
Munteanu D. and Autran J.L.- Two-dimensional modeling of quantum ballistic transport in ultimate double-gate SOI devices.- Solid-State Electronics, vol. 47, n° 7, p. 1219-1225, 2003
Munteanu D., Autran J.L., Decarre E. and Dinescu R.- Modeling of quantum ballistic transport in double-gate devices with ultra-thin oxides.- Journal of Non-Crystalline Solids, vol. 322, n° 1-3, p. 206-212, 2003
Musso J.A.- Solubility phase diagrams coupled to computer science (DPAO). Part I : Theory of the sequential representation.- Calphad-Computer Coupling of Phase Diagrams and Thermochemistry, vol. 27, n° 1, p. 65-69, 2003
Nguyen Thi H., Drevet B., Debierre J.M., Camel D., Dabo Y., Billia B.- Preparation of the initial solid – liquid interface and melt in directional solidification.- Journal of Crystal Growth, vol. 253, p. 539, 2003
Nguyen Thi H., Jamgotchian H., Gastaldi J., Härtwig J., Schenk T., Klein H., Billia B., Baruchel J., Dabo Y.- Preliminary in situ and real time study of directional solidification of metallic alloys by X-ray imaging techniques.- Journal of Physics D : Applied Physics, vol. 36, p.83-86, 2003
Nicolas M., Deschamps A.- Characterisation and modelling of precipitate evolution in an Al-Zn-Mg alloy during non-isothermal heat treatment.- Acta Materialia 51, 6077-6094 (2003)
Nyéki J., Erdélyi G., Lograsso TA., Schlagel DL., Beke D.L.- Ni volume diffusion in Ni2MnGa.- Intermetallics, vol. 11, p. 1075-1077, 2003
Nyeki J., Girardeaux C, Erdelyi G., Rolland A, Bernardini J.- Equilibrium surface segregation enthalpy of Ge in concentrated amorphous SiGe alloys.- Applied Surface Science, vol. 212-213, p. 244-248, 2003
Oison V., Katan C., Rabiller P., Souhassou M., Koenig C.- Neutral-ionic phase transition : a thorough ab initio study of TTF-CA.- Physical Review B, vol. 67, n° 3, p. 035120-, 2003
Ottaviani L., Hidalgo P., Idrissi H., Lancin M., Martinuzzi S., Pichaud B.- Structural characterization of 6H and 4H-SiC polytypes by cathodoluminescence and X-Ray Topography.- J. of Physics : Condensed Matter 15, 1 (2003)
Oualla M., Zegzouti A., Elaatmani M., Daoud M., Mezzane D., Gagou Y., Saint-Grégoire P.- New gadolinium based ferroelectric phases derived from the tetragonal tungsten bronze (TTB).- Ferroelectrics, vol. 291, p. 133-139, 2003
Oughaddou H., Léandri C., Aufray B., Girardeaux C., Bernardini J., Lelay G., Bibérian J.P., Barrett N.- Growth and dissolution kinetics of Au/Pb(111) : an AES-LEED study.- Applied Surface Science, vol. 212-213, p. 291-295, 2003
Palais O., Arcari A.- Contactless measurement of bulk lifetime and surface recombination velocity in silicon wafers .- J. Appl. Phys. 93, 4686-4690 (2003)
Palais O., Clerc L., Arcari A., Stemmer M., Martinuzzi S.- Mapping of minority carrier lifetime and mobilities in imperfect silicon wafers.- Mat. Science and Engineering B 102, 184-188 (2003)
Palmino F., Ehret E., Mansour L., Labrune J.-C. , Lee G., Kim H., Themlin J.M.- 3x2 reconstruction of the Sm/Si(111) interface.- Physical Review B, vol. 67, p. 195413-, 2003
Paris S., Jauffret C.- Frequency line tracking using HMM-based schemes.- IEEE Transactions on Aerospace and Electronic Systems, vol 39, n° 2, p. 439-449, 2003
Patrone L., Palacin S., Bourgoin J.-P.- Direct comparison of the electronic coupling efficiency of sulfur and selenium alligator clips for molecules adsorbed onto gold electrodes.- Applied Surface Science, vol. 212, p.446-451, 2003
Patrone L., Palacin S., Charlier J., Armand F., Bourgoin J.P., Tang H., Gauthier S.- Evidence of the key role of metal-molecule bonding in metal-molecule-metal transport experiments.- Physical Review Letters, vol. 91, n° 9, p. 096802, 2003
Portavoce A., Berbezier I., Ronda A.- Effects of Sb on Si/Si and Ge/Si growth process.- Materials Science and Engineering B, vol. 101, n° 1-3, p. 181-185, 2003
Quintana C., Menendez J.L., Huttel Y., Lancin M., Navarro E., Cebollada A.- Structural characterization of Fe (110) islands grown on alpha-Al2O3 (0001).- Thin Solids Films 434, 228-238 (2003)
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Raymond R., Laugier J.M., Schäfer S., Albinet G.- Dielectric resonances in disordered media.- European Physical Journal B, vol. 31, n° 3, p. 355-364, 2003
Record M.C., Daouchi B., M., Tedenac J.C. , .- Phase diagram of the Pb-PbSe-InSe-In sub-system.- Journ. of Alloys and Compounds, 361, 157-159 (2003)
Record M.C., Pascal C., Frety N., M., Tedenac J.C. , Marin-Ayral R.M.,.- Optimisation procedure of the NiAl combustion synthesis under high-gas pressure in repairing Ni-based superalloys.- International Journal of SHS, 12, 303-312 (2003)
Renard S., Boivin P. and Autran J.L.- New oxide quality characterization for charge leakage applications using the floating-gate technique.- Journal of Non-Crystalline Solids, vol. 322, n° 1-3, p. 179-182, 2003
Richard S., Cavassilas N., Aniel F., Fishman G.- Energy-band structure in strained silicon : A 20-band k-p and Bir-Pikus Hamiltonian model.- Journal of Applied Physics, vol. 94, n° 3, p. 1795-1799, 2003
Richard S., Cavassilas N., Aniel F., Fishman G.- Strained silicon on SiGe : Temperature dependence of carrier effective masses.- Journal of Applied Physics, vol. 94, n° 8, p. 5088-5094, 2003
Robach Y., Abel M., Porte L.- Initial stages of Pd deposition on Au(110) : A STM, LEED and AES study.- Surface Science, vol. 526, p. 248-256, 2003
Saikaly W., Bano X., Issartel C., Rigaut G., Charai A.- Powerful microscopy techniques available for resolving complex microstructure in multiphase steels, .- Rev. Met. Paris 5, 513-521(2003)
Schmidt U., Eisenschmidt C., Syrowatka F., Bartusch R., Zahra C.Y., Zahra A.-M.- Structure development in amorphous Al-La alloys.- J. Phys.: Condens. Matter 15, 385-413 (2003)
Sorbier J.P., Croci S., Imbert B., Plossu C.- Model of leakage current induced by dynamic stress in thin EEPROM tunnel oxides.- Journal of Non-Crystalline Solids, vol. 322, n° 1-3, p. 122-128, 2003
Sort J.., Zhylyaev A., Zielinska M., Nogues J., Surinach S., Thibault J. and Baro M. D.- Microstructural effects and large microhardness in Co processed by high pressure torsion consolidation of ball milled powders.- Acta Materiala, 151, 6385-6393 (2003)
Souifi A., Brounkov P., Bernardini S., Busseret C., Militaru L., Guillot G. and Baron T.- Study of trap centres in silicon nanocrystal memories.- Materials Science and Engineering B, vol. 102, n° 1-3, p. 99-107, 2003
Stoneham A.M., Lannoo M., Ridley B.K.- Confinement effects and tunnelling through quantum dots. Discussion.- Philosophical Transactions of the Royal Society of London A, vol. 361, n° 1803, p. 272-273, 2003
Sztucki M., Schülli T. U., Metzger T. H., Chamard V., Schuster R., Schuh D.- Strain analysis of a quantum wire system produced by a cleaved edge overgrowth using grazing incidence diffraction.- Appl. Phys. Lett. 83, 872 (2003)
Texier M., Bonneville J., Proult A., Rabier J., Baluc N., Guyot P.- On the yield point of icosahedral AlCuFe quasicrystals,.- Scripta Materialia, 49, 41 (2003)
Texier M., Proult A., Bonneville J., Rabier J., Baluc N., Cordier P.- Microstructural analysis of i-AlPdMn quasicrystals deformed between room temperature and 300°C under confining pressure.- Scripta Materialia, 49, 47 (2003)
Thomas O., Shen Q., Schieffer P. , Tournerie N., Lepine B.- Interplay between anisotropic strain relaxation and uniaxial interface magnetic anisotropy in epitaxial Fe films on (001) GaAs .- Phys. Rev. Lett. 90, 017205 (2003)
Thommerel E., Madigou V., Villain S., Musso J., Valmalette J.C., Gavarri J.R.- Microstructure modifications and modulated piezoelectric responses in PLZT / Al2O3 composites.- Materials Science & Engineering B, vol. 97, p. 74-82, 2003
Trapes C., Bravaix A., Goguenheim D.- Impact of carrier injection in 2.2nm-thick SiO2 oxides after first and substrate enhanced electron injection.- Journal of Non-Crystalline Solids, vol. 322, p.199-205, 2003
Vedda A., Autran J.L., Ferrari M., Munteanu D. and Passacantando M.- Preface.- Journal of Non-Crystalline Solids, vol. 322, n° 1-3, p. vii, 2003
Ventura L., Pichaud B., Vervisch W., Lanois F.- p-type doping by platinum diffusion in low phosphorus doped silicon.- Europ. Phys. J.: Appl. Phys. 23, 33 (2003)
Verlinden B., Zahra A.-M.- Precipitation hardenable Al-Mg-Cu alloys : Mechanical properties and hardening mechanisms.- Mater. Sci. Forum 426-432, 423-428 (2003)
Zaid L., Staraj R.- Radome protected low-profile GSM antenna on small ground plane.- Microwave and Optical Technology Letters, vol. 38, n° 4, p. 328-331, 2003
2004
Agliozzo S., Mancini L., Klein H., Schenk T., de Boissieu M., Nguyen Thi H., Gastaldi J., Hartwig J. and Baruchel J.- Using Synchroton radiation X-ray imaging to investigate porosity in quasicrystals.- ESRF Newsletter, vol. 40, p. 30-31, 2004
Aneflous L., Musso J., Villain S., Gavarri J.R., Benyaich H.- Effects of temperature and Nd composition on non-linear transport properties in substituted Ce1-xNdxO2-d cerium dioxides.- Journal of Solid State Chemistry, vol. 177, n° 3, p. 856-865, 2004
Avella A., Mancini F., Hayn R.- The energy-scale dependent composite operator method for the single-impurity Anderson model.- European Physical Journal B, vol. 37, p. 465-471, 2004
Barge D., Pichaud B., Joly J.P.- High temperature Si(001) surface defect evolution during extended annealing: experimental results and modelling.- Appl. Surf. Science 226, 341-6 (2004)
Bechade J-L., Brenner R., Goudeau P., Gailhanou M.- Determination of residual stresses in a zirconia layer by X-ray diffraction and by a micromechanical approach: thermoelastic anisotropy effect.- Revue de Metallurgie, 100, no.12, 1151-6 (2004)
Ben-Abdelkader S., Ben-Cherifa A. , Coulet M-V., Khattech I., Rogez J., Jemal M.- Enthalpy of formation of whitlockite Ca18Mg2H2(PO4)(14).- Journ. Therm. Anal. and Calorim., 77, 863-871 (2004)
Benarchid Y., Diouri A., BouKhari A., Aride J., Rogez J., Castanet R.- Elaboration and thermal study of iron-phosphorus substituted dicalcium silicate phase.- Cement and Concrete Research 34, 1873-1879 (2004)
Bendahan M., Boulmani R., Seguin J. L. and Aguir K.- Characterization of ozone sensors based on WO3 reactively sputtered films : influence of O2 concentration in the sputtering gas, and working temperature.- Sensors and Actuators B, vol. 100, n° 3, p. 323-327, 2004
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Beszeda I., Szabó I. A., Gontier-Moya E.G.- Morphological evolution of thin gold films studied by Auger Electron Spectroscopy in beading conditions.- Applied Physics A, vol. 78, p. 1079-1084, 2004
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Bocquet F., Bigault T., Alfonso C., Labat S., Thomas O., Charai A.- In situ stress measurements during the growth at different temperatures of Ag-Cu(111) multilayers.- J. Appl. Phys. 95, 1152-61 (2004)
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Chaplygin I., Hayn R.- Sb2O2VO3 as a candidate for an ideal inorganic spin-Peierls compound.- Physical Review B, vol. 70, p. 064510, 2004
Décamps B., Priester L., Thibault J.- On the core localization of grain boundary extrinsic dislocations in Ni.- Adv. Engineer. Mater. 6, 814-818 (2004)
Deleruyelle D., Le Royer C., De Salvo B., Le Carval G., Gely M., Baron T., Autran J.L., Deleonibus S.- A new memory concept: the nano-multiple-tunnel-junction memory with embedded Si nano-crystals.- Microelectronic Engineering, vol. 72, p. 399-404, 2004
Denais M., Huard V., Parthasarathy C., Ribes G., Perrier F., Revil N., Bravaix A.- Interface trap generation and hole trapping under NBTI and PBTI in advanced CMOS technology with a 2nm gate-oxide.- IEEE Transactions on Device Materials Reliability, vol. 4, p. 715-722, 2004
D'Heurle F.M., Gas P., Lavoie C., Philibert J.- Diffusion in intermetallic compounds: the ordered Cu3Au rule, its history.- Z. Metallkunde, vol. 95, p. 852-859, 2004
Drouard E., Escoubas L., Flory F., Tisserand S., Roux L.- Ion implanted integrated optics (I3O®) technology for planar lightwave circuits fabrication.- Journal of Lightwave Technology, vol. 0733, p. 8724-, 2004
Duc F., Millet P., Chabre F., Ghorayeb A., Stepanov A.- On the low-temperature structure and magnetic behaviour of h-Na1.286V2O5.- Journal of Physics : Condensed Matter, vol. 16, n° 11, p. S629-, 2004
Duc F., Millet P., Ravy S., Thiollet A., Chabre F., Ghorayeb A., Stepanov A.- Low-temperature superstructure and charge-ordering effect in h-Na1.286V2O5.- Physical Review B, vol. 69, p. 094102-, 2004
Dumont-Nicolas M., Deschamps A.- Precipitate microstructures and resulting properties of Al-Zn-Mg metal inert gas-weld heat-affected zones.- Metall. and Mater. Trans . 35A, 1437-1448 (2004)
Dupuis V., L. Favre, S. Stanescu, J. Tuaillon, E. Bernstein, A. Perez.- Magnetic assembled nanostructures from pure and mixed Co-based clusters.- J. Phys. Cond. Matter, vol. 16, p. S2231 - S2240, 2004
Egels M., Gaubert. J., Pannier P., Bourdel S.- Design method for fully integrated CMOS RF LNA.- Electronics Letters, vol. 40, n° 24, p. 1513-1514,, 2004
Elalamy Z., Drouard E., Mcgovern T., Escoubas L., Simon J.J., Flory F.- Thermo-optical coefficients of sol-gel ZrO2 thin films.- Optics Communications, vol. 372, p. 365 – 372, 2004
Elgazzar S., Opahle I., Hayn R., Oppeneer P.M.- Calculated de Haas-van Alphen quantities of CeMin5 (M=Co, Rh, and Ir) compounds.- Physical Review B, vol. 69, p. 214510, 2004
Favre L., S. Stanescu, V. Dupuis, E. Bernstein, T. Epicier, P. Mélinon, A. Perez.- Nanostructured thin films from mixed magnetic Co-Ag clusters.- Appl. Surf. Sci., vol. 226, p. 265-270, 2004
Feklisova O. V. , Yakimov E. B., Yarykin N., Pichaud B.- Temperature dependence of electron beam induced current contrast of deformation-induced defects in silicon.- Journ. Phys.: Cond. Mat. 16, 201-5 (2004)
Flory F., Escoubas L.- Optical properties of nano - structured thin films.- Progress in Quantum Electronics, vol. 28, p. 89-, 2004
Gagou Y., Muller Ch., Frémy M.A., Mezzane D., Elkaïm E., Saint-Grégoire P.- Structural study of ferroelectric and paraelectric phases in PbK2LiNb5O15.- Physica Status Solidi, vol. 241, p. 2629-2638, 2004
Gas P., Bergman C., Labar J., Barna P., d’Heurle F.M.- Formation of embedded Co nanoparticles by reaction in Al/Co multilayers and impact on phase sequence.- Applied Physics Letters, vol. 84, p. 2421-2423, 2004
Gavillet J. , Thibault J., Stephan O., Amara H., Loiseau A., Bichara C., Gaspard J. P., Ducastelle F.- Nucleation and growth of single wall nanotubes : the role of metallic catalys.- Journal of Nanoscience and Nanotechnol., 4 , 346-359 (2004)
Gergaud P., Rivero C., Gailhanou M., Thomas O., Froment B. , Jaouen H.- Exploring Ni-Si thin-film reactions by means of simultaneous synchrotron .- X-ray diffraction and substrate curvature measurements.- Mat. Sci. and Engin. B 114-15, 67-71 (2004)
Gilibert F., Rideau D., Bernardini S., Scheer P., Minondo M., Roy D., Gouget G. and Juge A.- DC and AC MOS transistor modelling in presence of high gate leakage and experimental validation.- Solid-State Electronics, vol. 48, n° 4, p. 597-608, 2004
Gillet M., Aguir K., Lemire C., Gillet E. and Schierbaum K.- The structure and electrical conductivity of vacuum-annealed WO3 thin films.- Thin Solid Films, vol. 467, p. 239-246, 2004
Gillet M., Masek K., Gillet E.- Structure of tungsten oxide nanoclusters.- Surface Science, vol. 566-568, p. 383-389, 2004
Gontier-Moya E.G., Beszeda I., Moya F.- Comparisons of parameters involved in mass transport and desorption at the surface of noble metals and sapphire.- Surface Science, vol. 566-568, p. 148-154, 2004
Gontier-Moya E.G., Moya F., Bernardini J.- A new diffusion mechanism for self-compensating impurities in alpha-alumina.- Z. Metallkd, vol. 95, p. 888-894, 2004
Guinneton F., Sauques L., Valmalette J.C., Cros F., Gavarri J.R.- Optimized infrared switching properties in thermochromic vanadium dioxide thin films: role of deposition process and microstructure.- Thin Solid Films, vol. 446, n° 2, p. 287-295, 2004
Harrison S., Coronel P., Wacquant F., Regnier C., Leverd F., Beverina A., Bustos J., Tavel B., Skotnicki T.- New concept of high-k integration in MOSFET’s by a deposition through contact holes.- MicroElectronic Engineering, vol. 72, p. 321-325, 2004
Hemamala U.L.C. , El-Ghussein F., Goedken A.M., Chen B., Leroux Ch. and Kruger M.B.- High-pressure X-ray diffraction and Raman spectroscopy of HfV2O7.- Physical Review B, vol. 70, p. 2141141-214114, 2004
Hidalgo P., Ottaviani L., Idrissi H., Lancin M., Martinuzzi S., Pichaud B.- Structural characterisation of (11(2)0) 4H-SiC substrates by cathodoluminescence and X-ray topography.- Europ. Phys. Journ.:Appl. Phys. 27, 231-3 (2004)
Hidalgo P., Palais O., Martinuzzi S.- Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps.- Journ. Phys.: Cond. Mat. 16, 19-24 (2004)
Houssa M., Aoulaiche M., Autran J.L., Parthasarathy C., Revil N., Vincent E.- Modeling negative bias temperature instabilities in hole channel metal-oxide-semiconductor field effect transistors with ultrathin gate oxide layers.- Journal of Applied Physics, vol. 95, p. 2786-2791, 2004
Houssa M., De Gendt S., Autran J.L., Groeseneken G., Heyns M.M.- Role of hydrogen on negative bias temperature instability in HfO2-based hole channel field-effect transistors.- Applied Physics Letters, vol. 85, p. 2101-2103, 2004
Houssa M., S. De Gendt, G. Groeseneken, M.M. Heyns, and Autran J.L.- Negative bias temperature instabilities in SiO2/HfO2 based hole channel field effect transistors.- Journal of the Electrochemical Society, vol. 151, p. F288-, 2004
Hubert C., Fiorini-Debuisschert C., Raymond P., M. Nunzi J., Simon J.J., Escoubas L.- Spontaneous photo-induced structuration of the surface of Azo-Benzene polymer films by the molecular migration effect.- Nonlinear Optics. Quantum Optics, vol. 31, p. -, 2004
Ionescu A. M., Munteanu D., Hefyene N., Anghel C.- Compact modeling of weak inversion generation transients in SOI MOSFETs.- Journal of the Electrochemical Society, vol. 151, p. G396-G401, 2004
Isa M., Valmalette J.C., Muller C., Lomello-Tafin M., Gas P., Elkaïm E.- Study of the nanostructuration of ZrAu alloy near the ambient temperature by synchrotron radiation and thermal analyses.- J. Alloys Compounds, vol. 373, 1-2, p. 96-103, 2004
Jamgotchian H., Nguyen Thi H., Bergeon N., Billia B.- Double-diffusive convective modes and induced microstructure localisation during solidification of binary alloys.- International Journal of Thermal Sciences, vol. 43, n° 8, p. 769-777, 2004
Kanoun M., M. Lemiti, G. Bremond, A. Souifi, F. Bassani, Berbezier I.- Electrical study of MOS structure with Ge embedded in SiO2 as floating gate for non-volatile memory.- Superlattices and Microstructures, vol. 36, n° 1-3, p. 143-148, 2004
Karmous A., A. Cuenat, A. Ronda, I. Berbezier , S. Atha, R. Hull.- Ge dot organization on Si substrates patterned by focused ion beam.- Applied Physics Letters, vol. 85, p. 6401-6403, 2004
Klimczak-Chmielowska M., Chmielowski R., Kopia A., Kusinski J., Villain S., Leroux C., Gavarri J.R.- Multiphase CuOz-CeO2-d thin films by pulsed laser deposition technique : experimental texture evolutions and kinetics modeling.- Thin Solid Films, vol. 458, p. 98-107, 2004
Kyung B., Hankevych V., Dare A.M., Tremblay A.M.S.- Pseudogap and spin fluctuations in the normal state of the electron-doped cuprates.- Physical Review Letters, vol. 93, n° 14, p. 147004-, 2004
Labat S., Bocquet F. , Gilles B., Thomas O.- Stresses and interfacial structure in Au-Ni and Ag-Cu metallic multilayers.- Scripta-Materialia 50 , 717-21 (2004)
Lacaze E., Michel J.P., Goldmann M., Gailhanou M., de-Boissieu M., Alba M.- Bistable nematic and smectic anchoring in the liquid crystal octylcyanobiphenyl (8CB) adsorbed on a MoS2 single crystal.- Phys. Rev. E., 69, 41705-8 (2004)
Lauque P., M. Bendahan, JL. Seguin, K A. Ngo, P. Knauth.- Highly sensitive and selective room temperature NH3 gas microsensor using an ionic conductor (CuBr) film.- Analytica Chimica Acta, vol. 515, n° 2, p. 279-284, 2004
Leoni E. , Binetti S., Pichaud B., Pizzini S.- Dislocation luminescence in plastically deformed silicon crystals: effect of dislocation intersection and oxygen decoration.- Europ. Phys. Journ.: Appl. Phys. 27, 123-7 (2004)
Leoni E., El Bouayadi R, Martinelli L., Regula G., Ntsoenzok E., Pichaud B., Pizzini S.- Structural and optical characterization of a dispersion of nanocavities in a crystalline silicon matrix.- Europ. Phys. Journ.: Appl. Phys. 27, 89-92 (2004)
Liu Q.S., Zhou B.H., Nguyen Thi H., Hu W.R.- Instability of two layer Rayleigh-Benard convection with interfacial thermocapillary effect.- China Physics Letters, vol. 21, p. 686-, 2004
Loiseau A., Gavillet J., Ducastelle F., Thibault J., Stéphan O., Bernier P., Thair S.- Nucleation and growth of SWNT: TEM studies of the role of the catalyst.- C. R Physique 4, 975-991 (2004)
Lopez L., Masson P., Née D., Bouchakour R.- Temperature and drain voltage dependence of gate-induced drain leakage.- Microelectronic Engineering, vol. 72, n° 1-4, p. 101-105, 2004
Mangelinck D., Lee P.S., Osipowitcz T., Pey K.L.- Analysis of laterally non-uniform layers and sub-micron devices by Rutherford backscattering spectrometry.- Nuclear Instruments and Methods in Physics Research B, vol. 215, n° 3-4, p. 495-500, 2004
Marine W., Bulgakova N.M., Patrone L., Ozerov I.- Electronic mechanism of ion expulsion under UV nanosecond laser excitation of silicon: experiment and modeling.- Applied Physics A : Materials Science & Processing, vol. 79, p. 771-774, 2004
Menou N., Castagnos A-M., Muller Ch., Johnson J., Wouters D.J., Baturin I., Shur V. Ya.- Failure analysis of FeCAPs. Electrical behavior under synchrotron X-ray irradiation.- Integrated Ferroelectrics, vol. 61, p. 89-95, 2004
Michel J. P., Lacaze E., Alba M., de-Boissieu M. , Gailhanou M., Goldmann M.- Optical gratings formed in thin smectic films frustrated on a single crystalline substrate.- Phys. Rev. E., 70, 11709-12 (2004)
Moreau J.M., Isa, Chaou A.A., Lomello-Tafin M., Galez P., Jourdan J., Valmalette J.C., Soubeyroux J.L.- Neutron powder diffraction study of the crystal structures of ZrAu.- J. Alloys Compounds, vol. 373, 1-2, p. 16-27, 2004
Morris S.J., Fougeres P., Bozzo-Escoubas S., Bodnar S., Gaillard S.- Simultaneous optical measurement of Germanium content and Boron doping in strained heteroepitaxial SiGe films using a novel data-analysis technique.- Mat. Science in Semiconductor Processing Vol. 7, 383-388 (2004)
Nony L., Bennewitz R., Pfeiffer O., Gnecco E., Meyer E., Eguchi T., Gourdon A., Joachim C.- Cu-TBPP and PTCDA molecules on insulating surfaces investigated by UHV non-contact AFM.- Nanotechnology, vol. 15, p. S91-S96, 2004
Nony L., Gnecco E., Bennewitz R., Baratoff A., Alkauskas A., Pfeiffer O., Maier S., Wetzel A., Meyer E. and Gerber C.- Ordered molecular assemblies confined in nanostructures on an insulator.- Nanoletters, vol. 4, p. 2185-2189, 2004
Nony L., Gnecco E., Bennewitz R., Baratoff A., Alkauskas A., Pfeiffer O., Maier S., Wetzel A., Meyer E.and Gerber C.- Ordered molecular assemblies confined in nanostructures on an insulator.- Nanoletters, vol. 4, 2185-2189, 2004
Oison V., Rabiller P., Katan C.- Theoretical investigation of the ground-state properties of DMTTF-CA : a step toward the understanding of charge transfer complexes undergoing the neutral-to-ionic phase transition.- Journal of Physical Chemistry A, vol. 108, p. 11049-11055, 2004
Ottaviani L., Hidalgo P., Idrissi H., Lancin M., Martinuzzi S., Pichaud B.- Structural characterization of 6H- and 4H-SiC polytypes by means of cathodoluminescence and x-ray topography.- Journ. Phys.: Cond. Mat. 16, 107-14 (2004)
Palais O., Hidalgo P.- Investigation and identification of Transition Metals in p-Type Boron-Doped Silicon by Non-Invasive Techniques .- Defects and Diffusion Forum 230, 125-133 (2004)
Palais O., Hidalgo P., Martinuzzi S.- FeB and CrB pair reassociation kinetics in imperfect Si controlled by contactless lifetime scan maps.- Europ. Phys. Journ.: Appl. Phys. 27, 483-5 (2004)
Palais O., Lamzatouar A., Hardouin-Duparc O. B. M., Thibault J., Charaï A.- Correlation between electrical activity and various structures of Ge grain boundaries.- Journ. of Phys. : Cond. Mat. 16, 8207-8210 (2004)
Papageorgiou N., Angot T., Salomon E., Giovanelli L., Layet J. M., Le Lay G.- Physics of ultra-thin phtalocyanine films on semiconductors.- Progress in Surface Science, vol. 77, p. 139-, 2004
Patrone L., Palacin S., Bourgoin J.-P., Werts M.H.V.- Versatility of aqueous micellar solutions for self-assembled monolayers engineering.- Langmuir, vol. 20, n° 26, p. 11577-11582, 2004
Payet F., Cavassilas N., Autran J.L.- Theoretical investigation of hole phonon-velocity in strained Si/SiGe MOSFET’s.- Journal of Applied Physics, vol. 95, p. 713-717, 2004
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Pey K.L., Lee P.S. and Mangelinck D.- Ni(Pt) alloy silicidation on (100) Si and poly-silicon lines.- Thin Solid Films, vol. 462-463, p. 137-145, 2004
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Porte L.- Stress and surface energies versus surface nanostructuring : the InGaAs/InP(001) epitaxial system.- Journal of Crystal Growth, vol. 273, p. 136-148, 2004
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Saitzek S., Guirleo G., Guinneton F., Sauques L., Villain S., Aguir K., Leroux C., Gavarri J.R.- New thermochromic CeO2-VO2 bilayers for optical or electronic switching systems.- Thin Solid Films, vol. 449, n° 1-2, p. 166-172, 2004
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Suchodolskis A., Assmus W., Giovanelli L., Karlsson U. O., Karpus V., Le Lay G., and Uhrig E.- Valence band structure of i-ZnMgEr quasicrystal: photoemission study.- Journal of Physics : Condensed Matter, vol. 16, p. 1-, 2004
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Vervisch W., Ventura L., Pichaud B., Ducreux G., Lanois F., Lhorte A.- Kinetic reaction of the formation of the platinum related complex at the origin of the p-type doping effect in silicon.- Solid State Phenom. 95-96, 361-6 (2004)
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Xerri B., Borloz B.- An iterative method using conditional second order statistics applied to the blind source separation problem.- IEEE Transactions on Signal Processing, vol 52, n° 2, p. 313-328, 2004
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Autran J.L., Munteanu D., Houssa M., Castellani-Coulié K., Said A.- Performance degradation induced by fringing field-induced barrier lowering and parasitic charge in double-gate metal-oxide-semiconductor field-effect transistors with high-k dielectrics.- Japanese Journal of Applied Physics, p. 8362-8366, 2005
Autran J.L., Munteanu D., Tintori O., Aubert M., Decarre E.- An analytical subthreshold current model for ballistic quantum-wire MOS transistors.- Molecular Simulation, vol. 31, n° 2-3, p. 179-183, 2005
Autran J.L., Nehari K., Munteanu D.- Compact modeling of the threshold voltage in silicon nanowire MOSFET including 2D-quantum confinement effects.- Molecular Simulation, vol. 31, p. 839-843, 2005
Avoinne C., Rashid T., Chowdhury V., Rahajandraibe W., Dufaza C.- Second-order compensated bandgap reference with convex correction.- Electronics Letters, vol. 41, n° 7, p. 276-277, 2005
Bansmann J., S.H. Baker, C. Binns, J.A. Blackman, J.-P.Bucher, J. Dorantes-Dávila, V. Dupuis, L. Favre, D. Kechrakos, A.Kleibert, K.-H. Meiwes-Broer, G.M. Pastor, A. Perez, O.Toulemonde, K.N. Trohidou, J. Tuaillon et Y. Xie.- Magnetic and structural properties of isolated and assembled clusters.- Surface Science Reports, à paraître, 2005
Barrett N., Krasovskii E.E., Themlin J.-M., Strocov V.N.- Elastic scattering effects in the electron mean free path in a graphite overlayer studied by photoelectron spectroscopy and LEED.- Physical Review B, vol. 71, p. 035427, 2005
Baturin I., Menou N., Shur V. Ya., Muller Ch., Kuznetsov D., Hodeau J-L., Sternberg A.- Influence of irradiation on the switching behavior in PZT thin films.- Materials Science and Engineering B, vol. 120, p. 141-145, 2005
Bellini, B., Ackermann, J., Klein, H., Dumas, Ph., Safarov, V.- Light-induced random-walk motion in azo-polymers.- Materials Science and Engineering C, vol. 25, 675-678, 2005
Benarchid Y., Rogez J.- The effect of Cr2O3 and P2O5 additions on the phase transformations during the formation of calcium sulfoaluminate C4A3S.- Cement and Concrete Research 35, 2074-2080, (2005)
Benarchid Y., Rogez J., Diouri A., Boukhari A., Aride J.- Formation and hydraulic behaveior of chromium-phosphorus doped calcium sulfoaluminate cement.- Thermochimica Acta 433, 183-186 (2005)
Berbezier I., Descoins M., Ismail B., Maaref H., Ronda A.- Influence of Si(001) substrate misorientation on morphological and optical properties of Ge quantum dots.- Journal of Applied Physics, vol. 98, n° 6, p. 063517, 2005
Bergeon N., Trivedi R., Billia B., Echebarria B., Karma A., Liu S., Weiss C., Mangelinck-Noël N.- Real-time in situ characterization of interface- dynamics in microstructure formation during 3D-directional solidification of transparent alloys.- Advances in Space Research, vol. 36, p. 80-, 2005
Bescond M., Autran J.L., Cavassilas N., Munteanu D., Lannoo M.- Treatment of point defects in nanowire MOSFETs using the nonequilibrium Green’s function formalism.- Journal of Computational Electronics, vol. 3, p. 393-396, 2005
Beszeda I., Beke D.L., Gontier-Moya E.G., Kaganovskii Yu.S., Ianetz D.- Calculations of surface diffusion self-diffusion coefficients from AES data on decay of thin metal films.- Defect and Diffusion Forum, vol. 237-240, p. 727-732, 2005
Beszeda I., Gontier-Moya E.G., Imre A.W.- Surface Ostwald ripening and evaporation of gold beaded films on sapphire.- Applied Physics A, vol. 81, n° 4, p. 673-676, 2005
Billia B., Gandin Ch-A., Zimmermann G., Browne D., Dupouy M-D.- Columnar-equiaxed transition in solidification processing : the ESA-MAP CETSOL project.- Microgravity Science Technology, vol. 16, p. 20-, 2005
Billia B., Nguyen Thi H., Reinhart G., Dabo Y., Zhou B.H., Liu Q.S., Lyubimova T.P., Roux B., Lan C.W.- Tailoring of dendritic microstructure in solidification processing by crucible vibration / rotation.- Microgravity Science Technology, vol. 16, p. 15-, 2005
Bocquet F., Maurel C., Roussel J.M., Abel M., Koudia M., Porte L.- Segregation-mediated capping of Volmer-Weber Cu islands grown onto Ag(111).- Physical Review B, vol. 71, p. 075405-, 2005
Bouquet V., Canet P., Lalande F., Bouchakour R., Mirabel J.M.- Non volatile memory cell design : coupling ratio impact on tunnel oxide reliability.- Journal of Non-Crystalline Solids, vol. 351, n° 21-23, p. 1873-1877, 2005
Branbilla A., Giovanelli L., Vilmercati P., Cattoni A., Biagioni P., Goldoni A., Finazzi M., Duò L..- Rb-intercalated C60 compounds studies by photoemission and inverse photoemission spectroscopy.- Journal of Electron Spectroscopy and Related Phenomena, vol. 144-147C, p. 803-, 2005
Bravaix A., Goguenheim D., Huard V., Denais M., Parthasarathy C., Perrier F., Revil N., Vincent E.- Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs.- Microelectronics Reliability, vol. 4, n° 9-11, p. 1370-1375, 2005
Brutin D., Tadrist L.- Comment to "A study of laminar flow of polar liquids through circular microtubes" [Phys.Fluids [16], 1267 (2004)].- Physics of Fluids, vol. 17, p. 019101, 2005
Brutin D., Tadrist L.- Destabilization mechanisms and scaling laws of convective boiling in a minichannel.- Journal of Thermophysics and Heat Transfer, sous-presse, 2005
Brutin D., Tadrist L.- Modeling of surface-fluid electrokinetic coupling on the laminar flow friction factor in microtubes.- Microscale Thermophysical Engineering, vol. 9, p. 1, 2005
Buckley J., De Salvo B., Deleruyelle D., Gely M., Nicotra G., Lombardo S., Damlencourt J.F., Hollinger Ph., Martin F., Deleonibus S.- Reduction of fixed charges in atomic layer deposited Al2O3 dielectrics.- Microelectronic Engineering, vol. 80, p. 210-213, 2005
Casadei B., Dufaza C., Martin L.- Photogate simulation model for CMOS imagers design.- WSEAS Transactions on Circuits and Systems, Issue 5, vol. 4, p. 453-461, ISBN 1109-2734, May 2005
Castellani-Coulié K., Munteanu D., Autran J.L., Ferlet-Cavrois V., Paillet P., Baggio J.- Simulation analysis of the bipolar amplification induced by heavy-ion irradiation in double-gate MOSFETs.- IEEE Transactions on Nuclear Science, vol. NS-52, p. 2137- 2143, 2005
Castellani-Coulié K., Munteanu D., Ferlet-Cavrois V., Autran J.L.- Simulation analysis of the bipolar amplification in fully-depleted SOI technologies under heavy-ion irradiations.- IEEE Transactions on Nuclear Science, vol. NS-52, p. 1474-1479, 2005
Cavassilas N., Bescond M., Autran J.L.- Improvement of current-control induced by oxide notch in very short field-effect transistor.- Applied Physics Letters, vol. 87, p. 73509-73512, 2005
Chabre F., Ghorayeb A. M., Millet P., Pashchenko V. A. and Stepanov A.- Low-temperature behavior of the ESR linewidth in a system with a spin gap : eta-Na1.286V2O5.- Physical Review B, vol. 72, p. 012415 (1 à 4), 2005
Chaillan F., Courmontagne P.- Amélioration par utilisation du filtrage adapté stochastique de la détection de sillages sur des images SAR.- Traitement du Signal, acceptée, 2005
Charvet S., Le Bourhis E., Faurie D., Goudeau P., Lejeune M., Gergaud P.- Evolution under annealing and nitrogen implantation of the mechanical properties of amorphous carbon films.- Thin solid Films 482, 318- 323 (2005)
Chérault N., Carlotti G., Casanova N., Gergaud P., Goldberg C., Thomas O., Verdier M.- Mechanical characterization of low−k and barrier dielectric thin films.- Microelectronic Engineering, 82, 368 (2005)
Chung J.-H., Proffen Th., Shamoto S., Ghorayeb A.M., Croguennec L., Tian W., Sales B.C., Jin R., Mandrus D. and Egami T.- Local structure of LiNiO2 studied by neutron diffraction.- Physical Review B, vol. 71, p. 064410 (1 à 11), 2005
Coulet M-V., Testemale D, Hazemann . J-L., Gaspard J-P. , Bichara C.- Reverse Monte Carlo analysis of the local order in liquid Ge0.15Te0.85 alloys combining neutron scattering and x-ray absorption spectroscopy.- Phys. Rev. B. 72(17) 366- 371 (2005)
Courmontagne P.- An improvement of ship wake detection based on the radon transform.- Signal Processing, vol. 85, n° 8, p. 1634-1654, 2005
De Luigi, C. et Jauffret C.- Estimation and classification of FM signals using time frequency transforms.- IEEE Transactions on Aerospace and Electronic Systems, vol 41, n° 2, p. 421-437, 2005
Deleruyelle D., Molas G., DeSalvo B., Gely M., Lafond D.- Single-electron phenomena in ultra-scaled floating-gate devices and their impact on electrical characteristics.- Solid-State Electronics, vol. 49, p.1728-1733, 2005
Deschamps A., Genevois C., Dumont-Nicolas M., Perrard F., Bley F.- Study of precipitation kinetics: towards non-isothermal and coupled phenomena.- Phil. Mag. A 85, 3091-3112 (2005)
Dolino G., Bastie P., Capelle B., Chamard V., Härtwig J. , Guzzo P.L.- Origin of the opalescence at the a-b transition of quartz: role of the incommensurate phase studied by synchrotron radiation.- Phys. Rev. Lett. 94, 465 (2005)
Drillet P, Dulcy C, Pazsko F, Mangelinck D., Gas P., Clugnet G., Bergman C., Vaughan G.- Real time synchrotron analysis of the initial stages of the galvanization process in Al containing Zn baths.- Revue de Métallurgie,Cahiers d’Informations Techniques, vol. 102, n° 1, p. 75-78, 2005
Dumont M., Lefebvre W., Doisneau-Cottignies B., Deschamps A.- Characterisation of the composition and volume fraction of eta ' and eta precipitates in an Al-Zn-Mg alloy by a combination of atom probe, small-angle X-ray scattering and transmission electron microscopy.- Acta Mater. 53, 2881-2892 (2005)
El Hadadi B., Carchano H., Seguin J.L., Tijani H.- Structural and electrical properties of amorphous GaAs sputtered at high substrate temperature (220 and 400°C).- Vacuum, vol. 80, p. 272-283, 2005
Elkhadiri I., Diuori A., Boukhari A., Rogez J.- Thermodynamic variations in the decarbonation of low calcium fly ash-cement raw mix.- Materiales de Construccion 55 41-49 (2005)
Enoch S., Simon J.-J., Escoubas L., Elalamy Z., Lemarquis F., Torchio P., Albrand G.- Simple layer-by-layer photonic crystal for the control of thermal emission.- Applied Physics Letters, vol. 86, p. 261101-, 2005
Ernst R., Mangelinck-Noël N., Hamburger J., Garnier C., Ramoni P.- Grain size reduction by electromagnetic stirring inside gold alloys.- European Physical Journal - Applied Physics, vol. 30, p. 215-222, 2005
Feklisova O. V., Pichaud B., Yakimov E.B.- Annealing effect on the electrical activity of extended defects in plastically deformed p-Si with low dislocation density.- Phys. Stat. Sol. A 202, 896-900 (2005)
Feltrin A., Michelini F., Staehli JL. et al.- Localization-dependent photoluminescence spectrum of biexcitons in semiconductor quantum wires.- Physical Review Letters, vol. 95, n° 17, p. 177404, 2005
Garandet J.P., Boutet G., Lehmann P., Drevet B., Camel D., Rouzaud A., Favier J.J., Faivre G., Coriell S., Alexander J.I.D., Billia B.- Morphological stability of a solid – liquid interface and cellular growth : Insights from thermoelectric measurements in microgravity experiments.- Journal of Crystal Growth, vol. 279, p. 195-205, 2005
Gaubert J., Egels M., Pannier P., Bourdel S.- Design method for broadband CMOS RF LNA.- Electronics Letters, vol. 41, n° 7, p. 382-384, 2005
Gilibert F., Rideau D., Dray A., Agut F., Minondo M., Juge A., Masson P., Bouchakour R.- Characterization and modeling of gate-induced-drain-leakage.- IEICE Transactions on Electronics, vol. E88-C, n° 5, p. 829-837, 2005
Gillet M., Delamare R., and Gillet E.- Growth, structure and electrical properties of tungsten oxide nanorods.- European Physical Journal D, vol. 34, p. 291-294, 2005
Gillet M., K. Aguir, M. Bendahan, P. Mennini.- Grain size effect in sputtered trioxide thin films on the sensitivity to ozone.- Thin Solid Films, vol. 484, n° 1-2, p. 358-363, 2005
Gillet M., Mikaelian G., Assaban A., Gillet E.- Stresses and adhesion of thin metallic coatings on oxide substrates.- Journal of Adhesion Science and Technology, vol. 19, n° 9, p. 753-763, 2005
Gillet M., R. Delamare, E. Gillet.- Growth of epitaxial tungsten oxide nanorods.- Journal of Crystal Growth, vol. 279, p. 93-99, 2005
Giovanelli L., De Santis M., Panaccione G., Sirotti F., Vobornik I., Larciprete R., Egger S. and Rossi G.- Magnetic and electronic properties of a Pt-Co bilayer on Pt(111).- Journal of Magnetism and Magnetic Materials, vol. 288, p. 236-, 2005
Giovanelli L., Panaccione G., Rossi G., Fabrizioli M., Tian C.-S., Gastelois P. L., Fujii J., and Back C. H.- Interface magnetization profiling by X-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6).- Applied Physics Letters, vol. 87, p. 1-, 2005
Giovanelli L., Panaccione G., Rossi G., Fabrizioli M., Tian C.-S., Gastelois P. L., Fujii J., and Back C. H.- Layer selective spectroscopy on Fe/GaAs(001) : influence of the interface on the magnetic properties.- Physical Review B, vol. 72, p. 45221, 2005
Goguenheim D., Bravaix A., Gomri S., Moragues J.M., Monserie C., Legrand N., Boivin P.- Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies.- Microelectronics Reliability, vol. 45, p. 487-492, 2005
Gomri S., Seguin J.L., Aguir K.- Modeling on oxygen chemisorption-induced noise in metallic oxide gas sensors.- Sensors and Actuators B : Chemical, vol. 107, n° 2, p. 722-729, 2005
Goudeau P., Mendibide C., Steyer P., Esnouf C., Thiaudiere D., Gailhanou M., Fontaine J.- X-ray diffraction analysis of the residual stress state in PVD TiN/CrN multilayer coatings deposited on tool steel.- Surface & Coatings Technology, vol.200, no.1-4, 165-9. (2005)
Goudeau P., Vandenbulcke L., Met C., De Barros M.I., AndreAzza P., Thiaudiere D., Gailhanou M.- X-ray diffraction analysis of residual stresses in smooth fined-grain diamond coatings deposited on TA6V alloys.- Surface & Coatings Technology, vol.200, no.1-4,. 170-3. (2005)
Goux L., Lisoni J.G., Schwitters M., Paraschiv V., Maes D., Haspeslagh L., Wouters D.J., Menou N., Turquat Ch., Madigou V., Muller Ch., Zambrano R.- Composition control and ferroelectric properties of sidewalls in integrated 3-dimensional Sr0.8Bi2.2Ta2O9-based ferroelectric capacitors.- Journal of Applied Physics, vol. 98, n° 5, p. 054507 (1-7), 2005
Goux L., Russo G., Menou N., Lisoni J.G., Schwitters M., Paraschiv V., Maes D., Artoni C., Corallo G., Haspeslagh L., Wouters D.J., Zambrano R., Muller Ch.- A highly reliable 3-dimensional integrated SBT ferroelectric capacitor enabling FeRAM scaling.- IEEE Transactions on Electron Devices, vol. 52, n° 4, p. 447-453, 2005
Guérin J., K. Aguir, M. Bendahan and C. Lambert-Mauriat.- Thermal modelling of a WO3 ozone sensor response.- Sensors and Actuators B : Chemical, vol. 104, n° 2, p. 289-293, 2005
Guérin R., Debierre J.M., Kassner K.- Growth patterns in a channel for singular surface energy : phase-field model.- Physical Review E, vol. 71, p. 011603, 2005
Guinneton F., Monnereau O., Argeme L., Stanoi D., Socol G., Mihailescu I.N., Zhang T., Grigorescu C., Trodahl H.J., Tortet L., PLD thin films obtained from CrO3 and Cr8O21 targets.- Applied Surface Science, vol. 247, n° 1-4, p. 139-144, 2005
Guinneton F., Sauques L, Valmalette J.C., Cros F., Gavarri J.R.- Role of surface defects and microstructure in infrared optical properties of thermochromic Vo2 materials.- Journal of Physics and Chemistry of Solids, vol. 66, n° 1, p. 63-73, 2005
Hassam S., Bahari Z.- Equilibrium phase diagram of the Ag-Au-Pb ternary system.- Journal of Alloys and Compounds 392,120-126 (2005)
Houssa M.- Modelling negative bias temperature instabilities in advanced p-MOSFETs.- Microelectronics Reliability, vol. 45, p. 3-12, 2005
Houssa M., De Jaeger B., Delabie A., Van Elshocht S., Afanas’ev V.V., Autran J.L., Stesmans A., Meuris M., Heyns M.M.- Electrical characteristics of Ge/GeOx/HfO2/TaN structures.- Journal of Non-Crystalline Solids, vol. 351, p. 1902-1905, 2005
Huard V., Denais M., Parthasarathy C., Ribes G., Perrier F., Revil N., Bravaix A.- Review on NBTI and PBTI degradation in deep submicrometer CMOS technologies.- Microelectronics Reliability, acceptée, 2005
Huard V., Denais M., Perrier F., Revil N., Parthasarathy C., Bravaix A., Vincent E.- A thorough investigation of MOSFETs NBTI degradation.- Microelectronics Reliability, special issue, vol. 45, n° 1, p. 83-98, 2005
Idrissi H., Lancin M., Douin J., Regula G., Pichaud B.- Dynamical study of dislocations and 4H to 3C transformation induced by stress in (11-20) 4H-SiC.- Mat. Sci. Forum 483-485, 299-302 (2005)
Idrissi H., Regula G., Lancin M., Douin J., Pichaud B.- Study of Shockley partial dislocation mobility in highly N-doped 4H-SiC by cantilever bending.- Phys. Stat Sol C 6, 1998-2003 (2005)
Isa M., Valmalette J.C., Muller C., Leroux C.- Evolution in time of a gold-zirconia nanopowder at room temperature : nucleation-growth of gold nanoparticles.- Chemistry of Materials, vol. 17, n° 24, p. 5920-5927, 2005
Ismail B., M. Descoins, A. Ronda, F. Bassani, G. Bremond, H. Maaref, Berbezier I.- Effect of self-patterned Si1-xGex template layer on the structural and optical properties of Ge dots.- Journal of Vacuum Science and Technology B, vol. 23, n° 1, p. 242-246, 2005
Jennane A., Bernardini J., Moya G.- Defect recovery studied by positron lifetime measurements in quenched and electron irradiated dinickel silicide.- Physical and Chemical News, vol. 24, p. 76-79, 2005
Kassner K., C. Misbah, J-M. Debierre.- Nonlocal interface equations in crystal growth.- Journal of Crystal Growth (Proceedings of the 14th International Conference on Crystal Growth and the 12th International Conference on Vapor Growth and Epitaxy), vol. 275, n° 1-2, e183, 2005
Labidi A., C. Jacolin, M. Bendahan, A. Abdelghani, J. Guérin, K. Aguir and M. Maaref.- Impedance spectroscopy on WO3 gas sensor.- Sensors and Actuators B : Chemical, vol. 106, n° 2, p. 713-718, 2005
Lamzatouar A., Palais O., Hardouin-Duparc O.B.M., Thibault J., Charai A.- Relationship between structure, segregation and electrical activity in grain boundaries.- Journ. Mat. Sci. 40, 3163-7 (2005)
Lannoo M.- Atomistic nanodevice simulation.- Solid State Phenomena, vol. 108-109, p. 787-, 2005
Lauque P., Bendahan M., Seguin J.L., Knauth P.- Application of CuBr ion conductor thin films for ammonia detection.- Materials Research Society Symposium, vol. 835, p. -, 2005
Leandri C., Le Lay G., Aufray B., Girardeaux C., Avila J., Dávila M.E., Asensio M.C., Ottaviani .-C., Cricenti A.- Self-aligned silicon quantum wires on Ag (110).- Surface Science, vol. 574, n° 1, p. L9-L15, 2005
Lee P.S., Pey K.L., Mangelinck D., Chi D.Z., Osipowicz T.- On the morphological changes of Ni- and Ni(Pt)-silicides.- Journal of the Electrochemical Society, vol. 152, n° 4, p. G305-G308, 2005
Legros M., Kaouache B., Gergaud P., Thomas O., Dehm G., Balk T. J., Arzt E.- Pipe-Diffusion ripening of Si precipitates in Al-0.5% Cu-1%Si thin films.- Phil. Mag. A 85, 3541-3552 (2005)
Lombardo P., Daré A.M., Hayn R.- Effect of Hund's exchange on the spectral function of a triply orbital degenerate correlated metal.- Physical Review B, vol. 72, p. 245115, 2005
Lyubimov D.V., Lyubimova T.P., Tcherepanov A.A., Roux B., Billia B., Nguyen Thi H.- Vibration influence on morphological instability of a solidification front.- Microgravity Science Technology, vol. 16, p. 290-, 2005
Malko A., Baier M.H., Pelucchi E., Michelini F., Karlsson K.F., Dupertuis M.A., Kapon E.- Single-photon emission from pyramidal quantum dots: The impact of hole thermalization on photon emission statistics.- Physical Review B, vol. 72, n° 19, p. 195332, 2005
Manea A.S., Monnereau O., Notonier R., Guinneton F., Logofatu C., Tortet L., Garnier A., Mitrea M., Negrila C., Branford W., Grigorescu C.E.A.- Heusler bulk materials as targets for pulsed laser deposition: growth and characterization.- Journal of Crystal Growth, vol. 275, n° 1-2, p. 1787-1792, 2005
Mangelinck-Noel N., Nguyen Thi H., Reinhart G., Schenk T., Cristiglio V., Dupouy M.D., Gastaldi J., Billia B., Härtwig J., Baruchel J.- In situ analysis of equiaxed growth of aluminium - nickel alloys by x-ray radiography at ESRF.- Journal of Physics D - Applied Physics, vol. 38, p. A28-A32, 2005
Martinuzzi S., Ferrazza F., Périchaud I.- Improved p type or raw n type multicrystalline silicon wafers for solar cells.- Solid State Phenom. 108-109, 525 (2005)
Martinuzzi S., Palais O., Pasquinelli M., Ferrazza F.- N-type multicrystalline silicon and rear junction solar cells.- Europhys. Journ.: Appl. Phys. 32, 187 (2005)
Maurel C., Abel M., Koudia M., Bocquet F., Porte L.- Pit formation and segregation effect during Cu thin film growth on Ag(111).- Surf. Science 596, 45-52 (2005)
Maurel C., Abel M., Koudia M., Bocquet F., Porte L.- Pit formation and segregation effects during Cu thin film growth on Ag(111).- Surface Science, vol. 596, p. 45–52, 2005
Mazingue T., Escoubas L., Spalluto L., Flory F., Socol G., Ristoscu C., Axente E., Grigorescu S., Mihailescu I.N., Vainos N.- Nanostructured ZnO coatings grown by pulsed laser deposition for optical gas sensing of butane.- Journal of Applied Physics, vol. 98, p. 074312-, 2005
Mendibide C., Steyer P., Esnouf C., Goudeau P., Thiaudiere D., Gailhanou M.- Fontaine J.- X-ray diffraction analysis of the residual stress state in PVD TiN/CrN .- multilayer coatings deposited on tool steel.- Surf. and Coating Technol. 200, 165-169 (2005)
Menou N., Castagnos A-M., Muller Ch., Goguenheim D., Goux L., Wouters D.J., Hodeau J-L., Barrett R.- Degradation and recovery of polarization under synchrotron X-rays in SrBi2Ta2O9 ferroelectric capacitors.- Journal of Applied Physics, vol. 97, n° 4, p. 044106, 2005
Menou N., Muller Ch., Baturin I.S., Kuznetsov D.K., Shur V.Ya., Hodeau J-L., Schneller T.- In situ synchrotron x-ray diffraction study of electrical field induced fatigue in Pt/PbZr0.45Ti0.55O3/Pt ferroelectric capacitors.- Journal of Physics - Condensed Matter, vol. 17, p. 7681-7688, 2005
Menou N., Muller Ch., Baturin I.S., Shur V. Ya, Hodeau J-L.- Polarization fatigue in PbZr0.45Ti0.55O3-based capacitors studied from high resolution synchrotron X-ray diffraction.- Journal of Applied Physics, vol. 97, n° 6, p. 064108, 2005
Menou N., Turquat Ch., Madigou V., Muller Ch., Goux L., Lisoni J., Schwitters M. and Wouters D. J.- Sidewalls contribution in integrated three-dimensional Sr0.8Bi2.2Ta2O9-based ferroelectric capacitors.- Applied Physics Letters, vol. 87, p. 073502, 2005
Merabtine R., Dallas J.P., Cornet M.- Creep strengthening of Ni3(Al, Si) intermetallic alloy by ductile precipitates.- Intermetallics, vol. 13, n° 2, p. 179-186, 2005
Mertz D., Hayn R., Opahle I., Rosner H.- Calculated magnetocrystalline anisotropy and magnetic moment distribution in Li2Cu02.- Physical Review B, vol. 72, p. 085133, 2005
Michel J. P., Lacaze E., Goldmann M., Gailhanou M., de-Boissieu M., Alba M.- Revealing the structure of focal conics cores and their influence on the evolution with temperature: An x-ray study of ultra-thin 8CB films.- Mol. Cryst. and Liquid Cryst. 437, 1343-1353 (2005)
Morris S.J., Fougeres P., Bozzo-Escoubas S., Bodnar S., Gaillard S.- Simultaneous optical measurement of Ge content and doping in strained epitaxial films using a novel data-analysis technique.- Mat. Science in Semiconductor Processing, 8, 261-266 (2005)
Moth-Poulsen K., Patrone L., Stuhr-Hansen N., Christensen J.B., Bourgoin J.P., Bjornholm T.- Probing the effects of conjugation path on the electronic transmission through single molecules using scanning tunneling microscopy.- Nano Letters, vol. 5, n° 4, p. 783-, 2005
Munteanu D., Autran J.L., Harrison S.- Quantum short-channel compact model for the threshold voltage in double-gate MOSFETs with high-k gate dielectrics.- Journal of Non-Crystalline Solids, vol. 351, p. 1911-1918, 2005
Munteanu D., Autran J.L., Harrison S., Nehari K., Tintori O., Skotnicki T.- Compact model of the quantum short-channel threshold voltage in symmetric Double-Gate MOSFET.- Molecular Simulation, vol. 31, p. 831-837, 2005
Nemouchi F., Mangelinck D. Bergman C., Gas P.- Differential scanning calorimetry analysis of the linear parabolic growth of nanometric Ni silicide thin films on a Si substrate.- Applied Physics Letters, vol. 86, p. 041903-05, 2005
Nguyen Thi H., Dabo Y., Drevet B., Dupouy M.D., Camel D., Billia B., Hunt J.D., Chilton A.- Directional solidification of Al – 1.5 wt% Ni alloys under diffusion transport in space and fluid-flow localisation on earth.- Journal of Crystal Growth, vol. 281, p. 654-, 2005
Nguyen Thi H., Reinhart G., Zhou B.H., Billia B., Liu Q.S., Lyubimova T.P., Roux B.- Tailoring of dendritic microstructure in solidification processing by crucible vibration.- Journal of Crystal Growth, vol. 275, p. E1579-, 2005
Nyeki J., C. Girardeaux, Z. Erdelyi, A. Csik, L. Daroczi, G. Langer, D.L. Beke, A. Rolland, J. Bernardini and G. Erdélyi.- Sb diffusion and segregation in amorphous Si thin films.- Defect and Diffusion Forum, vol. 237-240, p. 1246, 2005
Nyeki J., Erdelyi G., Lexcellent C., Bernardini J., Beke D.L.- Grain boundary diffusion of Ni in NiTi shape-memory alloy.- Defect and Diffusion Forum, vol. 237-240, p. 543, 2005
Ottaviani L., Barakel D. , Vervisch V., Pasquinelli M.- Electrical characterizations of hydrogenated 4H-SiC epitaxial samples.- Solid State Phenomena 108-109, 677-682 (2005)
Ottaviani L., Idrissi H., Hidalgo P., Lancin M., Pichaud B.- Structure and electrical studies of partial dislocations and faults in (11-20)-oriented 4H-SiC.- Phys. Stat Sol C 6, 1792-6 (2005)
Ouzaouit K., Benlhachemi A., Aneflous L., Benyaich H., Gavarri J.R., Musso J.A.- The influence of synthesis way and dopant on the crystallite sizes of ceria.- Journal de Physique IV France, vol. 123, p. 125-130, 2005
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Alexandre L, Rousseau K., Alfonso C., Saikaly W., Fares L., Grosjean C., Charaï A.- Optimized Focused Ion Beam silicon samples suitable for lattice parameter measurements by Convergent Beam Electron Diffraction.- Micron, vol. 39, p. 394, 2008 - http://dx.doi.org/10.1016/j.micron.2007.01.005
Aqua J-N., Frisch T.- Elastic interactions and kinetics during reversible submonolayer growth: Monte Carlo simulations.- Physical Review B, vol. 78, p. 121305, 2008
Autran J.L. and Munteanu D.- Simulation of electron transport in nanoscale independent-gate double-gate devices using a full 2D Green’s function approach.- Journal of Computational and Theoretical Nanoscience, vol. 5, p. 1120–1127, 2008 - http://dx.doi.org/10.1166/jctn.2008.010
Aziza H., Bergeret E., Portal J.M., Ginez O.- A novel low power-oriented design methodology for analog blocks.- Journal of Low Power Electronics, vol. 4, n° 1, p. 60-67, 2008 - http://dx.doi.org/10.1166/jolpe.2008.151
Aziza H., Delsuc B.- Device and memory array models for Flash EEPROM technology.- WSEAS Transactions on Circuits and Systems, vol. 7, n° 4, p. 249-258, 2008
Bakiz B., F. Guinneton, J.P. Dallas, S. Villain, J.R. Gavarri.- From cerium oxycarbonate to nanostructured ceria: Relations between synthesis, thermal process and morphologies.- Journal of Crystal Growth, vol. 310, n° 12, p. 3055-3061, 2008
Bakiz B., Ouzaouit K., Benlhachemi A., Gavarri J-R., Villain S., Essoumhi A., Benyaich H.- Multiphase Lanthanum hydroxycarbonates and langasite ceramics for gas sensors.- Physical and Chemical News, n° 41, p. 55-60, 2008
Balogh Z., Erdelyi Z., Beke DL., Langer GA., Csik A., Boyen HG., Wiedwald U., Ziemann P., Portavoce A., Girardeaux C.- Transition from anomalous kinetics toward Fickian diffusion for Si dissolution into amorphous Ge.- Applied Physics Letters, vol. 92, n° 14, p. 143104, 2008 - http://dx.doi.org/10.1063/1.2908220
Barthélemy H., Meillère S., Gaubert J., Dehaese N., Bourdel S. - OTA based on CMOS inverters and application in the design of tunable bandpass filter.- Analog Integrated Circuits and Signal Processing, p. 1573‐1979, 2008 - http://dx.doi.org/10.1007/s10470‐008‐9167‐8.
Battista M. , J. Gaubert, M. Egels, S. Bourdel, H. Barthélemy. - 6-10 GHz Ultra Wide-Band CMOS LNA.- Electronics Letters, vol. 44, (5), pp. 343-344, 2008 - http://dx.doi.org/10.1049/el:20082982
Battista, M., Gaubert, J., Egels, M., Bourdel, S., Barthélemy, H. - High-voltage-Gain CMOS LNA For 6–8.5-GHz UWB Receivers.- IEEE Transactions on Circuits and Systems II: Express Briefs, - vol. 55, n°8, pp. 713 – 717, 2008 - http://dx.doi.org/10.1109/TCSII.2008.922444
Belkacem W., A. Labidi, J. Guérin, N. Mliki, K. Aguir.- Cobalt nanograins effect on the ozone detection by WO3 sensors.- Sensors and Actuators B: Chemical, vol. 132, n° 1, p. 196-201, 2008
Benlhachemi A., K. Ouzaouit, H. Benyaich, S. Villain, J.R. Gavarri.- Catalytic behaviour of polycrystalline barium cerate in presence of air - methane mixtures.- Physical and Chemical News, vol. 41, 2008
Berche A., M.C. Record, Rogez J.- Triangulation of the La-Zn-Mg system.- Archives of Metallurgy and Materials, vol. 53-4, 1141-1148, 2008 - http://www.imim.pl/files/archiwum/Vol4_2008/artykuly/21_.pdf
Bernardini S., M. MacKenzie, O. Buiu, P. Bailey, T.C.Q. Noakes, W.M. Davey, B. Hamilton and S. Hall.- Chemical and optical profiling of ultra thin high-k dielectrics on silicon.- Thin Solid Films, vol. 517, n° 1, 3, p. 459-461, 2008
Bernier N., Bocquet F., Allouch A., Saikaly W., Brosset C., Thibault J., Charai A.- A methodology to quantify the sp2 carbon fraction from K EELS edge spectra.- Journal of Electron Spectroscopy and Related Phenomena, vol. 164, n° 1-3, p. 34-43, 2008 - http://dx.doi.org/10.1016/j.elspec.2008.04.006
Bertaina S., Gambarelli S., Mitra T., Tsukerblat B., Müller A. et Barbara B.- Quantum oscillations in a molecular magnet.- Nature, vol. 453, p. 203-208, 2008 - http://dx.doi.org/10.1038/nature06962
Blum I., A. Portavoce, D. Mangelinck, R. Daineche, K. Hoummada, J. L. Lábár, V. Carron, and C. Perrin.- Lattice and grain-boundary diffusion of As in Ni2Si.- Journal of Applied Physics, vol. 104, p. 114312, 2008 - http://dx.doi.org/10.1063/1.3035836
Boa D., Hassam S., Kra G., Kotchi K.P., Rogez J.- The ternary bismuth-iron-antimony system : Experimental phase diagram study and thermodynamic evaluation.- Calphad Computer Coupling of Phase Diagrams and Thermochemistry, vol. 32, p. 227-239, 2008 - http://dx.doi.org/10.1016/j.calphad.2008.01.001
Bocquet F., Nony N., Loppacher C., Glatzel T.- Analytical approach to the local contact potential difference on (100) ionic surfaces : implications for Kelvin probe force microscopy.- Physical Review B, vol. 78, no 3, p 035410, 2008
Borivent D., Billia B., Paret J.- Anomalous growth of Ni3Si2 in bulk Ni/Si interdiffusion.- Journal of Applied Physics, vol. 104, p. 013523, 2008
Boucher Y.G., J. Le Rouzo, I. Ribet-Mohamed, R. Haïdar.- Modified form birefringence in periodic multilayer structures including uniaxial anisotropic materials.- Journal of Optical Society of America B, vol. 25, n° 5, p. 777-, 2008
Bouffaron R., Escoubas L., Simon J.J., Torchio Ph., Flory F., Berginc G., Masclet Ph.- Enhanced antireflecting properties of micro-structured top-flat pyramids.- Optics Express, 16 (23), 19304-19309, 2008
Bouffaron R., Escoubas L., Simon J-J., Torchio Ph., Flory F., Berginc G., Masclet Ph.- Enhanced antireflecting properties of micro-structured top-flat pyramids.- Optics Express, vol. 16, n° 23, p. 19304-19309, 2008
Boulaajoul K., Dallas J.P., Villain S., Musso J.A., Mesnaoui M., Sedki A.- The differentiation of hospital waste incineration ashes, an academic case : the Marrakech hospital.- International Scientific Journal for Alternative Energy and Ecology, 5, 61, 147-154, 2008
Buran C., Pala M.G., Bescond M., Mouis M.- Full-three dimensional quantum simulation approach for surface-roughness-limited mobility in SNWT.- Journal of Computational Electronics, vol. 7, p. 328, 2008
Burle N., Pichaud B., Vdovin V.I., Rzaev M.M.- Very first relaxation steps in low temperature buffer layers SiGe/Si heterostructures studied by x-ray topography.- Solid State Phenomena, vol. 131-133, p 77-82, 2008
Calmettes B., Nagarajan S., Gourdon A., Abel M., Porte L., Coratger R.- Bicomponent supramolecular packing using a controlled phthalocyanine network.- Angewandte Chemie International Edition, vol. 47, p.6994, 2008
Cayzac R., F. Boulc'h, M. Bendahan, M. Pasquinelli, P. Knauth.- Preparation and optical absorption of electrodeposited or sputtered, dense or porous nanocrystalline CuInS2 thin films.- Comptes Rendus Chimie, vol. 11, n° 9, p. 1016-1022, 2008
Chabchoub S., Rogez J., Saïd H.- Thermochemistry of the mixed calcium phosphate Ca8P2O7(PO4)4.- Thermochimica Acta, vol. 474, 8-11, 2008
Chabriel G., Barrere J., Thirion-Moreau N., Moreau E.- Algebraic joint zero-diagonalization and blind sources separation.- IEEE Transactions on Signal Processing, vol.56, Issue 3, p.980-989, 2008 - http://dx.doi.org/10.1109/TSP.2007.908934
Chamard V., Stangl J, Labat S, Mandl B, Lechner RT, Metzger TH.- Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction.- Journal of Applied Crystallography, vol. 41, p. 272-280, 2008 - http://dx.doi.org/10.1107/S0021889808001167
Chanier T., Opahle I., Sargolzaei M., Hayn R., Lannoo M.- Magnetic state around cation vacancies in II-VI semiconductors.- Physical Review Letters, vol. 100, p. 026405 , 2008
Charbouillot S., Pérez A., Fronte D.- A Programmable Hardware Cellular Automation: Example of Data Flow Transformation.- VLSI Design Journal, vol. 2008, n°1, article ID 160728, p.1-7, 2008 - http://dx.doi.org/10.1155/2008/160728
Chevallier V., Nihoul G., Madigou V.- Exfoliated nanoplatelets of an Aurivillius phase, Bi3.25La0.75Ti3O12: Characterisation by X-ray diffraction and by high-resolution electron microscopy.- Journal of Solid State Chemistry, vol. 18, p. 439-449, 2008
Chmielowska M., S.Villain, A. Kopia, J.P.Dallas,J.Kusinski J. R. Gavarri, Ch. Leroux.- Ce1-xNdxO2- /Si thin films obtained by pulsed laser deposition; microstructure and conduction properties.- Thin Solid Films, vol. 516, n° 12, p 3747-3754, 2008
Chmielowski R., V. Madigou, M. Blicharski, Ch. Leroux.- Sr4Ru2O9 films grown by pulsed laser deposition.- Journal of Crystal Growth, vol. 310, n° 16, p. 3854-3860, 2008
Clair S., Variola F., Kondratenko M., Jedrzejowski P., Nanci A., Rosei F., Perepichka D. F.- Self-assembled monolayer of alkanephosphoric acid on nanotextured Ti.- Journal of Chemical Physics, vol. 128, p. 144705, 2008
Courmontagne Ph.- Débruitage d’images SAS : utilisation conjointe d’un filtre moyenneur auto-adaptatif et du filtrage adapté stochastique.- Traitement du Signal, Numéro spécial: Caractérisation du Milieu Marin, vol. 25, n°1-2, p. 29-44, 2008
Courtade L., Turquat Ch., Muller Ch., Lisoni J.G., Goux L., Wouters D.J., Goguenheim D., Roussel P., Ortega L.- Oxidation kinetics of Ni metallic film: formation of NiO-based resistive switching structures.- Thin Solid Films, vol. 516, n° 12, p. 4083-4092, 2008 - http://dx.doi.org/10.1016/j.tsf.2007.09.050
Craco L., Lombardo P., Hayn R., Japaridze G. I., Müller-Hartmann E.- Electronic phase transitions in the half-filled ionic Hubbard model.- Physical Review B, vol. 78, n° 7, p. 075121, 2008
Cubillo, J. R., Gaubert, J., Bourdel, S., Barthélemy, H.- RF Low-Pass Design Guiding Rules to Improve PCB to Die Transition Applied to Different Types of Low-Cost Packages.- IEEE Transactions on Advanced Packaging, vol. 31, n° 3, pp. 527 – 535, 2008 - http://dx.doi.org/10.1109/TADVP.2008.924229
De Crescenzi M., Scarselli M., Sgarlata A., Masala S., Castrucci P., Gatto E., Venanzi M., Karmous A., Ronda A., Szkutnik P.D., Berbezier I.- Photocurrent generation from Ge nanodots in the near UV and visible region.- Superlattices and Microstructures, acceptée, 2009 - vol. 44, n° 4, p. 331-336, 2008
De Padova P., Ayoub JP, Berbezier I., Perfetti P., Quarissima C., Testa A.M., Fiorani D., Olivieri B., Mariot J.M., Taleb-Ibrahimi A., Richter M.C., Heckmann O., Hricovin K.- Mn0.06Ge0.94 diluted magnetic semiconductor epitaxially grown on Ge(001): Influence of Mn5Ge3 nanoscopic clusters on the electronic and magnetic properties - Physical Review B, vol. 77, p. 045203, 2008
Degoulange J., Perichaud I., Trassy C., Martinuzzi S.- Multicrystalline silicon wafers prepared from upgraded metallurgical feedstock.- Solar Energy Materials and Solar Cells, vol. 92, p. 1269-1273, 2008
Deleruyelle D., Micolau G.- On the electrostatic behavior of floating nanoconductors .- Solid-State Electronics, vol. 52, n° 1, p. 17-24, 2008 - http://dx.doi.org/10.1016/j.sse.2007.07.008
Dienel T., Loppacher C., Mannsfeld S.C.B.,Forker R., Fritz T.- Growth-mode-induced narrowing of optical spectra of an organic adlayer.- Advanced Materials, vol. 20, p. 959, 2008
Dobaczewski L., S. Bernardini, P. Kruszewski, P.K. Hurley, V. P. Markevich., I.D. Hawkins, A.R. Peaker.- Energy state distributions of the Pb centers at the (100), (110), and (111) Si/SiO2 RDI investigated by Laplace deep level transient spectroscopy.- Applied Physics Letters, vol. 92, n° 24, p. 242104-3, 2008
Duché, D., Escoubas, L. Simon, J.J., Torchio, P., Vervisch, W., Flory, F.- Slow Bloch-modes for enhancing the absorption of light in thin-films for photovoltaic cells.- Applied Physics Letters, vol. 92, p. 193310-1-193310-3, 2008 also selected for the Virtual Journal of Nanoscale Science & Technology, n° 2, 2008
Eberlein M., Escoubas S., Gailhanou M., Thomas O., Rohr P., Coppard R.- Influence of crystallographic orientation on local strains in silicon: a combined high-resolution X-ray diffraction and finite element modeling investigation.- Thin Solid Films, vol.516, p. 8042–8048, 2008 - http://dx.doi.org/10.1016/j.tsf.2008.04.061
Efthymiou E., S. Bernardini, J.F. Zhang, S.N. Volkos, B. Hamilton and A.R. Peaker.- Reliability degradation of thin HfO2/SiO2 gate stacks by remote RF hydrogen and deuterium plasma treatment.- Thin Solid Films, vol. 517, n° 1, 3, p. 207-208, 2008
Egels M., J. Gaubert, P. Pannier, S. Bourdel.- A 52 GHz, 8.5 dB traveling wave amplifier in 0.13 µm standard CMOS process.- IEEE Trans. on Microwaves Theory and Techniques, vol. 56, 5 Part 2, p. 1226 - 1233, 2008 - http://dx.doi.org/10.1109/TMTT.2008.920169
El Hdiy A., Gacem K., Troyon M., Ronda A., Bassani F., Berbezier I.- Germanium nanocrystal density and size effects on carrier storage and emission.- Journal of Applied Physics, vol. 104, p. 063716, 2008
Escoubas S., Brillet H., Mesarotti T., Raymond G., Thomas O., Morin P.- Local strains induced in silicon channel by a periodic array of nitride capped poly lines investigated by High-Resolution X-Ray Diffraction.- Materials Science and Engineering B, vol. 154-155, p. 129-132, 2008 - http://dx.doi.org/10.1016/j.mseb.2008.08.016
Fu C.-C., Meslin E., Barbu A., Willaime F., Oison V.- Effect of C vacancy migration in a-iron.- Solid State Phenomena, vol. 139, p. 157, 2008
Gagou Y., Frémy M-A., Badèche T., Mezzane D., Choukri H. and Saint-Grégoire P.- Ionic conduction properties in PbK2 LiNb5 O15.- Ferroelectrics, vol 371, p 1-4, 2008
Gheribi A., Rogez J., Mathieu J.C.- Formulation of the integral Gibbs energy of crystalline elements versus temperature and mechanical stress.- Calphad Computer Coupling of Phase Diagrams and Thermochemistry, vol. 32, 315-319, 2008
Ghorayeb A. M., Costes M., Goiran M., Broto J.-M., Schäfer S., Hayn R., Richter J., Millet P., Stepanov A.- High-field magnetization and electron spin resonance in the spin-gap system Na1.286 V2O5.- Physical Review B, vol. 77, p. 224434, 2008 - http://dx.doi.org/10.1103/PhysRevB.77.224434
Giot D., Roche P., Gasiot G., Autran J.L, Harboe-Sørensen R.- Heavy ion testing and 3D simulations of multiple cell upset in 65nm standard SRAMs.- IEEE Transactions on Nuclear Science, vol. 55, n° 4, p. 2048-2054, 2008 - http://dx.doi.org/10.1109/TNS.2008.916063
Giovanelli L., Amsalem P., Themlin J. M., Ksari Y., Abel M., Nony L., Koudia M., Bondino F., Magnano E., Mossoyan-Deneux M., Porte L. - Evolution of the electronic structure at the interface between a thin film of halogenated phthalocyanine and the Ag(111) surface.- Journal of Physical Chemistry C, vol. 112, p. 8654, 2008
Gomri S., J.L. Seguin, J. Guerin, K. Aguir.- A mobility and free carriers density fluctuations-based model of adsorption-desorption noise in gas sensor.- Journal of Physics D : Applied Physics, vol. 41, p. 065501, 2008
Guérin J., M. Bendahan, K. Aguir.- A dynamic response model for the WO3-based ozone sensors.- Sensors and Actuators B: Chemical, vol. 128, n° 2, p. 462-467, 2008
Halbwax M., Sarnet T., Delaporte Ph., Sentis M., Etienne H., Torregrosa F., Vervisch V., Perichaud I., Martinuzzi S.- Micro and nano-structuration of silicon by femtosecond laser : Application to silicon photovoltaic cells fabrication.- Thin Solid Films, vol. 516, p. 6791-6795, 2008
Haselwandter C.A., Raymond L., Verga A., Vvedensky D.- Occam's razor on surfaces : renormalization of microscopic processes.- Journal of Physics : Condensed Matter, vol 20, p. 304203, 2008
Hassam S., Boa D., Fouque Y., Kotchi K.P., Rogez J.- Thermodynamic investigation of Pb-Sb system.- Journal of Alloys and Compounds, vol. 476, p. 74, 2009 - http://dx.doi.org/10.1016/j.jallcom.2008.09.002
Hasselbach K., C. Ladam, V.O. Dolocan, D. Hykel, T. Crozes, K. Schuster, Mailly D.- High resolution magnetic imaging : MicroSQUID Force Microscopy.- Journal of Physics : Conference Series, vol. 97, p. 012330, 2008
Haubner K., Jaehne E., Adler H.-J. P., Koehler D., Loppacher C., Eng L.M., J. Grenzer, Herasimovich A., Scheinert S.- Assembly, structure, and performance of an ultra-thin film organic field-effect transistor (OFET) based on substituted oligothiophenes.- Physica Status Solidi (a), - vol. 205, p. 430, 2008
Hoummada K., Mangelinck D., Perrin C., Carron V., et Holliger P.- Measurement of arsenic redistribution at nickel silicide/silicon interface by secondary ion mass spectrometry: artefact and optimized analysis conditions.- Journal of Applied Physics, vol 104, 2, p. 024313, 2008 - http://dx.doi.org/10.1063/1.2959643
Hoummada K., Portavoce A., Perrin-Pellegrino C., Mangelinck D., et Bergman C.- Differential scanning calorimetry measurements of kinetic factors involved in salicide process.- Applied Physics Letters, vol 92, p. 133109, 2008 - http://dx.doi.org/10.1063/1.2905293
Hull R., Floro J., Graham J., Gray J., Gherasimova M., Portavoce A., Ross F.M.- Synthesis and functionalization of epitaxial quantum dot nanostructures for nanoelectronic architectures.- Materials Science in Semiconductor Processing, Vol. 11, p. 160, 2008 - http://dx.doi.org/10.1016/j.mssp.2008.10.011
Imbert B., M. Gregoire, S. Zoll, R. Beneyton, S. Del-Medico, C. Trouiller, O. Thomas.- Nitrogen impurity effects on nickel silicide formation at low temperatures – New “nitrogen co-plasma” approach.- Microelectronic Engineering, vol. 85, p. 2005-2008, 2008 - http://dx.doi.org/10.1016/j.mee.2008.04.021
Imbert B., Zoll S., Garnier P., Pernet B., Galpin D., Beneyton R., Juhel M., Mur P., Carron V., Thomas O.- Self-aligned nickel-platinum silicide oxidation.- Materials Science and Engineering B, vol. 154-155, p.155-158, 2008 - http://dx.doi.org/10.1016/j.mseb.2008.08.010
Jennane A., Sassi O., Bernardini J., Moya G.- Point defects characterization in Ni2Si as deduced from isothermal magnetic susceptibility measurements.- Defect and Diffusion forum, vol.273-276, p.312-317, 2008 - http://dx.doi.org/10.4028/www.scientific.net/DDF.273-276.312
Kammouni A., Saikaly W., Dumont M., Marteau C., Bano X., Charaï A. - A methodology suitable for TEM local measurements of carbon concentration in retained austenite.- Materials Characterization, - vol. 59, no 9, p. 1307-1311, 2008 - http://dx.doi.org/10.1016/j.matchar.2007.11.003
Kaouache B., S. Labat, O. Thomas, S. Maitrejean, V. Carrreau.- Texture and strain in narrow copper damascene interconnect lines: an x-ray diffraction analysis.- Microelectronic Engineering, vol. 85, p. 2175-2178, 2008 - http://dx.doi.org/10.1016/j.mee.2008.06.017
Kazan M., Ottaviani L., Moussaed E., Nader R., Masri P.- Effect of introducing gettering sites and subsequent Au diffusion on the thermal conductivity and the free carrier concentration in n-type 4H-SiC.- Journal of Applied Physics, vol. 103, n° 053707, p. 1-6, 2008
Khachane M., Nowakowski P., Villain S., Gavarri J-R., Muller Ch., Luk’yanchuk I., Elaatmani M., Outzourhite A., Zegzouti A.- Catalytic studies of RuO2 films deposited on ferroelectrics films by spin coating process.- Ferroelectrics, vol. 371, p. 34-42, 2008 - http://dx.doi.org/10.1080/00150190802385069
Klappenberger F., M. E. Cañas-Ventura, S. Clair, S. Pons, U. Schlickum, Z.-R. Qu, T. Strunkus, A. Comisso, C. Wöll, H. Brune, K. Kern, A. DeVita, M. Ruben, J. V. Barth.- Does the surface matter? Hydrogen-bonded chain formation of an oxalic amide derivative in a two-and three-dimensional environment.- ChemPhysChem, vol. 9, p. 2522, 2008
Kopia A., K. Kowalski, Ch. Leroux, M. Chmielowska.- A microscopic and spectroscopic investigations in CuOx-CeO2-delta/Si thin films.- Archives of Metallurgy and Materials, vol 53, p57-60, 2008
Kopia A., K. Kowalski, M.Chmielowska, Ch. Leroux.- Electron microscopy and spectroscopy investigations of CuOx-CeO2-/Si thin films.- Surface Science, vol. 602, p 1313-1321, 2008
Lasagni F., Mingler B., Dumont M., Degischer H.P.- Precipitation kinetics of Si in Aluminium alloys.- Materials Science and Engineering A, vol. 480, no 1-2, p. 383-391, 2008 - http://dx.doi.org/10.1016/j.msea.2007.07.008
Le Donne A., Binetti S., Isella G., Pichaud B., Texier M., Acciarri M., Pizzini S.- Advances in structural characterization of thin film nanocrystalline silicon for photovoltaic applications.- Solid State Phenomena, vol. 131-133, p. 33, 2008
Le Donne A., Binetti S., Isella G., Pichaud B., Texier M., Acciarri M., Pizzini S.- Structural characterization of nc-Si films grown by low-energy PECVD on different substrates.- Applied Surface Science, vol. 254, p. 2804, 2008
Le Roux C., Lopez L., Firiti A., Ogier J.L., Lalande F., Laffont R., Micolau G.- An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention test.- Solid-State Electronics, vol. 52, n° 10, p. 1550-1554, 2008 - http://dx.doi.org/10.1016/j.sse.2008.06.011
Lesea A., Castellani-Coulié K., Waysand G., Le Mauff J., Sudre C.- Qualification methodology of sub-micron ICs in the Low Noise Underground Laboratory of Rustrel.- IEEE Transactions on Nuclear Science, vol. 55, n° 4, p. 2148-2153, 2008 - http://dx.doi.org/10.1109/TNS.2008.2000863
Liu Q.S., Zhou J.Y., Wang A., Polezhaev V.I., Fedyushkin A., Nguyen-Thi H., Billia B.- Thermovibrational instability of Rayleigh-Marangoni-Benard convection in two-layer fluid systems.- Advanced Space Research, vol. 41, p. 2131-2136, 2008
Lombardo P., Guisiano J.C., Hayn R.- Full diagonal disorder in a strongly correlated system.- Physica B : Condensed Matter, vol. 403, p. 3485, 2008
Loussier X., Munteanu D., Autran J.L., Tintori O.- Impact of geometrical and electrical parameters on speed performances in ultimate double-gate metal-oxide-semiconductor field-effect transistor.- Japanese Journal of Applied Physics, vol. 47, n° 5, p. 3390-3395, 2008 - http://dx.doi.org/10.1143/JJAP.47.3390
Makoudi Y., E. Duverger, M. Arab, F. Palmino, F. Cherioux, G. Rapenne. - Self alignment of molecular chains on pre-structured Sm/Si (111) interface.- ChemPhysChem, vol. 9, p. 1437, 2008
Makoudi Y., F. Palmino, E. Duverger, M. Arab, F. Cherioux, Ch. Ramseyer, B. Therrien, M. J-L. Tschan and G. Suss-Fink.- High resolution STM images and molecular modelling of the adsorption of 2,4,6-Tri(2’thienyl)-1,3,5-trizaine on Si-B interface at room temperature.- Physical Review Letters, vol. 100, p. 076405, 2008
Makoudi Y., M. Arab, F. Palmino, E. Duverger, F. Cherioux.- Complete supramolecular assembled adlayer on silicon surface at room temperature.- Journal of the American Chemical Society, vol. 130, p. 6670, 2008
Makoudi Y., M. El Garah, F. Palmino, E. Duverger, M. Arab and F. Cherioux.- Adsorption of an organic zwitterion on a Si(111)-7x7 surface at room temperature.- Surface Science, vol. 602, p. 2719, 2008
Malkin B.Z., Vanyunin M.V., Barbara B., Bertaina S.- Relaxation rates of magnetization in LiYF4:Ho3+ crystal.- Journal of Alloys and Compounds, vol. 451, n° 1-2, p. 473-476, 2008 - http://dx.doi.org/10.1016/j.jallcom.2007.04.193
Mangelinck D., Hoummada K.- Effect of stress on the transformation of Ni2Si into NiSi.- Applied Physics Letters, vol. 92, 254101, 2008 - http://dx.doi.org/10.1063/1.2949751
Mangelinck D., K. Hoummada, O. Cojocaru-Mirédin, E. Cadel, C. Perrin-Pellegrino, D. Blavette.- Atom probe tomography of Ni silicides : First stages of reaction and redistribution of Pt.- Microelectronic Engineering, vol. 85, n° 10, p. 1995-1999, 2008 - http://dx.doi.org/10.1016/j.mee.2008.04.048
Mangelinck-Noël N., Duffar T.- Modelling of the transition from a planar faceted front to equiaxed growth : application to photovoltaic polycrystalline silicon.- Journal of Crystal Growth, vol. 311, n° 1, p. 20-25, 2008
Marfaing J., Rochette P., Pellerey J., Chaurand P., Suavet C., Folco L.- Study of a set of micrometeorites from Antarctica using magnetic and ESR methods coupled with micro-XRF.- Journal of Magnetism and Magnetic Materials, vol. 320, p.1687, 2008 - http://dx.doi.org/10.1016/j.jmmm.2008.01.037
Marine W., Bulgakova N.M., Patrone L., Ozerov I.- Insight into electronic mechanisms of nanosecond-laser ablation of silicon.- Journal of Applied Physics, vol. 103, p. 094902, 2008
Markevich V.P., Bernardini S., Hawkins I.D., Peaker A.R., Kolkovsky Vl., Nylandsted Larsen A., Dobaczewski L.- Electrically active defects induced by hydrogen and helium implantations in Ge.- Materials Science in Semiconductor Processing, vol. 11, 5-6, p. 354-359, 2008 - http://dx.doi.org/10.1016/j.mssp.2008.10.006
Martinez A., Barker J.R., Bescond M., Brown A.R., Asenov A.- Performance variability in wrap-round gate silicon nano-transistors: a 3D self-consistent NEGF study of ballistic flows for atomistically-resolved source and drain.- Journal of Physics – Conference Series, vol. 109, p.012026, 2008
Martinez A., Barker J.R., Svizhenko A., Anantram A., Bescond M., Asenov A.- Ballistic quantum simulators for studying variability in nanotransistors.- Journal of Computational and Theoretical Nanoscience, vol. 5, p. 2289-2310, 2008 (review paper)
Martinez A., Bescond M., Brouwn A.R., Barker J.R., Asenov A.- A full 3D non-equilibrium green functions study of a stray charge in a nanowire MOS transistor.- Journal of Computational Electronics, vol. 7, p. 359, 2008 - http://dx.doi.org/10.1007/s10825-008-0240-4
Martinie S., Le Carval G., Munteanu D., Autran J.L.- New unified analytical model of backscattering coefficient from low to high field conditions in quasi-ballistic transport .- IEEE Electron Device Letters, vol. 29, N°12, p. 1392-1394, 2008 - http://dx.doi.org/10.1109/LED.2008.2007305
Martinie S., Le Carval G., Munteanu D., Soliveres S., Autran J.L.- Impact of ballistic and quasi-ballistic transport on performances of double-gate MOSFET-based circuits.- IEEE Transactions on Electron Devices, vol. 55, no. 9, p. 2443-2453, 2008 - http://dx.doi.org/10.1109/TED.2008.927656
McFadden S., Sturz L., Jung H., Mangelinck-Noël N., Nguyen-Thi H., Zimmermann G., Billia B., Browne D. J., Voss D., Jarvis D.- Validation of a front-tracking model of the columnar to equiaxed transition using solidification results from the Maxus 7 microgravity platform.- Journal Japan Society Microgravity Application, vol. 25, p. 489-494, 2008
Milde P., Zerweck U., Eng L.M., Abel M., Giovanelli L., Nony L., Mossoyan M., Porte L., Loppacher Ch.- Interface dipole formation of different ZnPcCl8 phases on Ag(111) observed by Kelvin probe force microscopy.- Nanotechnology, - vol. 19, p. 305501, 2008
Minkevich A., T. Baumbach, M. Gailhanou, O. Thomas.- Applicability of an iterative inversion algorithm to the diffraction pattern from inhomogeneously strained crystals.- Physical Review B, vol. 78, p. 174110, 2008 - http://dx.doi.org/10.1103/PhysRevB.78.174110
Monestier F., Simon J.J, Torchio Ph., Escoubas L., Ratier B.,Hojeij W.,Lucas B.,Moliton A.,Cathelinaud M., Defranoux C.- Optical modeling of organic solar cells based on CuPc and C60.- Applied Optics, vol. 47, n° 13, p. C251-C256, 2008
Moreau M., Munteanu D. and Autran J.L.- Simulation analysis of quantum confinement and short-channel effects in independent double-gate metal-oxide-semiconductor field-effect transistors.- Japanese Journal of Applied Physics, vol. 47, no. 9, p. 7013-7018, 2008 - http://dx.doi.org/10.1143/JJAP.47.7013
Munteanu D. and Autran J.L.- Modeling and simulation of single-event effects in digital devices and Ics.- IEEE Transactions on Nuclear Science, vol. 55, no. 4, p. 1854-1878, 2008 - http://dx.doi.org/10.1109/TNS.2008.2000957
Nehari, K., Lannoo, M., Michelini, F., Cavassilas, N., Bescond, M., Autran, J. L.- Improved effective mass theory for silicon nanostructures.- Applied Physics Letters, vol. 93, no 9, p. 092103, 2008 - http://dx.doi.org/10.1063/1.2978196
Nguyen Thi H., Reinhart G., Buffet A., Schenk T., Mangelinck N., Jung H., Bergeon N., Billia B., Härtwig H., Baruchel J.- In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography.- Journal of Crystal Growth, vol. 310, p. 2906-2914, 2008
Nikiforov M. P., Zerweck U., Milde P., Loppacher Ch., Park T-H., Uyeda H.T., Therien M.J., Eng L., Bonnell D.- The effect of molecular orientation on the potential of porphyrin-metal contacts.- Nanoletters, vol. 8, p. 110, 2008
Noheda B., Muller Ch.- Guest Editorial: Phase transitions in functional thin films.- Phase Transitions, vol. 81, n° 7-8, p. 603-606, 2008
Nowakowski P., Dallas J.P., Villain S., A. Kopia A. and Gavarri J.R.- Structure, microstructure, and size dependent catalytic properties of nanostructured ruthenium dioxide.- Journal of Solid State Chemistry, vol. 181, no 5, 2008, p. 1005-1016, 2008
Nowakowski P., Villain S., Kopia A., Suliga I. and Gavarri J.R.- Catalytic conversion of air-methane flow by nanostructured ruthenium dioxide: FTIR spectroscopy and modeling.- Applied Surface Science, vol. 254, n° 18, p. 5675-5682, 2008
Pareige P., Cadel E., Sauvage X., Deconihout B., Blavette D., Mangelinck D. - Atomic resolution analyses of nano-structured materials by atom probe tomography.- International Journal of Nanotechnology, vol. 5, p. 592-608, 2008
Pascale A., Berbezier I., Ronda A., Kelires P.- Self-assembly and ordering mechanisms of Ge islands on prepatterned Si(001).- Physical Review B, vol. 77, p. 075311, 2008
Pasternak S, Aquilanti G, Pascarelli S, Poloni R, Canny B, Coulet M V, Zhang L.- A diamond anvil cell with resistive heating for high pressure and high temperature x ray diffraction and absorption studies.- Review of Scientific Instruments, vol. 79, p. 8510315, 2008 - http://dx.doi.org/10.1063/1.2968199
Pelletier B., Juhel M., Trouiller C., Beucher D., Autran J.L., Morin P.- Boron out-diffusion mechanism in oxide and nitride CMOS sidewall spacer: Impact of the materials properties.- Materials Science and Engineering B – Advanced Functional Solid-State Materials, vol. 154, p. 252-255, 2008 - http://dx.doi.org/10.1016/j.mseb.2008.09.025
Perez M., Dumont M., Acevedo-Reyes D.- Implementation of classical nucleation and growth theories for precipitation.- Acta Materialia, vol. 56, no 9, p. 2119-2132, 2008 - http://dx.doi.org/10.1016/j.actamat.2007.12.050
Perrin C., Mangelinck D., Nemouchi F., Labar J., Lavoie C., Bergman C., et Gas P.- Nickel silicides and germanides: Phases formation, kinetics and thermal expansion.- Materials Science and Engineering : B, vol 154-155, p. 163-167, 2008 - http://dx.doi.org/10.1016/j.mseb.2008.09.042
Pic D., Ogier J.L., Goguenheim D.- Assessment of temperature and voltage accelerating factors for 2.3–3.2 nm SiO2 thin oxides stressed to hard breakdown.- Microelectronics Reliability, vol. 48, n° 3, p. 335-341, 2008 - http://dx.doi.org/10.1016/j.microrel.2007.08.006
Pic D., Regnier A., Pean V., Ogier J.L., Goguenheim D.- Dynamic stress method for accurate NVM oxide robustness evaluation for automotive applications.- Microelectronics Reliability, vol. 48 (8-9), p. 1318-1321, 2008 - http://dx.doi.org/10.1016/j.microrel.2008.07.050
Portavoce A., Chai G., Chow L., Bernardini J.- Nanometric size effect on Ge diffusion in polycrystalline Si.- Journal of Applied Physics, vol. 104, p. 104910, 2008 - http://dx.doi.org/10.1063/1.3010297
Portavoce A., Hull R., Reuter .C., Copel M., Ross F.M.- Control of homoepitaxial Si nanostructures by locally modified surface reactivity.- Applied Physics Letters, vol. 92, p. 053106-, 2008 - http://dx.doi.org/10.1063/1.2841673
Pradeilles N., Record M.C., Granier D., Marin-Ayral R.M.- Synthesis of beta-SiAlON: a combined method using sol-gel and SHS processes.- Ceramics International, vol. 34, n°5, p. 1189-1194, 2008 - http://dx.doi.org/10.1016/j.ceramint.2007.02.017
Pradeilles N., Record M.C., Marin-Ayral R.M., Linde A.V., Studenikin I.A., Grachev V.V.- Influence of thermal conditions on combustion synthesis of Si2N2O phase.- Materials Research Bulletin, vol. 43, p. 463-472, 2008 - http://dx.doi.org/10.1016/j.materresbull.2007.02.032
Radtke G.- Momentum-resolved energy loss near edge structure in SrCu2(BO3)2.- Ultramicroscopy, vol. 108, no 9, p.893-900, 2008
Radtke G., Saúl A., Dabkowska H.A., Gaulin B.D., Botton G.A.- Electronic structure of the quasi-two-dimensional spin-gap system SrCu2(BO3)2 : Experiment and theory.- Physical Review B, vol. 77, no 12, p.125130 (1-5), 2008
Raguet J.R., Bidal V., Regnier A., Mirabel J.M., Laffont R., Bouchakour R.- New EEPROM concept for single bit operation.- Solid-State Electronics, vol. 52, n° 10, p. 1525-1529, 2008 - http://dx.doi.org/10.1016/j.sse.2008.06.027
Reinhart G., Buffet A., Nguyen-Thi H., Billia B., Jung H., Mangelinck-Noel N., Bergeon N., Schenk T., Härtwig J., Baruchel J.- In situ and real-time analysis of the formation of strains and microstructure defects during solidification of Al-3.5 Wt Pct Ni alloys.- Metallurgical Materials Transactions A, vol. 39, p. 865-874, 2008
Richard M.-I., Chen G., Schülli T.U., Renaud G., Bauer G.- Coalescence of domes and superdomes at a low growth rate or during annealing: towards the formation of flat-top superdomes.- Surface Science, vol. 602, 2157, 2008 - http://dx.doi.org/10.1016/j.susc.2008.04.024
Robert-Inacio F.- Shape studies in 2D and 3D on molecular islands of carbon chains self-assembled on silicon in nanoelectronics.- European Physical Journal: Applied Physics, vol. 41, N°1, pp 53-68, Janvier 2008 - http://dx.doi.org/10.1051/epjap:2007171
Rogdakis K., Lee S.-Y., Bescond M., Lee S.-K., Bano E., Zekentes K.- 3C-Silicon Carbide nanowire FET: An experimental and theoretical approach.- IEEE Transactions on Electron Devices, vol. 55, n° 8, p.1970-1976, 2008 - http://dx.doi.org/10.1109/TED.2008.926667
Rowell N.L., Lockwood D.J., Karmous A., Szkutnik P.D., Berbezier I., Ronda A.- Photoluminescence of Ge nanocrystals self-assembled on SiO2.- Superlattices and Microstructures, vol. 44, n° 4, p. 305-314, 2008
Saitzek S., BlachJ.F., Villain S., and Gavarri J.R.- Nanostructured ceria: a comparative study from X-ray diffraction, Raman spectroscopy and BET specific surface measurements.- Physica Status Solidi (a), 1– 6, 2008 - http://dx.doi.org/10.1002/pssa.200723419
Saitzek S., F. Guinneton, G. Guirleo, L. Sauques, K. Aguir, J.R. Gavarri.- VO2 thin films deposited on silicon substrates from V2O5 target: limits in optical switching properties and modeling.- Thin Solid Films, vol. 516, n° 6, p. 891-897, 2008
Sassi M., Oison V. Debierre J. M.- First principle study of a bimolecular thin film on Ag(111) surface.- Surface Science, vol. 602, n° 17, p. 2856-2862, 2008
Shao Y., Hughes R.A., Dabkowski A., Radtke G., Gong W.H., Preston J.S., Botton GA.- Structural and transport properties of epitaxial niobium-doped BaTiO3 films.- Applied Physics Letters, vol. 93, no 19, p.192114 (1-3), 2008
Shin H.-J., S. Clair, Y. Kim, M. Kawai.- Electronic structure of single-walled carbon nanotubes on ultrathin insulating films.- Applied Physics Letters, vol. 93, p. 233104, 2008
Shuleshova O., Holland-Moritz D., Löser W., Reinhart G., Iles G.N., Büchner B.- Metastable formation of decagonal quasicrystals during solidification of undercooled Al-Ni melts: in situ observations by synchrotron radiation.- Europhysics Letters, p. 36002, 2008
Steimer C, Coulet M V, Welnic W, Dieker H, Detemple R, Bichara C, Beuneu B, Gaspard J P, Wuttig M.- Characteristic ordering in liquid phase change materials.- Advanced Materials, vol. 20, p. 1–6, 2008 - http://dx.doi.org/10.1002/adma.200700016
Szkutnik P.D., Karmous A., Bassani F., Ronda A., Berbezier I., Gacem K., El Hdiy A., Troyon M.- Ge nanocrystals formation on SiO2 by dewetting : application to memory.- The European Physical Journal : Applied Physics, vol. 41 , p.103-106, 2008
Tay L.-L., Rowell N.L., Ayoub J.-P., Berbezier I., Morresi L., Pinto N.- Raman measurements of Ge1−xMnx epilayers.- Superlattices and Microstructures, acceptée, 2009 - vol. 44, n° 4, p. 315-322, 2008
Thibault-Penisson J., M. Hÿtch.- HREM study of the strain field induced by the entrance of a matrix dislocation within a coherent twin GB in Ge - Solid State Phenomena, vol 131-133 p. 437-442, 2008
Thomas O.- Diffraction analysis of elastic strains in micro and nano-structures.- Zeitschrift für Kristallographie, vol. 223, p. 569-574, 2008 - http://dx.doi.org/10.1524/zkri.2008.1215
Uppal H.J., Bernardini S., Efthymiou E., Volkos S.N., Dimoulas A., Markevich V., Hamilton B., Peaker A.R.- Nanoscale electrical characterization of ultrathin high-k dielectric MOS stacks : A conducting AFM study.- Materials Science in Semiconductor Processing, vol. 11, 5-6, p. 250-253, 2008 - http://dx.doi.org/10.1016/j.mssp.2008.10.006
Vartanyants I. A., Zozulya A. V., Mundboth K., Yefanov O. M., Richard M.-I., Wintersberger E., Stangl J., Diaz A., Mocuta C., Metzger T.H., Bauer G., Boeck T., and Schmidtbauer M.- Crystal truncation planes revealed by three-dimensional reconstruction of reciprocal space.- Physical Review B, vol. 77, p. 115317, 2008 - http://dx.doi.org/10.1103/PhysRevB.77.115317
Vervisch V., Etienne H., Torregrosa F., Ottaviani L., Pasquinelli M., Sarnet T., Delaporte P.- Realization of ultra-shallow junctions by plasma immersion ion implantation and laser annealing.- Journal of Vacuum Science & Technology, vol. B 26, p. 286, 2008
Zarbout K., Si Ahmed A., Moya G., Bernardini J., Goeuriot D., Kallel A.- Stability of trapped charges in sapphires and alumina ceramics: evaluation by secondary electron emission.- Journal of Applied Physics, vol. 103, n° 6, p.054107/1-054107/7, 2008 - http://dx.doi.org/10.1063/1.2891792
Zhou B.H., Jung H., Mangelinck-Noël N., Nguyen Thi H., Billia B., Liu Q.S., Lan C.W.- Comparative study of the influence of natural convection on directional solidification of Al - 3.5wt% Ni and Al – 7wt% Si alloys.- Advanced. Space Research, vol. 41, p. 2112-2117, 2008
Zwaneveld N., Pawlak R., Abel M., Catalin D., Gigmes D., BertinD., Porte L.- Organized formation of 2D extended covalent organic frameworks at surfaces.- Journal of the American Chemical Society, vol.130, p. 6678, 2008
Ahoussou A.P., Rogez J., Yapi A., Mikaelian G., Kone A.- Contribution to thermochemical studies of E3811-(1-x)SiO2]-0.2Na2O glasses.- Chinesese Chemical Letters, vol. 20, 245-249, 2009
Amara H, Roussel JM, Bichara C, Gaspard JP, Ducastelle F.- Tight-binding potential for atomistic simulations of carbon interacting with transition metals : Application to the Ni-C system.- Physical Review B, vol. 79, p. 014109, 2009 - http://dx.doi.org/10.1103/PhysRevB.79.014109
Amsalem P., Giovanelli L., Themlin J.-M., Angot T.- Electronic and vibrational properties at the ZnPc/Ag(110) interface.- Physical Review B, vol. 79, n°23, p. 235426, 2009 - http://dx.doi.org/10.1103/PhysRevB.79.235426
Aqua J.N., Fisher M.E.- Criticality in multicomponent spherical models: Results and cautions.- Physical Review B, vol. 79, n° 1, p. 011118, 2009 - http://dx.doi.org/10.1103/PhysRevE.79.011118
Autran J.L., Roche P., Sauze S., Gasiot G., Munteanu D., Loaiza P., Zampaolo M., Borel J.- Altitude and Underground Real-Time SER Characterization of CMOS 65nm SRAM.- IEEE Transactions on Nuclear Science, Vol. 56, 2009, Vol. 56, N°4, p. 2258-2266.- http://dx.doi.org/10.1109/TNS.2009.2012426
Aziza H., Pérez A., Bergeret E.- Analog Blocks Design Automation.- WSEAS Transactions on Circuits and Systems, vol. 8, n° 8, p.686-695, 2009 - ISSN: 1109-2734
Bakiz B., Guinneton F., Arab M., Villain S., Benlhachemi A., Gavarri J.R.- Temperature dependent electrical properties and catalytic activities of La2O3 – CO2 – H2O phase system.- Advances in Materials Science and Engineering, Volume 2009, Article ID 612130, 4 pages, 2009 - doi:10.1155/2009/502437
Balogh Z., Erdélyi Z., Beke D.L., Portavoce A., Girardeaux C., Bernardini J., Rolland A.- Silver grain boundary diffusion in Pd.- Applied Surface Science, vol. 255, p. 4844, 2009 - http://dx.doi.org/10.1016/j.apsusc.2008.12.010
Balogh Z., Erdélyi Z., Beke D.L., Portavoce A., Girardeaux C., Bernardini J., Rolland A.- Determination of Grain Boundary Diffusion Coefficients in C-regime by Hwang-Balluffi method: Silver Diffusion in Pd.- Defect and Diffusion Forum, vol. 289-292, p. 763, 2009
Barral V., Poiroux T., Barraud S., Bonno O., Andrieu F., Faynot O., Munteanu D., Autran J.L. and Deleonibus S.- Evidences on the physical origin of the unexpected transport degradation in ultimate n-FDSOI devices.- IEEE Transactions on Nanotechnology, vol. 8, n° 2, p. 167-173, 2009 - http://dx.doi.org/10.1109/TNANO.2008.2010128
Barral V., Poiroux T., Bournel A., Munteanu D., Autran J.L. and Deleonibus S.- Experimental investigation on the quasi-ballistic transport: part I- Determination of a new backscattering coefficient extraction methodology.- IEEE Transactions on Electron Devices, vol. 56, n° 3, p. 408-419, 2009 - http://dx.doi.org/10.1109/TED.2008.2011681
Barral V., Poiroux T., Munteanu D., Autran J.L. and Deleonibus S.- Experimental investigation on the quasi-ballistic transport: Part II- Backscattering coefficient extraction and link with the mobility.- IEEE Transactions on Electron Devices, vol. 56, n° 3, p. 420-430, 2009 - http://dx.doi.org/10.1109/TED.2008.2011682
Benard C., Math G., Fornara P., Ogier J.L., Goguenheim D.- Influence of various process steps on the reliability of PMOSFETs submitted to Negative Bias Temperature Instabilities.- Microelectronics Reliability, 2009, Vol. 49(9-11), p. 1008–1012.- http://dx.doi.org/10.1016/j.microrel.2009.06.022
Berbezier I., Ronda A.- SiGe Nanostructures.- Surface Science Reports, vol. 64, n° 2, p. 47-98, 2009
Berche A., Marinelli F., Mikaelian G., Rogez J., Record M.C.- Enthalpies of formation of the La-Zn compounds between 298 and 910K. Experimental and theoretical investigations.- Journal of Alloys and Compounds, - vol. 475, 79, 2009 - http://dx.doi.org/10.1016/j.jallcom.2008.07.060
Berche A., Rado C., Rapaud O., Gueneau C., Rogez J.- Thermodynamic study of the U-Si system.- Journal of Nuclear Materials, 389, 1, 101-107, 2009
Berche A., Record M.C., Rogez J.- Critical review of the La-Zn system.- The Open Thermodynamics Journal, vol. 3, 7-16, 2009 - http://dx.doi.org/10.2174/1874396X00903010007
Bergeon N., Weiss C., Mangelinck-Noël N, Billia B.- Interferometric method for the analysis of dendrite growth and shape in 3D extended patterns in transparent alloys.- Transactions of the Indian Institute of Metals, 62, 4-5, 455-460, 2009
Bernier N., Brosset C., Bocquet F., Tsitrone E., Saikaly W., Khodja H., Alimov V.K., Gunn J.P.- Localization by TEM and EELS of deuterium trapping sites in CFC exposed to plasma irradiation in Tore Supra.- Journal of Nuclear Materials, vol. 385, n° 3, p. 601, 2009 - http://dx.doi.org/10.1016/j.jnucmat.2009.01.031
Bertaina S., Chen L., Groll N., Van Tol J., Dalal N.S., and Chiorescu I.- Multiphoton coherent manipulation in large-spin qubits.- Physical Review Letters, vol. 102, p. 050501 2009 - http://dx.doi.org/10.1103/PhysRevLett.102.050501
Bertaina S., Shim J.H., Gambarelli S., Malkin B.Z., Barbara B.- On the spin-orbit qubits of rare-earths ions in axially symmetric crystal-fields.- Physical Review Letter, vol. 103, p. 226402, 2009 - http://dx.doi.org/10.1103/PhysRevLett.103.226402
Bescond M. , M. Lannoo, F. Michelini, L. Raymond, and M. G. Pala.- 3d real-space quantum transport simulation of nanowire mos transistors: Influence of the ionized doping impurity.- Microelectronics Journal, vol. 40(4-5), p. 756–758, 2009 - doi: 10.1016/j.mejo.2008.11.009
Bescond M., C. Li, M. Lannoo.- Nanowire transistor modeling: influence of ionized impurity and correlation effects.- Journal of Computational Electronics, vol. 8, 382, 2009, Invited paper - http://dx.doi.org/10.1007/s10825-009-0279-x
Bescond M., Lannoo M., Raymond L., Michelini F.- Theoretical study of ionized impurities in silicon nanowire MOS transistors.- Solid State Phenomena, - vol.156-158, p. 511., 2009 - http://dx.doi.org/10.4028/www.scientific.net/SSP.156-158.511
Bescond M., M. Lannoo, F. Michelini, L. Raymond, M.G. Pala.- 3D real-space quantum transport simulation of nanowire MOS transistors: Influence of the ionized doping impurity.- Microelectronics Journal, vol. 40, 756, 2009 - http://dx.doi.org/10.1016/j.mejo.2008.11.009
Beutier G., Marty A., Livet F., Haznar A., Dudzik E., Stanescu S., Chamard V. and van der Laan G.- Magnetic memory in discrete media observed by coherent soft x-ray resonant scattering.- New Journal of Physics, vol. 11, p. 113026, 2009 - http://dx.doi.org/10.1088/1367-2630/11/11/113026
Bezerra Lopes F. W. , Pereira de Souza C. , Vieira de MoraisA. M. , Dallas J- P. , Gavarri J- R.- Determination of RE2Ce2O7 pyrochlore phases from monazite-allanite ores.- Hydrometallurgy, vol. 97, n° 3-4, p. 167-172, 2009
Bogno A., Nguyen-Thi H., Billia B., Bergeon N., Mangelinck-Noël N., Boller E., Schenk T., Baruchel J.- In situ analysis of dendritic equiaxed microstructure formation in Al-Cu alloys by synchrotron X-ray radiography.- Transactions of the Indian Institute of Metals, 62, 4-5, 427-431, 2009
Bouffaron R., Escoubas L., Brissonneau V., Simon J.J., Berginc G., Torchio Ph., Flory F., Masclet Ph.- Spherically shaped micro-structured antireflective surfaces.- Optics Express, 17, 24, 21590-21597, 2009
Bourja L., Bakiz B., Benlhachemi A., Ezahri M., Valmalette J.C., Villain S., Gavarri J.R.- Structural and Raman vibrational studies of bismuth cerium oxide system CeO2-Bi2O3.- Advances in Materials Science and Engineering, Volume 2009, Article ID 502437, 4 pages, 2009 - doi:10.1155/2009/502437
Buran C., M. G. Pala, M. Bescond, M. Dubois, and M. Mouis.- Three dimensional real space simulation of surface roughness in silicon nanowire FETs.- IEEE Transactions on Electron Devices, vol. 56, 2186, 2009 - http://dx.doi.org/10.1109/TED.2009.2028382
Canino M., Regula G., Lancin M., Xu M., Pichaud B. Ntsoenzok E., Barthe M.F.- Cavities at the Si projected range by high dose and energy Si ion implantation in Si.- Materials Science and Engineering: B, vol 159-160, p. 153-156, 2009
Canino M., Regula G., Xu M., Ntsoenzok E., Pichaud B.- Defect engineering via ion implantation to control B diffusion in Si.- Materials Science and Engineering: B, vol 159-160, p. 338-341, 2009
Cayzac R., Boulc'h F., Bendahan M., Lauque P., Knauth P.- Direct preparation of crystalline CuInS2 thin films by radiofrequency sputtering 1.- Materials Science and Engineering B, vol. 157, p 66-71, 2009 - http://dx.doi.org/10.1016/j.mseb.2008.12.018
Cayzac R., Boulc'h F., Hornebecq V., Djenizian T., Bendahan M., Pasquinelli M., Knauth P.- Optical absorbance enhancement by electrochemical surface roughening of CuInS2 thin films.- Journal of Materials Research, vol. 24, p 3044-3049, 2009 - http://dx.doi.org/10.1557/JMR.2009.0387
Chamard V., Diaz A., Stangl J. et Labat S.- Structural investigation of InAs nanowires with coherent x-rays.- Journal of Strain Analysis, vol. 44, p.533, 2009 - http://dx.doi.org/10.1243/03093247JSA573
Chanier T., Virot F., Hayn R.- Chemical trend of exchange coupling in diluted magnetic II-VI semiconductors : Ab initio Ab initio calculated XANES and XMCD spectra of Fe(II) phthalocyanine.- Physical Review B, vol. 79, p. 205204, 2009 - doi: 10.1103/PhysRevB.79.205204
Claves D., H. Lib, M. Duboisa, Y. Ksari.- An unusual weak bonding mode of fluorine to single-walled carbon nanotubes.- Carbon , vol. 47, n°1, p.2557–2562, 2009 - http://dx.doi.org/10.1016/j.carbon.2009.04.041
Cojocaru-Mirédin O., E. Cadel, B. Deconihout, D. Mangelinck and D. Blavette.- Three-dimensional atom mapping of boron in implanted silicon.- Ultramicroscopy, vol. 109, p. 649-653, 2009 - http://dx.doi.org/10.1016/j.ultramic.2008.09.008
Cojocaru-Mirédin O., E. Cadel, D. Blavette, D. Mangelinck, K. Hoummada, C. Genevois, B. Deconihout.- Atomic-scale redistribution of Pt during reactive diffusion in Ni (5% Pt)–Si contacts.- Ultramicroscopy, vol. 109, n° 7, p. 797-801, 2009 - http://dx.doi.org/10.1016/j.ultramic.2009.02.001
Cojocaru-Mirédin O., E. Cadel, F. Vurpillot, D. Mangelinck, D. Blavette.- 3D Atomic-scale imaging of Boron clusters in implanted silicon.- Scripta Materialia, vol. 60, p. 285, 2009 - http://dx.doi.org/10.1016/j.scriptamat.2008.10.008
Commin L., Dumont M., Masse J.E., Barrallier L.- Friction stir welding of AZ31 Magnesium alloy rolled sheets - Influence of processing parameters.- Acta Materialia, vol. 57, n° 2, p. 326-334, 2009 - http://dx.doi.org/10.1016/j.actamat.2008.09.011
Connétable D., Thomas O.- First principles calculations of the elastic constants of NiSi.- Physical Review B, vol. 79, p. 094101, 2009 - http://dx.doi.org/10.1103/PhysRevB.79.094101
Coratger R., Gourdon A., Benjalal Y., Bouju X., Abel M., Calmettes B., Porte L.- Properties of Penta-tert-Butylcorannulene Molecules Inserted in Phthalocyanine.Networks studied by Low Temperature Scanning Tunnelling Microscopy.- Journal of Physical Chemistry C, vol. 113, p. 21169-76,2009 - http://dx.doi.org/10.1021/jp906905h
Couzinié J.P., Hardouin-Duparc O., Lartigue-Korinek S., Thibault-Penisson J., Décamps B., Priester L.- On atomic structure of an asymmetrical near S=27 grain boundary in copper.- Philosophical Magazine Letters, vol. 89, p. 757-767, 2009
Diaz A., Mocuta C., Stangl J., Mandl B., David C., Vila-Comamala J., Chamard V., Metzger T. et Bauer G.- Coherent diffraction imaging of a single epitaxial InAs nano wire using a focused x-ray beam.- Physical Review B, vol.79, p.125324, 2009 - http://dx.doi.org/10.1103/PhysRevB.79.125324
Dolocan V., Dolocan A., Dolocan V. O.- A hamiltonian for the boson-boson interaction based on elastic coupling through flux lines.- Modern Physics Letters B, vol. 23, n° 10, p.1263-1272, 2009 - http://dx.doi.org/10.1142/S0217984909019491
Dubois S., Martinuzzi S., Enjalbert N.- Is impurity gettering or passivation by hydrogen the key of the improvement of mc-Si cells ?.- Materials Science and Engineering: B, vol. 159-160, p. 239-241, 2009
Duché D., Torchio Ph., Escoubas L., Monestier F., Simon J.J., Flory F., Mathian G.- Improving Light Absorption in Organic Solar Cells by Plasmonic Contribution.- Solar Energy Materials and Solar Cells, vol. 93, p. 1377-1382, 2009
Ducousso T., Guérin R., Debierre J. M.- Phase-field study of free growth in a channel: from thermal to chemical solidification.- European Physical Journal B, vol. 70, p. 363-367, 2009 - doi: 10.1140/epjb/e2009-00241-1
Dumont M, Coulet V, Regula G, Bley F.- Characterization of nanocavities in silicon using small angle X-Ray scattering.- Semiconductor Defect Engineering - Materials, Synthetic Structures and Devices II., Materials Research Society, p. 119-24, 2009
Dumont M., Coulet M-V., Bley F., Regula G.- Characterisation of nanocavities in He+-implanted silicon by transmission electron microscopy and small-angle X-ray scattering.- Materials Science and Engineering B, vol. 162, n° 2, p. 135-142, May 2009 - http://dx.doi.org/10.1016/j.mseb.2009.03.019
Erdélyi Z., Girardeaux C., Beke D.L., Bernardini J., Portavoce A., Katona1 G.L., Balogh Z., Rolland A.- Thin film dissolution into semi-infinite substrates: surprising interface kinetics and dissolution modes.- Defect and Diffusion Forum, vol. 289-292, p. 573, 2009
Escoubas S., Brillet H., Mesarotti T., Raymond G., Thomas O., Morin P.- Local strains induced in silicon channel by a periodic array of nitride capped poly lines investigated by high-resolution X-ray diffraction.- Materials Science & Engineering B, vol. 154-155, p. 129-132, 2008
Escoubas S., Eberlein M., Rohr P. and Thomas O.- High-resolution X-ray diffraction as a tool to investigate the evolution of local stress in sub-micrometric Si lines isolated by periodic arrays of oxide-filled trenches.- Materials Science in Semiconductor Processing, - vol. 12, Issues 1-2, p. 64-70, 2009 - http://dx.doi.org/10.1016/j.mssp.2009.07.007
Fiawoo M.-F., Bonnot A.-M., Jourdain V., Michel T., Picher M., Arenal R., Thibault-Penisson J., Loiseau A.- Substrate preparation techniques for direct investigation by TEM of single wall carbon nanotubes grown by chemical vapor deposition.- Surface Science, vol. 603, n° 8, p. 1115-1120, 2009
Gailhanou H., Rogez J., Van Miltenburg J.C., Van Genderer A.C.G., Greneche J.M., Gilles C. , Jalabert D., Michau N., Gaucher E.C., Blanc P.- Thermodynamic properties of chlorite CCa-2. Heat capacities, heat contents and entropies.- Geochimica Cosmochimica Acta, vol. 73, 16, p. 4738-4749, 2009
Gambardella P., Stepanow S., Dmitriev A., Honolka J., de Groot F., Lingenfelder M., Sen Gupta S., Sarma D.D., Bencok P., Stanescu S., Clair S., Pons S., Lin N., Seitsonen A. P., Brune H., Barth J.V., Kern K.- Supramolecular control of the magnetic anisotropy in two-dimensional high-spin Fe arrays at a metal interface.- Nature Materials, vol. 8, p. 189, 2009 - http://dx.doi.org/10.1038/NMAT2376
Gourbilleau, F; Ternon, C; Maestre, D, Palais, O ; Dufour C.- Silicon-rich SiO2/SiO2 multilayers: A promising material for the third generation of solar cell.- Journal of Applied Physics, vol. 106, n° 1, p. 013501, 2009
Groll N., Bertaina S., Pati M., Dalal N.S., Chiorescu I.- Entrapment of magnetic microcrystals for on-chip electron spin resonance studies.- Journal of Applied Physics, vol. 106, p. 046106, 2009 - http://dx.doi.org/10.1063/1.3207774
Guerin C., Huard V., Bravaix A.- General Framework about defect creation at the Si/SiO2 interface.- Journal of Applied Physics, Vol. 105(11), p. 114513-114524, 2009 - http://dx.doi.org/10.1063/1.3133096
Hassam S., Boa D., Fouque Y., Kotchi K.P., Rogez J.- Thermodynamic investigation of the Pb-Sb system.- Journal of Alloys and Compounds, vol. 476, 74-78, 2009
Hoummada K., C. Perrin, D. Mangelinck.- Effect of Pt addition on Ni silicide at low temperature: Growth, redistribution and solubility.- Journal of Applied Physics, vol. 106, p. 063511, 2009 - http://dx.doi.org/10.1063/1.3204948
Ille A., Stadler W., Pompl T., Gossner H., Brodbeck T., Esmark K., Riess P., Alvarez D., Chatty K., Gauthier R., Bravaix A.- Reliability aspects of gate oxide under ESD pulse stress.- Microelectronics Reliability, 49, 12, 1407-1416, 2009
Jung H., Mangelinck-Noël N., Bergman C., Billia B.- Determination of the nucleation undercooling of Al-5.0wt%Ti-1.0wt%B refining particles in Al-based alloys using DSC.- Journal of Alloys and Compounds, vol. 477, p. 622-627, 2009 - http://dx.doi.org/10.1016/j.jallcom.2008.10.109
Jung H., Mangelinck-Noël N., Nguyen-Thi H., Bergeon N., Billia B., Buffet A., Reinhart G., Schenk T., Baruchel J.- Fragmentation in Al-7wt%Si alloy studied in real-time by X-ray synchrotron techniques.- International Journal of Cast Metal Research, vol. 22, n° 1-4, p. 208-211, 2009
Jung H., Mangelinck-Noël N., Nguyen-Thi H., Billia B.- Columnar to Equaixed Transition during Directional Solidification in Refined Al – based alloys.- Journal of Alloys and Compounds, vol. 484, p. 739-746, 2009
Kammouni A., W. Saikaly, M. Dumont, C. Marteau, X. Bano, A. Charaï.- Effect of the bainitic transformation temperature on retained austenite fraction and stability in Ti microalloyed TRIP steels.- Materials Science and Engineering A, vol. 518, n° 1-2, p. 89-96, August 2009 - http://dx.doi.org/10.1016/j.msea.2009.05.015
Katcho N.A., M.I. Richard, O. Landré, G. Tourbot, M.G. Proietti, H. Renevier, V. Favre-Nicolin, B. Daudin, G. Chen, J.J. Zhang and G. Bauer.- Structural properties of Ge/Si(001) nano-islands and AlGaN nanowires by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction.- Journal of Physics: Conference Series, 190, 012129, 2009
Katcho N.A., M.I. Richard, O. Landré, G. Tourbot, M.G. Proietti, H. Renevier, V. Favre-Nicolin, B. Daudin, G. Chen, J.J. Zhang, Z. Zhong, M. Stoffel, O. Schmidt, G. Renaud, T. U. Schülli and G. Bauer.- Combining spectroscopy and simulations to probe the structural properties of Ge/Si(001) nano-islands, ESRF highlights, 2009 -
Kondakova I.V., Kuzian R.O., Raymond L. Hayn R., Laguta V.V.- Evidence for impurity-induced polar state in Sr1-xMnxTiO3 from density functional calculations.- Physical Review B, - vol. 79, p. 134117, 2009 - doi: 10.1103/PhysRevB.79.134117
Kononchuk O., Monier V., Capello L., Pichaud B.- Characterization of crystalline defects in silicon for SOI applications by means of lignt scattering tomography.- Physica Status Solidi (c), vol. 6, 1935-1941, 2009
Kuz'min M., Hayn R., Oison V.- Ab initio calculated XANES and XMCD spectra od Fe(II) phthalocyanine.- Physical Review B, vol. 79, p. 024413, 2009
Labidi A., Gaidi M., Guerin J., Béjaoui A., Marref M., Aguir K.- Alternating current investigation and modeling of the temperature and ozone effects on the grains and the grain boundaries contributions to the WO3 sensor responses.- Thin Solid Films, vol. 518, p. 355–361, 2009
Lalmi B, Girardeaux C., Portavoce A., Bernardini J., Aufray B.- Growth and dissolution kinetics of ultra thin silicon films on Cu(100).- Journal of Nanoscience and Nanotechnology, vol. 9, n° 7, p. 4311, 2009 - http://dx.doi.org/10.1166/jnn.2009.M51
Lalmi B., Girardeaux C., Portavoce A., Bernardini J., Aufray B.- Unusual behaviour of the dissolutions kinetics of one monolayer of Si in Cu(001).- Defect and Diffusion Forum, vol. 289-292, p. 601, 2009
Lancin M., Texier M., Regula G., Pichaud B.- Defects created in N-doped 4H-SiC in the brittle regime: Stacking fault multiplicity and dislocation cores.- Philosophical Magazine, vol. 89, n° 15, p. 1251, 2009 - http://dx.doi.org/10.1080/14786430902919497
Lasagni F., M. Dumont, C. Salamida, J.A. Acuña, H.P. Degischer.- Dilatometry revealing Si precipitation in AlSi-alloys.- International Journal of Materials Science (formerly Z. für Metallkunde), vol. 100, n° 7, p.1, 2009 - http://dx.doi.org/10.3139/146.110145
Lelievre, JF; Fourmond, E; Kaminski, A, Palais, O ; Ballutaud, D ; Lemiti M.- Study of the composition of hydrogenated silicon nitride SiNx:H for efficient surface and bulk passivation of silicon.- Solar Energy Materials & Solar Cells, vol. 93, 8, 1281-1289, 2009
Leroy F, Karashanova D, Dufay M, Debierre J-M, Frisch T et Muller P.- Step bunching to step-meandering transition induced by electromigration on Si(111) vicinal surface.- Surface Science, vol. 603, p. 507-512, 2009
Li C., M. Bescond and M. Lannoo.- A GW investigation of interface induced correlation effects on transport properties in realistic nanoscale structures.- Physical Review B, vol. 80, 195318, 2009 - http://dx.doi.org/10.1103/PhysRevB.80.195318
Loussier X., Munteanu D., Autran J.L.- Simulation study of circuit performances of independent double-gate (IDG) MOSFETs with high-permittivity gate dielectrics.- Journal of Non-Crystalline Solids, 2009, Volume 355, N°18-21, p. 1185-1188.- http://dx.doi.org/10.1016/j.jnoncrysol.2009.02.011
Mangelinck D., Hoummada K., Blum I.- Kinetics of a transient silicide during the reaction of Ni thin film with (100)Si.- Applied Physics Letters, vol. 95, p. 181902, 2009 - http://dx.doi.org/10.1063/1.3257732
Marfaing J., Bois J.-J, Blancon R., Pozzo di Borgo E., Waysand G., Gaffet S., Yedlin M., Barroy P., Auguste M., Boyer D. and Cavaillou A.- About the world-wide magnetic-background noise in the millihertz frequency range.- EuroPhysics Letters, vol. 88, p. 19002, 2009 - http://dx.doi.org/10.1209/0295-5075/88/19002
Martinie S., Munteanu D., Le Carval G., Autran J.L.- Analytical modeling and performance analysis of Double-Gate MOSFET-based circuit including ballistic/quasi-ballistic effects.- Molecular Simulation, 2009, Vol. 35, N°8, p. 631-637.- http://dx.doi.org/10.1080/08927020902769836
Martinie S., Munteanu D., Le Carval G., Autran J.L.- Physics-based analytical modeling of quasi-ballistic transport in Double-Gate MOSFETs: from device to circuit operation.- IEEE Transactions on Electron Devices, 2009, vol. 56, no. 11, p. 2692-2702.- http://dx.doi.org/10.1109/TED.2009.2030540
Martinuzzi S., Dubois S., Warchol F., Enjalbert N.- Influence of chromium on minority carrier properties in intentionally contaminated n-type mc-Si wafers.- Materials Science and Engineering: B, vol. 159-160, p. 253-255, 2009
Martinuzzi S., Perichaud I., Trassy C., Degoulange J.- N type multicrystalline silicon wafers prepared from plasma torch refined upgraded metallurgical feedstock.- Progress in Photovoltaics : Research and Applications, vol. 17, p. 297-305, 2009
Merlen A., Gadenne V., Romann J., Chevallier V., Patrone L., Valmalette J.C.- Surface enhanced Raman spectroscopy of organic molecules deposited on gold sputtered substrates.- Nanotechnology, vol. 20, Issue 21, p 215705, 2009 - http://dx.doi.org/10.1088/0957-4484/20/21/215705
Merlen A., Toulemonde P., Le Floch S., Montagnac G., Hammouda T., Marty O., San Miguel A.- High pressure-high temperature synthesis of diamond from single-wall pristine and iodine doped carbon nanotube bundles.- Carbon, vol. 47,1643, 2009 - http://dx.doi.org/10.1016/j.carbon.2009.02.014
Merlen A., Valmalette J. C., Gucciardi P.G., Lamy de la Chapelle M., Frigout A., Ossikovski R.- Depolarization effects in Tip Enhanced Raman Spectroscopy.- Journal of Raman Spectroscopy, Invited paper vol. 40, p. 1361–1370, Special Issue 2009 - http://dx.doi.org/10.1002/jrs.2424
Michelini F., Cavassilas N., Hayn R., Szczap M.- Multiband k.p models for strained zincblende cristals: Application to the fine structure of ZnO.- Physical Review B, vol. 80, p. 245210, 2009 - doi: 10.1103/PhysRevB.80.245210
Moliere F., Foucher B., Perdu P., Bravaix A.- Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics, Microelectronics Reliability, 2009, Vol. 49(9-11), p. 1381–1385.- http://dx.doi.org/10.1016/j.microrel.2009.07.001
Moreau M., Munteanu D., Autran J.L.- Simulation of Gate Tunneling Current in Metal-Insulator-Metal Capacitor with Multi layer High-k Dielectric Stack using the Non-equilibrium Green’s Function Formalism.- Japanese Journal of Applied Physics, 2009, vol. 48, 111409: 1-8.- http://dx.doi.org/10.1143/JJAP.48.111409
Moreau M., Munteanu D., Autran J.L., Bellenger F., Mitard J., Houssa M.- Investigation of capacitance–voltage characteristics in Ge /high-κ MOS devices.- Journal of Non-Crystalline Solids, 2009, Volume 355, N°18-21, p. 1171-1175.- http://dx.doi.org/10.1016/j.jnoncrysol.2009.01.056
Munteanu D., Autran J.L.- 3-D Simulation Analysis of Bipolar Amplification in Planar Double-Gate and FinFET with Independent Gates.- IEEE Transactions on Nuclear Science, 2009, Volume 56, N°4, p. 2083-2090.- http://dx.doi.org/10.1109/TNS.2009.2016343
Munteanu D., Autran J.L.- Transient Response of 3-D Multi-Channel Nanowire MOSFETs Submitted to Heavy Ion Irradiation: a 3-D Simulation Study.- IEEE Transactions on Nuclear Science, 2009, Volume 56, N°4, p. 2042-2049.- http://dx.doi.org/10.1109/TNS.2009.2016564
Munteanu D., Autran J.L., Moreau M., Houssa M.- Electron transport through high-κ dielectric barriers: A non-equilibrium Green’s function (NEGF) study.- Journal of Non-Crystalline Solids, 2009, Volume 355, N°18-21, p. 1180-1184.- http://dx.doi.org/10.1016/j.jnoncrysol.2009.03.006
Munteanu D., Moreau M., Autran J.L.- A compact model for the ballistic subthreshold current in ultra-thin independent double-gate MOSFETs.- Molecular Simulation, 2009, Vol. 35, N°8, p. 491-497.- http://dx.doi.org/10.1080/08927020902801548
Ngo V.G., Bressy Ch., Leroux Ch., Margaillan A.- Synthesis of hybrid TiO2 nanoparticles with well defined poly(methylacrylate) and poly(tert-butyldimethylsylil methacrylate) via the RATF process.- Polymer, vol. 50 , p. 3095-3102, 2009 - http://dx.doi.org/10.1016/j.polymer.2009.04.077
Noeppel A., Budenkova O., Zimmermann G., Sturz L., Mangelinck-Noël N., Jung H., Nguyen-Thi H., Billia B., Gandin Ch-A., Fautrelle Y.- Numerical modeling of columnar to equiaxed transition – application to microgravity experiments.- International Journal of Cast Metal Research, vol. 22, n° 1-4, p. 34-38, 2009
Nony L., A.S. Foster, F. Bocquet and Ch. Loppacher.- Understanding the atomic-scale contrast in Kelvin probe force microscopy.- Physical Review Letters, vol. 103, p. 036802, 2009
Nony L., F. Bocquet, Ch. Loppacher and Th. Glatzel.- On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy - Nanotechnology, vol. 20, p. 264014, 2009
Otjacques C., Raty J.-Y., Gaspard, J.-P., Coulet M.-V., Johnson M., Schober H., Bichara C.- Dynamics of the Negative Thermal Expansion in Tellurium based liquid alloys.- Physical Review Letters, 103, 24, 245901, 2009
Panaccione G., Vobornik I., Fujii J., Krizmancic D., Annese E., Giovanelli L., Maccherozzi F., Salvador F., De Luisa A., Benedetti D., Gruden A., Bertoch P., Polack F., Cocco D., Sostero G., Diviacco B., Hochstrasser M., Maier U., Pescia D., Back C. H., Greber T., Osterwalder J., Galaktionov M., Sancrotti M., and Rossi G.- Advanced photoelectric effect experiment beamline at Elettra: A surface science laboratory coupled with Synchrotron Radiation.- Review of Scientific Instruments, vol. 80, n°4, p. 043105, 2009 - http://dx.doi.org/10.1063/1.3119364
Pawlak R., Clair S., Oison V., Abel M., Ourdjini O., Zwaneveld N.A.A., Gigmes D., Bertin D., Nony L. and Porte L.- Robust Supramolecular Network on Ag(111): Hydrogen-Bond Enhancement through Partial Alcohol Dehydrogenation.- ChemPhysChem, vol.10, p. 1032-5, 2009 - http://dx.doi.org/10.1002/cphc.200900055
Perichaud I., Martinuzzi S., Degoulange J., Trassy C.- Limiting factors of gettering treatments in mc-Si wafers from the metallurgical route.- Materials Science and Engineering: B, vol. 159-160, p. 256-258, 2009
Pichaud B., Burle N., Texier M., Alfonso C., Gailhanou M., Thibault-Penisson J., Fontaine C., Vdovin V.I.- Dislocation nucleation in heteroepitaxial semiconducting films.- Physica Status Solidi (c), vol. 6, 1827-1835 , 2009 - http://dx.doi.org/10.1002/pssc.200881469
Pons N., N. Cavassilas, F. Michelini, L. Raymond and M. Bescond.- New shaped nanowire MOSFETs with enhanced current characteristics based on three-dimensional modeling.- Journal of Applied Physics, vol. 106, 053711, 2009 - http://dx.doi.org/10.1063/1.3204550
Pons N., N. Cavassilas, F. Michelini, L. Raymond, and M. Bescond.- Original shaped nanowire metal-oxide-semiconductor field-effect transistor with enhanced current characteristics based on three-dimensional modelling.- Journal of Applied Physics, vol. 106, p. 053711, 2009 - doi: 10.1063/1.3204550
Portavoce A., Lalmi B., Tréglia G., Girardeaux C., Mangelinck D., Aufray B., Bernardini J.- Subnanometric Si film reactive diffusion on Ni.- Applied Physics Letters, vol. 95, p. 023111, 2009 - http://dx.doi.org/10.1063/1.3177187
Portavoce A., Mangelinck D., Simola R., Daineche R., Bernardini J.- - Atom redistribution during co-doped amorphous silicon crystallization.- Defect and Diffusion Forum, vol. 289-292, p. 329, 2009
Portavoce A., Rodriguez N., Daineche R., Grosjean C., Girardeaux C.- Correction of secondary ion mass spectrometry profiles for atom diffusion measurements.- Materials Letters, vol. 63, p. 676, 2009 - http://dx.doi.org/10.1016/j.matlet.2008.12.018
Postel-Pellerin J., Lalande F., Canet P., Bouchakour R., Jeuland F., Bertello B., Villard B.- Extraction of 3D parasitic capacitances in 90 nm and 22 nm NAND flash memories.- Microelectronics Reliability, vol. 49, no. 9-11, p. 1056-1059, 2009 - http://dx.doi.org/10.1016/j.microrel.2009.06.020
Postel-Pellerin J., Lalande F., Canet P., Bouchakour R., Jeuland F., Morancho L.- Modeling charge variation during data retention of MLC Flash memories.- Microelectronics Reliability, vol. 49, n° 9-11, p. 1060-1063, 2009 - http://dx.doi.org/10.1016/j.microrel.2009.06.034
Raguet J-R., Calenzo P., Laffont R., Deleruyelle D., Bouchakour R., Bidal V., Regnier A., Niel S., Fornara P., Mirabel J-M.- A Dual-Gate Memory Cell with Two Inter-Poly Oxides.- Japanese Journal of Applied Physics, vol. 48, n° 4, p. 04C058-1–04C058-5, 2009 - http://dx.doi.org/10.1143/JJAP.48.04C058
Raissi M, Regula G, Belgacem CH, Coudreau C, Nitsche S, Lancin M, Hollander B, Robert F, Fnaiech M, Ntsoenzok E, Lazzari J-L.- Nanocavity buffer induced by gas ion implantation in silicon substrate for strain relaxation of heteroepitaxial Si1-xGex/Si thin layers.- Semiconductor Defect Engineering - Materials, Synthetic Structures and Devices II, Materials Research Society, p. 143-8, 2009
Rakhmatullin R. M., Kurkin I. N., Mamin G. V., Orlinskii S. B., Gafurov M. R., Baibekov E. I., Malkin B. Z., Gambarelli, S., Bertaina, S., Barbara, B.- Coherent spin manipulations in Yb 3+:CaWO4 at X- and W-band EPR frequencies.- Physical Review B, vol. 79, p. 172408-4, 2009 - http://dx.doi.org/10.1103/PhysRevB.79.172408
Remy L., Coll P., Picot F., Mico P., Portal J-M.- Study of the Metal Filling Impact on Standard Cells and their Associated Interconnects Using Ring Oscillators : Definition of the Metal Fill Corner Concept.- Analog Integrated Circuits and Signal Processing, vol. 4, n° 1, p. 13-19, 2009
Richard M.-I., Favre-Nicolin V., Renaud G., Schülli T. U., Priester C., Zhong Z., Metzger T.-H.- Multiple Scattering effects in strain and composition analysis of nanoislands by grazing incidence x-rays.- Applied Physics Letters, vol. 94, p. 013112, 2009 - http://dx.doi.org/10.1063/1.3064157
Richard M.-I., N.A. Katcho, M.G. Proietti, H. Renevier, V. Favre-Nicolin, Z. Zhong, G. Chen, M. Stoffel, O. Schmidt, G. Renaud, T. U. Schülli, and G. Bauer.- Structural properties of Ge/Si(001) Nano-Islands by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction.- European Physical Journal Special Topics, 167, 3, 2009
Richard M.-I., Schülli T.U., Renaud G., Wintersberger E., Chen G., Bauer G., Holy V.- In situ x-ray scattering study on the evolution of Ge island morphology and relaxation for low growth rate: Advanced transition to superdomes.- Physical Review B, vol. 80, p. 045313, 2009 - http://dx.doi.org/10.1103/PhysRevB.80.045313
Roca M., Laffont R., Micolau G., Lalande F., Pizzuto O.- A Modelisation of the temperature dependence of the Fowler-Nordheim current in EEPROM memories.- Microelectronics Reliability, vol. 49, n° 9-11, p. 1070-1073, 2009 - http://dx.doi.org/10.1016/j.microrel.2009.06.036
Rogez J., Le Coze J.- Mesures de températures : Questions à se poser avant la mesure.- Techniques de l'Ingénieur, vol. R251, 2009
Romann J., Chevallier V., Merlen A., Valmalette J.C.- Self-organized assembly of copper oxalate nanocrystals.- Journal of Physical Chemistry C, vol. 113, Issue: 13 p.5068-5074, 2009 - http://dx.doi.org/10.1021/jp805335f
Roussel JM, Labat S, Thomas O.- Relation between strain and composition in coherent epitaxial Cu/Ni multilayers: Influence of strong concentration gradients.- Physical Review B, vol. 79, p. 014111, 2009 - http://dx.doi.org/10.1103/PhysRevB.79.014111
Rowell NL, Lockwood DJ, Berbezier I, Szkutnik PD, Ronda A.- Photoluminescence Efficiency of Self-Assembled Ge Nanocrystals.- Journal of the Electrochemical Society, 156, H913, 2009
Saidi D., B. Zaid, N. Boutarek, N. Bacha, A. Si Ahmed, J. P. Bibérian.- Qualitative evaluation of the germination frequency in Zr-Fe binary alloy.- Measurement, vol. 43, n° 2, p. 204-209, 2009 - http://dx.doi.org/10.1016/j.measurement.2009.09.003
Sassi M., Oison V., Debierre J. M., Humbel S.- Modelling of the two-dimensional polymerization of 1,4-benzene diboronic acid on a Ag surface.- ChemPhysChem., vol. 10, p. 840-2845, 2009 - doi: 10.1002/cphc.200900168
Savoyant A. Stepanov A., Kuzian R., Deparis C., Morhain C., Grasza K.- Single-ion anisotropy in Mn-doped diluted magnetic semiconductors.- Physical Review B, vol. 80, p. 115203, 2009 - http://dx.doi.org/10.1103/PhysRevB.80.115203
Schülli T.U., Vastola G., Richard M.-I., Malachias A., Renaud G., Uhlik F., Montalenti F., Chen G., Miglio L., Schäffler F., and Bauer G.- Enhanced Relaxation and Intermixing in Ge islands Grown on Pit-Patterned Si(001) Substrates.- Physical Review Letters, vol. 102, p.025502, 2009 - http://dx.doi.org/10.1016/j.susc.2008.04.024
Shin H.-J., Clair S., Kim Y., Kawai M.- Substrate-induced arrays of quantum dots in a single-walled carbon nanotube.- Nature Nanotechnology, vol. 4, p. 567, 2009 - http://dx.doi.org/10.1038/nnano.2009.182
Telandro V., Kussener E., Barthélemy H., Malherbe A.- A Bi-Channel voltage Regulator Protecting Smart Cards Against Power Analysis Attacks .- Analog Integrated Circuit and Signal Processing Journal (AICSP), - p. 275 - 285, 2009 - http://dx.doi.org/10.1007/s10470-008-9260-z
Variola F., Vetrone F., Richert L., Jedrzejowski P., Yi J.H., Zalzal S., Clair S., Sarkissian A., Perepichka D. F., Wuest J.D., Rosei F., Nanci A.- Improving biocompatibility of implantable metals by nanoscale modification of surfaces: an overview of strategies, fabrication methods and challenges.- Small, vol. 5, p. 996, 2009 - http://dx.doi.org/10.1002/smll.200801186
Verga A.- Anisotropic dynamics of a vicinal surface under the meandering step instability.- Physical Review B, - Vol. 80, p. 174115, 2009
Waysand G., Barroy P., Blancon R., Gaffet S., Guilpin C., Marfaing J., Pozzo Di Borgo E., Pyee M., Auguste M., Boyer D., Cavaillou, A.- Seismo-ionosphere detection by underground SQUID in low-noise environment in LSBB-Rustrel, France.- European Physical Journal-Applied Physics, vol. 47, p. 12705, 2009 - http://dx.doi.org/10.1051/epjap:2008186
Weiss C., Bergeon N. , Mangelinck-Noël N., Billia B.- Cellular pattern dynamics on a concave interface in three-dimensional directional solidification.- Physical Review E, vol. 79, p. 011605, 2009
Zaid L., Staraj R.- Cavity embedded gps antenna in gsm wire-patch radiating element.- Microwave and Optical Technology Letters, vol. 51, n° 8, p. 1896-1899, 2009
2010 (liste non exhaustive, source : WoS, janvier 2011)
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Title Synthesis and microstructure of cobalt ferrite nanoparticles |
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Author(s) Ajroudi, L; Villain, S; Madigou, V; Mliki, N; Leroux, C |
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Source JOURNAL OF CRYSTAL GROWTH 312 (16-17):2465-2471 2010 |
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ISSN 0022-0248 |
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DOI 10.1016/j.jcrysgro.2010.05.024 |
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Title Self-assembly of Silver Nanoparticles and Multiwall Carbon Nanotubes on Decomposed GaAs Surfaces |
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Author(s) Al-Harthi, SH; Revathy, KP; Gard, F; Mesli, A; George, AK; Bartringer, J; Mamor, M; Unnikrishnan, NV |
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Source NANOSCALE RESEARCH LETTERS 5 (11):1737-1743 2010 |
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DOI 10.1007/s11671-010-9703-1 |
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Title Self-assembly of TiO2 nanoparticles on native oxide terminated silicon surfaces |
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Author(s) Al-Harthi, SH; Revathy, KP; George, AK; Elzain, ME; Al-Hinai, AT; Mesli, A; Unnikrishnan, NV |
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Source COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS 370 (1-3):20-27 2010 |
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ISSN 0927-7757 |
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DOI 10.1016/j.colsurfa.2010.08.037 |
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Title HOLZ lines splitting on SiGe/Si relaxed samples: Analytical solutions for the kinematical equation |
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Author(s) Alfonso, C; Alexandre, L; Leroux, C; Jurczak, G; Saikaly, W; Charai, A; Thibault-Penisson, J |
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Source ULTRAMICROSCOPY 110 (4):285-296 2010 |
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ISSN 0304-3991 |
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DOI 10.1016/j.ultramic.2009.12.005 |
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Title High-pressure behavior of polyiodides confined into single-walled carbon nanotubes: A Raman study |
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Author(s) Alvarez, L; Bantignies, JL; Le Parc, R; Aznar, R; Sauvajol, JL; Merlen, A; Machon, D; Miguel, A |
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Source PHYSICAL REVIEW B 82 (20): Art No. 205403 2010 |
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ISSN 0163-1829 |
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DOI 10.1103/PhysRevB.82.205403 |
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Title Aluminum and vacancies in alpha-iron: Dissolution, diffusion, and clustering |
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Author(s) Amara, H; Fu, CC; Soisson, F; Maugis, P |
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Source PHYSICAL REVIEW B 81 (17): Art No. 174101 2010 |
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ISSN 0163-1829 |
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DOI 10.1103/PhysRevB.81.174101 |
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Title Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level |
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Author(s) Autran, JL; Munteanu, D; Roche, P; Gasiot, G; Martinie, S; Uznanski, S; Sauze, S; Semikh, S; Yakushev, E; Rozov, S; Loaiza, P; Warot, G; Zampaolo, M |
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Source MICROELECTRONICS RELIABILITY 50 (9-11):1822-1831 2010 |
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Conference Title 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF) |
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Conference Date OCT 11-15, 2010 |
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Conference Location Gaeta, ITALY |
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ISSN 0026-2714 |
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DOI 10.1016/j.microrel.2010.07.033 |
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Title Enthalpy of formation of the La-Mg intermediate phases |
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Author(s) Berche, A; Marinelli, F; Rogez, J; Record, MC |
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Source THERMOCHIMICA ACTA 499 (1-2):65-70 2010 |
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ISSN 0040-6031 |
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DOI 10.1016/j.tca.2009.11.003 |
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Title Thermodynamic measurements in the Mg-Zn system |
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Author(s) Berche, A; Drescher, C; Rogez, J; Record, MC; Bruhne, S; Assmus, W |
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Source JOURNAL OF ALLOYS AND COMPOUNDS 503 (1):44-49 2010 |
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ISSN 0925-8388 |
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DOI 10.1016/j.jallcom.2010.05.001 |
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Title Single donor induced negative differential resistance in silicon n-type nanowire metal-oxide-semiconductor transistors |
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Author(s) Bescond, M; Lannoo, M; Raymond, L; Michelini, F |
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Source JOURNAL OF APPLIED PHYSICS 107 (9): Art No. 093703 2010 |
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ISSN 0021-8979 |
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DOI 10.1063/1.3399999 |
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Title B diffusion in implanted Ni2Si and NiSi layers |
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Author(s) Blum, I; Portavoce, A; Chow, L; Mangelinck, D; Hoummada, K; Tellouche, G; Carron, V |
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Source APPLIED PHYSICS LETTERS 96 (5): Art No. 054102 2010 |
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ISSN 0003-6951 |
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DOI 10.1063/1.3303988 |
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Title Measurement of As diffusivity in Ni2Si thin films |
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Author(s) Blum, I; Portavoce, A; Mangelinck, D; Daineche, R; Hoummada, K; Labar, JL; Carron, V; Bernardini, J |
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Source MICROELECTRONIC ENGINEERING 87 (3):263-266 2010 |
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Conference Title 18th European Workshop on Materials for Advanced Metallization |
|
Conference Date MAR 08-11, 2009 |
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Conference Location Grenoble, FRANCE |
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ISSN 0167-9317 |
|
DOI 10.1016/j.mee.2009.05.020 |
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Title Application of synchrotron X-ray radiography to the study of dendritic equiaxed microstructure formation in Al-Cu alloys |
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Author(s) Bongo, A; Nguyen-Thi, H; Bergeon, N; Mangelinck-Noel, N; Schenk, T; Billia, B; Boller, E; Baruchel, J |
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Source NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 268 (3-4):394-398 2010 |
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Conference Title Spring Meeting of the European-Materials-Research-Society |
|
Conference Date JUN 08-12, 2009 |
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Conference Location Strasbourg, FRANCE |
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ISSN 0168-583X |
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DOI 10.1016/j.nimb.2009.09.011 |
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Title First-principle calculation of the optical properties of zinc-blende Zn1-xCdxSySe1-y |
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Author(s) Boukortt, A; Berrah, S; Hayn, R; Zaoui, A |
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Source PHYSICA B-CONDENSED MATTER 405 (2):763-769 2010 |
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ISSN 0921-4526 |
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DOI 10.1016/j.physb.2009.09.102 |
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Title Structural investigation of the Zn1-xCdxSb solid solution by density-functional theory approach |
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Author(s) Boulet, P; Record, MC |
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Source SOLID STATE SCIENCES 12 (1):26-32 2010 |
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ISSN 1293-2558 |
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DOI 10.1016/j.solidstatesciences.2009.09.018 |
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Title A 9-pJ/Pulse 1.42-Vpp OOK CMOS UWB Pulse Generator for the 3.1-10.6-GHz FCC Band |
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Author(s) Bourdel, S; Bachelet, Y; Gaubert, J; Vauche, R; Fourquin, O; Dehaese, N; Barthelemy, H |
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Source IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 58 (1):65-73 2010 |
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ISSN 0018-9480 |
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DOI 10.1109/TMTT.2009.2035959 |
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Title Electron spin resonance in three spin-1/2 dimer systems: VO(HPO4)center dot 0.5H(2)O, KZn(H2O)(VO)(2)(PO4)(2)(H2PO4), and CsV2O5 |
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Author(s) Camara, IS; Gautier, R; Le Fur, E; Trombe, JC; Galy, J; Ghorayeb, AM; Stepanov, A |
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Source PHYSICAL REVIEW B 81 (18): Art No. 184433 2010 |
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ISSN 0163-1829 |
|
DOI 10.1103/PhysRevB.81.184433 |
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Title Photoresponse induced by Ge nanodots on SiO2/Si substrate |
|
Author(s) Castrucci, P; Del Gobbo, S; Speiser, E; Scarselli, M; De Crescenzi, M; Amiard, G; Ronda, A; Berbezier, I |
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Source JOURNAL OF NON-CRYSTALLINE SOLIDS 356 (37-40):1940-1942 2010 |
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Conference Title International Workshop on Functional and Nanostructured Materials (FNMA)/International Conference on Intermoleculat and Magnetic Interactions in Matter (IMIM) |
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Conference Date SEP 27-30, 2009 |
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Conference Location L'Aquila, ITALY |
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ISSN 0022-3093 |
|
DOI 10.1016/j.jnoncrysol.2010.05.040 |
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Title Multiband quantum transport simulations of ultimate p-type double-gate transistors: Influence of the channel orientation |
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Author(s) Cavassilas, N; Pons, N; Michelini, F; Bescond, M |
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Source APPLIED PHYSICS LETTERS 96 (10): Art No. 102102 2010 |
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ISSN 0003-6951 |
|
DOI 10.1063/1.3352558 |
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Title Strain analysis by inversion of coherent Bragg X-ray diffraction intensity: the illumination problem |
|
Author(s) Chamard, V; Dolle, M; Baldinozzi, G; Livet, F; de Boissieu, M; Labat, S; Picca, F; Mocuta, C; Donnadieu, P; Metzger, TH |
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Source JOURNAL OF MODERN OPTICS 57 (9):816-825 2010 |
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ISSN 0950-0340 |
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DOI 10.1080/09500341003746645 |
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Title Three-dimensional x-ray Fourier transform holography: the Bragg case. |
|
Author(s) Chamard, V; Stangl, J; Carbone, G; Diaz, A; Chen, G; Alfonso, C; Mocuta, C; Metzger, T H |
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Source Phys Rev Lett 104 (16):165501 2010 |
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ISSN 1079-7114 |
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Title Three-Dimensional X-Ray Fourier Transform Holography: The Bragg Case |
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Author(s) Chamard, V; Stangl, J; Carbone, G; Diaz, A; Chen, G; Alfonso, C; Mocuta, C; Metzger, TH |
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Source PHYSICAL REVIEW LETTERS 104 (16): Art No. 165501 2010 |
|
ISSN 0031-9007 |
|
DOI 10.1103/PhysRevLett.104.165501 |
|
Title Magnetic strong coupling in a spin-photon system and transition to classical regime |
|
Author(s) Chiorescu, I; Groll, N; Bertaina, S; Mori, T; Miyashita, S |
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Source PHYSICAL REVIEW B 82 (2): Art No. 024413 2010 |
|
ISSN 0163-1829 |
|
DOI 10.1103/PhysRevB.82.024413 |
|
Title Mesoscopic Arrays from Supramolecular Self-Assembly |
|
Author(s) Clair, S; Abel, M; Porte, L |
|
Source ANGEWANDTE CHEMIE-INTERNATIONAL EDITION 49 (44):8237-8239 2010 |
|
ISSN 1433-7851 |
|
DOI 10.1002/anie.201003335 |
|
Title Lattice instabilities in hexagonal NiSi: A NiAs prototype structure |
|
Author(s) Connetable, D; Thomas, O |
|
Source PHYSICAL REVIEW B 81 (7): Art No. 075213 2010 |
|
ISSN 0163-1829 |
|
DOI 10.1103/PhysRevB.81.075213 |
|
Title Dendritic Arm Spacing Affecting Mechanical Properties and Wear Behavior of Al-Sn and Al-Si Alloys Directionally Solidified under Unsteady-State Conditions |
|
Author(s) Cruz, KS; Meza, ES; Fernandes, FAP; Quaresma, JMV; Casteletti, LC; Garcia, A |
|
Source METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE 41A (4):972-984 2010 |
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Conference Title Symposium on Mechanical Behavior of Nanostructured Materials held at the 2009 TMS Annual Meeting and Exhibition |
|
Conference Date FEB 15-19, 2009 |
|
Conference Location San Francisco, CA |
|
ISSN 1073-5623 |
|
DOI 10.1007/s11661-009-0161-2 |
|
Title Electrical nanocharacterization of copper tetracyanoquinodimethane layers dedicated to resistive random access memories |
|
Author(s) Deleruyelle, D; Muller, C; Amouroux, J; Muller, R |
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Source APPLIED PHYSICS LETTERS 96 (26): Art No. 263504 2010 |
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ISSN 0003-6951 |
|
DOI 10.1063/1.3458596 |
|
Title An RFID Tag Antenna Tolerant to Mounting on Materials |
|
Author(s) Deleruyelle, T; Pannier, P; Egels, M; Bergeret, E |
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Source IEEE ANTENNAS AND PROPAGATION MAGAZINE 52 (4):14-19 2010 |
|
ISSN 1045-9243 |
|
Title MULTISTANDARD UHF AND UWB TAG ANTENNA FOR RFID AND POSITIONING APPLICATIONS |
|
Author(s) Deleruyelle, T; Pannier, P; Egels, M; Bergeret, E |
|
Source MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 52 (7):1597-1599 2010 |
|
ISSN 0895-2477 |
|
DOI 10.1002/mop.25285 |
|
Title Solution growth of metal-organic complex CuTCNQ in small dimension interconnect structures |
|
Author(s) Demolliens, A; Muller, C; Mueller, R; Turquat, C; Goux, L; Deleruyelle, D; Wouters, DJ |
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Source JOURNAL OF CRYSTAL GROWTH 312 (22):3267-3275 2010 |
|
ISSN 0022-0248 |
|
DOI 10.1016/j.jcrysgro.2010.08.008 |
|
Title Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study |
|
Author(s) Diaz, A; Chamard, V; Mocuta, C; Magalhaes-Paniago, R; Stangl, J; Carbone, D; Metzger, TH; Bauer, G |
|
Source NEW JOURNAL OF PHYSICS 12 Art No. 035006 2010 |
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ISSN 1367-2630 |
|
DOI 10.1088/1367-2630/12/3/035006 |
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Title Investigation of solution-processed organic thin film transistors based on alpha,omega-hexyl-distyryl-bithiophene (DH-DS2T): growth and transport properties |
|
Author(s) Didane, Y; Diallo, AK; Fiorido, T; Suzuki, A; Yoshimoto, N; Bernardini, S; Ackermann, J; Fages, F; Brisset, H; Bendahan, M; Aguir, K; Videlot-Ackermann, C |
|
Source JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS 12 (7):1546-1551 2010 |
|
ISSN 1454-4164 |
|
Title Sand-castle biperiodic pattern for spectral and angular broadening of antireflective properties |
|
Author(s) Escoubas, L; Bouffaron, R; Brissonneau, V; Simon, JJ; Berginc, G; Flory, F; Torchio, P |
|
Source OPTICS LETTERS 35 (9):1455-1457 2010 |
|
ISSN 0146-9592 |
|
Title All solution processed flexible ammonia gas and light sensors based on alpha,omega-hexyl-distyrylbithiophene films |
|
Author(s) Fiorido, T; Bendahan, M; Aguir, K; Bernardini, S; Martini, C; Brisset, H; Fages, F; Videlot-Ackermann, C; Ackermann, J |
|
Source SENSORS AND ACTUATORS B-CHEMICAL 151 (1):77-82 2010 |
|
ISSN 0925-4005 |
|
DOI 10.1016/j.snb.2010.09.048 |
|
Title High-resolution nanostructural investigation of Zn4Sb3 alloys |
|
Author(s) Gault, B; Marquis, EA; Saxey, DW; Hughes, GM; Mangelinck, D; Toberer, ES; Snyder, GJ |
|
Source SCRIPTA MATERIALIA 63 (7):784-787 2010 |
|
ISSN 1359-6462 |
|
DOI 10.1016/j.scriptamat.2010.06.014 |
|
Title Valence band photoemission from the Zn-phthalocyanine/Ag(110) interface: Charge transfer and scattering of substrate photoelectrons |
|
Author(s) Giovanelli, L; Amsalem, P; Angot, T; Petaccia, L; Gorovikov, S; Porte, L; Goldoni, A; Themlin, JM |
|
Source PHYSICAL REVIEW B 82 (12): Art No. 125431 2010 |
|
ISSN 0163-1829 |
|
DOI 10.1103/PhysRevB.82.125431 |
|
Title Al-Fe hypoeutectic alloys directionally solidified under steady-state and unsteady-state conditions |
|
Author(s) Goulart, PR; Spinelli, JE; Cheung, N; Mangelinck-Noel, N; Garcia, A |
|
Source JOURNAL OF ALLOYS AND COMPOUNDS 504 (1):205-210 2010 |
|
ISSN 0925-8388 |
|
DOI 10.1016/j.jallcom.2010.05.089 |
|
Title Coexistence of the bipolar and unipolar resistive-switching modes in NiO cells made by thermal oxidation of Ni layers |
|
Author(s) Goux, L; Lisoni, JG; Jurczak, M; Wouters, DJ; Courtade, L; Muller, C |
|
Source JOURNAL OF APPLIED PHYSICS 107 (2): Art No. 024512 2010 |
|
ISSN 0021-8979 |
|
DOI 10.1063/1.3275426 |
|
Title Insights into solid phase epitaxy of ultrahighly doped silicon |
|
Author(s) Gouye, A; Berbezier, I; Favre, L; Aouassa, M; Amiard, G; Ronda, A; Campidelli, Y; Halimaoui, A |
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Source JOURNAL OF APPLIED PHYSICS 108 (1): Art No. 013513 2010 |
|
ISSN 0021-8979 |
|
DOI 10.1063/1.3408556 |
|
Title Low-temperature solid phase epitaxy for integrating advanced source/drain metal-oxide-semiconductor structures |
|
Author(s) Gouye, A; Berbezier, I; Favre, L; Amiard, G; Aouassa, M; Campidelli, Y; Halimaoui, A |
|
Source APPLIED PHYSICS LETTERS 96 (6): Art No. 063102 2010 |
|
ISSN 0003-6951 |
|
DOI 10.1063/1.3298354 |
|
Title Critical assessment and optimization of the Ag-Au-Pb system |
|
Author(s) Hassam, S; Boa, D; Benigni, P; Rogez, J |
|
Source THERMOCHIMICA ACTA 510 (1-2):37-45 2010 |
|
ISSN 0040-6031 |
|
DOI 10.1016/j.tca.2010.06.020 |
|
Title Polarization Switching without Domain Formation at the Intrinsic Coercive Field in Ultrathin Ferroelectric PbTiO3 |
|
Author(s) Highland, MJ; Fister, TT; Richard, MI; Fong, DD; Fuoss, PH; Thompson, C; Eastman, JA; Streiffer, SK; Stephenson, GB |
|
Source PHYSICAL REVIEW LETTERS 105 (16): Art No. 167601 2010 |
|
ISSN 0031-9007 |
|
DOI 10.1103/PhysRevLett.105.167601 |
|
Title Composition measurement of the Ni-silicide transient phase by atom probe tomography |
|
Author(s) Hoummada, K; Blum, I; Mangelinck, D; Portavoce, A |
|
Source APPLIED PHYSICS LETTERS 96 (26): Art No. 261904 2010 |
|
ISSN 0003-6951 |
|
DOI 10.1063/1.3457995 |
|
Title Nickel silicide encroachment formation and characterization |
|
Author(s) Imbert, B; Pantel, R; Zoll, S; Gregoire, M; Beneyton, R; del Medico, S; Thomas, O |
|
Source MICROELECTRONIC ENGINEERING 87 (3):245-248 2010 |
|
Conference Title 18th European Workshop on Materials for Advanced Metallization |
|
Conference Date MAR 08-11, 2009 |
|
Conference Location Grenoble, FRANCE |
|
ISSN 0167-9317 |
|
DOI 10.1016/j.mee.2009.06.003 |
|
Title Very-High-Energy Neutrinos: Detection and Estimation in the Mediterranean Sea |
|
Author(s) Juennard, N; Jauffret, C; Xerri, B |
|
Source IEEE JOURNAL OF OCEANIC ENGINEERING 35 (4):917-935 2010 |
|
ISSN 0364-9059 |
|
DOI 10.1109/JOE.2010.2048943 |
|
Title Study of Ferroelectric Bi3.25La0.75Ti3O12 Thin Films Deposited by Sol-Gel Method |
|
Author(s) Khachane, M; Chevallier, V; Gavarri, JR; Muller, C; Turquat, C; Elaatmani, M; Zegzouti, A; Luk'yanchuk, IA |
|
Source FERROELECTRICS 397112-121 2010 |
|
Conference Title 6th International Seminar on Ferroelastic Physics |
|
Conference Date SEP 22-25, 2009 |
|
Conference Location Voronezh, RUSSIA |
|
ISSN 0015-0193 |
|
DOI 10.1080/00150193.2010.484748 |
|
Title Mechanisms of magnetoelectricity in manganese-doped incipient ferroelectrics |
|
Author(s) Kuzian, RO; Laguta, VV; Dare, AM; Kondakova, IV; Marysko, M; Raymond, L; Garmash, EP; Pavlikov, VN; Tkach, A; Vilarinho, PM; Hayn, R |
|
Source EPL 92 (1): Art No. 17007 2010 |
|
ISSN 0295-5075 |
|
DOI 10.1209/0295-5075/92/17007 |
|
Title Epitaxial growth of a silicene sheet |
|
Author(s) Lalmi, B; Oughaddou, H; Enriquez, H; Kara, A; Vizzini, S; Ealet, B; Aufray, B |
|
Source APPLIED PHYSICS LETTERS 97 (22): Art No. 223109 2010 |
|
ISSN 0003-6951 |
|
DOI 10.1063/1.3524215 |
|
Title Structural and optoelectronical characterization of Si-SiO2/SiO2 multilayers with applications in all Si tandem solar cells |
|
Author(s) Maestre, D; Palais, O; Barakel, D; Pasquinelli, M; Alfonso, C; Gourbilleau, F; De Laurentis, M; Irace, A |
|
Source JOURNAL OF APPLIED PHYSICS 107 (6): Art No. 064321 2010 |
|
ISSN 0021-8979 |
|
DOI 10.1063/1.3309761 |
|
Title Three-dimensional composition mapping of NiSi phase distribution and Pt diffusion via grain boundaries in Ni2Si |
|
Author(s) Mangelinck, D; Hoummada, K; Portavoce, A; Perrin, C; Daineche, R; Descoins, M; Larson, DJ; Clifton, PH |
|
Source SCRIPTA MATERIALIA 62 (8):568-571 2010 |
|
ISSN 1359-6462 |
|
DOI 10.1016/j.scriptamat.2009.12.044 |
|
Title Surface Enhanced Spectroscopy of Organic Molecules Deposited on Nanostructured Gold Surfaces |
|
Author(s) Merlen, A; Chevallier, V; Valmalette, JC; Lagugne-Labarthet, F; Harte, E |
|
Editor(s) Champion, PM; Ziegler, LD |
|
Source XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY 1267920-921 2010 |
|
Conference Title 22nd International Conference on Raman Spectroscopy |
|
Conference Date AUG 08-13, 2010 |
|
Conference Location Boston, MA |
|
Title Surface-Enhanced Raman and Fluorescence Spectroscopy of Dye Molecules Deposited on Nanostructured Gold Surfaces |
|
Author(s) Merlen, A; Lagugne-Labarthet, F; Harte, E |
|
Source JOURNAL OF PHYSICAL CHEMISTRY C 114 (30):12878-12884 2010 |
|
ISSN 1932-7447 |
|
DOI 10.1021/jp101576h |
|
Title Light scattering from dislocations in silicon |
|
Author(s) Monier, V; Capello, L; Kononchuk, O; Pichaud, B |
|
Source JOURNAL OF APPLIED PHYSICS 108 (9): Art No. 093525 2010 |
|
ISSN 0021-8979 |
|
DOI 10.1063/1.3506521 |
|
Title Supramolecular Structures and Chirality in Dithiocarbamate Self-Assembled Monolayers on Au(111) |
|
Author(s) Morf, P; Ballav, N; Putero, M; von Wrochem, F; Wessels, JM; Jung, TA |
|
Source JOURNAL OF PHYSICAL CHEMISTRY LETTERS 1 (5):813-816 2010 |
|
DOI 10.1021/jz900435w |
|
Title Optical and nuclear characterization of Xe-induced nanoporosity in SiO2 |
|
Author(s) Naas, A; De Sousa-Meneses, D; Hakim, B; Regula, G; Beaufort, MF; Belaidi, A; Ntsoenzok, E |
|
Source THIN SOLID FILMS 518 (16):4721-4725 2010 |
|
Conference Title Symposium on Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films II held at the 2009 Spring EMRS Meeting |
|
Conference Date JUN 08-12, 2009 |
|
Conference Location Strasbourg, FRANCE |
|
ISSN 0040-6090 |
|
DOI 10.1016/j.tsf.2009.12.068 |
|
Title RuO2 thin films deposited by spin coating on silicon substrates: pH-dependence of the microstructure and catalytic properties |
|
Author(s) Nowakowski, P; Kopia, A; Villain, S; Fremy, MA; Kusinski, J; Gavarri, JR |
|
Source JOURNAL OF MICROSCOPY-OXFORD 237 (3):246-252 2010 |
|
Conference Title 13th International Conference on Electron Microscopy |
|
Conference Date JUN 08-11, 2008 |
|
Conference Location Zakopane, POLAND |
|
ISSN 0022-2720 |
|
DOI 10.1111/j.1365-2818.2009.03236.x |
|
Title Microstructure and electrical properties of RuO2-CeO2 composite thin films |
|
Author(s) Nowakowski, P; Villain, S; Aguir, K; Guerin, J; Kopia, A; Kusinski, J; Guinneton, F; Gavarri, JR |
|
Source THIN SOLID FILMS 518 (10):2801-2807 2010 |
|
ISSN 0040-6090 |
|
DOI 10.1016/j.tsf.2009.08.034 |
|
Title Influence of Heating and Cooling Rates of Post-Implantation Annealing Process on AI-Implanted 4H-SiC Epitaxial Samples |
|
Author(s) Ottaviani, L; Biondo, S; Morata, S; Palais, O; Sauvage, T; Torregrosa, F |
|
Editor(s) Bauer, AJ; Friedrichs, P; Krieger, M; Pensl, G; Rupp, R; Seyller, T |
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Source SILICON CARBIDE AND RELATED MATERIALS 2009, PTS 1 AND 2 645-648717-720 2010 |
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Conference Title 13th International Conference on Silicon Carbide and Related Materials |
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Conference Date OCT 11-16, 2009 |
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Conference Location Nurnberg, GERMANY |
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DOI 10.4028/www.scientific.net/MSF.645-648.717 |
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Title End-of-range defects in germanium and their role in boron deactivation |
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Author(s) Panciera, F; Fazzini, PF; Collet, M; Boucher, J; Bedel, E; Cristiano, F |
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Source APPLIED PHYSICS LETTERS 97 (1): Art No. 012105 2010 |
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ISSN 0003-6951 |
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DOI 10.1063/1.3456537 |
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Title Role of S-Au labile bonding in stochastic switching of molecular conductance studied by STM |
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Author(s) Patrone, L; Soullier, J; Martin, P |
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Source PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS 247 (8):1867-1870 2010 |
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Conference Title Trends in Nanotechnology (TNT2009) |
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Conference Date SEP 07-11, 2009 |
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Conference Location Barcelona, SPAIN |
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ISSN 0370-1972 |
|
DOI 10.1002/pssb.200983829 |
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Title Single and Binary Self-Assembled Mono layers of Phenyl- and Pentafluorophenyl-Based Silane Species, and Their Phase Separation with Octadecyltrichlorosilane |
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Author(s) Patrone, L; Gadenne, V; Desbief, S |
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Source LANGMUIR 26 (22):17111-17118 2010 |
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ISSN 0743-7463 |
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DOI 10.1021/la102742e |
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Title Supramolecular Assemblies of 1,4-Benzene Diboronic Acid on KCl(001) |
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Author(s) Pawlak, R; Nony, L; Bocquet, F; Olson, V; Sassi, M; Debierre, JM; Loppacher, C; Porte, L |
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Source JOURNAL OF PHYSICAL CHEMISTRY C 114 (20):9290-9295 2010 |
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ISSN 1932-7447 |
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DOI 10.1021/jp102044u |
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Title X-ray microbeam strain investigation on Cu-MEMS structures |
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Author(s) Perroud, O; Vayrette, R; Rivero, C; Thomas, O; Micha, JS; Ulrich, O |
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Source MICROELECTRONIC ENGINEERING 87 (3):394-397 2010 |
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Conference Title 18th European Workshop on Materials for Advanced Metallization |
|
Conference Date MAR 08-11, 2009 |
|
Conference Location Grenoble, FRANCE |
|
ISSN 0167-9317 |
|
DOI 10.1016/j.mee.2009.05.030 |
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Title EEPROM tunnel oxide lifetime reliability prediction based on fast electrical stress tests |
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Author(s) Plantier, J; Aziza, H; Portal, JM; Reliaud, C; Regnier, A; Ogier, JL |
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Source ELECTRONICS LETTERS 46 (23):1568-1569 2010 |
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ISSN 0013-5194 |
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DOI 10.1049/el.2010.1894 |
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Title Triple-junction contribution to diffusion in nanocrystalline Si |
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Author(s) Portavoce, A; Chow, L; Bernardini, J |
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Source APPLIED PHYSICS LETTERS 96 (21): Art No. 214102 2010 |
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ISSN 0003-6951 |
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DOI 10.1063/1.3435476 |
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Title Physical origin of thickness-controlled sequential phase formation during reactive diffusion: Atomistic modeling |
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Author(s) Portavoce, A; Treglia, G |
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Source PHYSICAL REVIEW B 82 (20): Art No. 205431 2010 |
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ISSN 0163-1829 |
|
DOI 10.1103/PhysRevB.82.205431 |
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Title Leakage paths identification in NVM using biased data retention |
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Author(s) Postel-Pellerin, J; Laffont, R; Micolau, G; Lalande, F; Regnier, A; Bouteille, B |
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Source MICROELECTRONICS RELIABILITY 50 (9-11):1474-1478 2010 |
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Conference Title 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF) |
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Conference Date OCT 11-15, 2010 |
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Conference Location Gaeta, ITALY |
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ISSN 0026-2714 |
|
DOI 10.1016/j.microrel.2010.07.074 |
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Title Finite element simulations of coherent diffraction in elastoplastic polycrystalline aggregates |
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Author(s) Proudhon, H; Vaxelaire, N; Labat, S; Forest, S; Thomas, O |
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Source COMPTES RENDUS PHYSIQUE 11 (3-4):293-303 2010 |
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ISSN 1631-0705 |
|
DOI 10.1016/j.crhy.2010.07.009 |
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Title Modeling the Independent Double Gate Transistor in Accumulation Regime for 1TDRAM Application |
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Author(s) Puget, S; Bossu, G; Masson, P; Mazoyer, P; Ranica, R; Villaret, A; Lorenzini, P; Portal, JM; Rideau, D; Ghibaudo, G; Bouchakour, R; Jacquemod, G; Skotnicki, T |
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Source IEEE TRANSACTIONS ON ELECTRON DEVICES 57 (4):855-865 2010 |
|
ISSN 0018-9383 |
|
DOI 10.1109/TED.2010.2040937 |
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Title First silicide formed by reaction of Ni(13%Pt) films with Si(100): Nature and kinetics by in-situ X-ray reflectivity and diffraction |
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Author(s) Putero, M; Ehouarne, L; Ziegler, E; Mangelinck, D |
|
Source SCRIPTA MATERIALIA 63 (1):24-27 2010 |
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ISSN 1359-6462 |
|
DOI 10.1016/j.scriptamat.2010.02.040 |
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Title The effect of solute on ultrasonic grain refinement of magnesium alloys |
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Author(s) Qian, M; Ramirez, A; Das, A; StJohn, DH |
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Source JOURNAL OF CRYSTAL GROWTH 312 (15):2267-2272 2010 |
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ISSN 0022-0248 |
|
DOI 10.1016/j.jcrysgro.2010.04.035 |
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Title Interplay between structural, electronic, and magnetic degrees of freedom in Sr(3)Cr(2)O(8). |
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Author(s) Radtke, G; Saul, A; Dabkowska, H A; Luke, G M; Botton, G A |
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Source Phys Rev Lett 105 (3):036401 2010 |
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ISSN 1079-7114 |
|
Title Interplay between Structural, Electronic, and Magnetic Degrees of Freedom in Sr3Cr2O8 |
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Author(s) Radtke, G; Saul, A; Dabkowska, HA; Luke, GM; Botton, GA |
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Source PHYSICAL REVIEW LETTERS 105 (3): Art No. 036401 2010 |
|
ISSN 0031-9007 |
|
DOI 10.1103/PhysRevLett.105.036401 |
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Title Fast Growth Synthesis of GaAs Nanowires with Exceptional Length |
|
Author(s) Ramdani, MR; Gil, E; Leroux, C; Andre, Y; Trassoudaine, A; Castelluci, D; Bideux, L; Monier, G; Robert-Goumet, C; Kupka, R |
|
Source NANO LETTERS 10 (5):1836-1841 2010 |
|
ISSN 1530-6984 |
|
DOI 10.1021/nl100557d |
|
Title Effect of total pressure on the formation and size evolution of silicon quantum dots in silicon nitride films |
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Author(s) Rezgui, B; Sibai, A; Nychyporuk, T; Lemiti, M; Bremond, G; Maestre, D; Palais, O |
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Source APPLIED PHYSICS LETTERS 96 (18): Art No. 183105 2010 |
|
ISSN 0003-6951 |
|
DOI 10.1063/1.3427386 |
|
Title In situ synchrotron x-ray studies of strain and composition evolution during metal-organic chemical vapor deposition of InGaN |
|
Author(s) Richard, MI; Highland, MJ; Fister, TT; Munkholm, A; Mei, J; Streiffer, SK; Thompson, C; Fuoss, PH; Stephenson, GB |
|
Source APPLIED PHYSICS LETTERS 96 (5): Art No. 051911 2010 |
|
ISSN 0003-6951 |
|
DOI 10.1063/1.3293441 |
|
Title Arsenic and phosphorus codiffusion during silicon microelectronic processes |
|
Author(s) Rodriguez, N; Portavoce, A; Delalleau, J; Grosjean, C; Serradeil, V; Girardeaux, C |
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Source THIN SOLID FILMS 518 (17):5022-5027 2010 |
|
ISSN 0040-6090 |
|
DOI 10.1016/j.tsf.2010.03.039 |
|
Title Structural changes and thermal properties of aluminium micro- and nano-powders |
|
Author(s) Rufino, B; Coulet, MV; Bouchet, R; Isnard, O; Denoyel, R |
|
Source ACTA MATERIALIA 58 (12):4224-4232 2010 |
|
ISSN 1359-6454 |
|
DOI 10.1016/j.actamat.2010.04.014 |
|
Title Sensor Self-Localization for Antenna Arrays Subject to Bending and Vibrations |
|
Author(s) Santori, A; Barrere, J; Chabriel, G; Jauffret, C; Medynski, D |
|
Source IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS 46 (2):884-898 2010 |
|
ISSN 0018-9251 |
|
DOI 10.1109/TAES.2010.5461663 |
|
Title Microstructural development during transient directional solidification of hypermonotectic Al-Bi alloys |
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Author(s) Silva, AP; Spinelli, JE; Mangelinck-Noel, N; Garcia, A |
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Source MATERIALS & DESIGN 31 (10):4584-4591 2010 |
|
ISSN 0264-1275 |
|
DOI 10.1016/j.matdes.2010.05.046 |
|
Title Nanophotonics for efficient photovoltaic solar cells |
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Author(s) Simon, JJ; Flory, F; Escoubas, L; Torchio, P; Chen, YJ; Duche, D |
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Source JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS 12 (1):31-34 2010 |
|
ISSN 1454-4164 |
|
Title Possible room-temperature ferromagnetism in K-doped SnO2: X-ray diffraction and high-resolution transmission electron microscopy study |
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Author(s) Srivastava, SK; Lejay, P; Barbara, B; Pailhes, S; Madigou, V; Bouzerar, G |
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Source PHYSICAL REVIEW B 82 (19): Art No. 93203 2010 |
|
ISSN 0163-1829 |
|
DOI 10.1103/PhysRevB.82.193203 |
|
Title Post Si(C)N hillock nucleation and growth in IC copper lines controlled by diffusional creep |
|
Author(s) Timma, A; Caubet, P; Chenevier, B; Thomas, O; Kaouache, B; Dumas, L; Normandon, P; Giraudin, JC |
|
Source MICROELECTRONIC ENGINEERING 87 (3):361-364 2010 |
|
Conference Title 18th European Workshop on Materials for Advanced Metallization |
|
Conference Date MAR 08-11, 2009 |
|
Conference Location Grenoble, FRANCE |
|
ISSN 0167-9317 |
|
DOI 10.1016/j.mee.2009.08.003 |
|
Title First-principles study of the stability of NbC and NbN precipitates under coherency strains in alpha-iron |
|
Author(s) Tingaud, D; Maugis, P |
|
Source COMPUTATIONAL MATERIALS SCIENCE 49 (1):60-63 2010 |
|
ISSN 0927-0256 |
|
DOI 10.1016/j.commatsci.2010.04.020 |
|
Title Femtosecond laser texturization for improvement of photovoltaic cells: Black Silicon |
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Author(s) Torres, R; Vervisch, V; Halbwax, M; Sarnet, T; Delaporte, P; Sentis, M; Ferreira, J; Barakel, D; Bastide, S; Torregrosa, F; Etienne, H; Roux, L |
|
Source JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS 12 (3):621-625 2010 |
|
ISSN 1454-4164 |
|
Title Single Event Upset and Multiple Cell Upset Modeling in Commercial Bulk 65-nm CMOS SRAMs and Flip-Flops |
|
Author(s) Uznanski, S; Gasiot, G; Roche, P; Tavernier, C; Autran, JL |
|
Source IEEE TRANSACTIONS ON NUCLEAR SCIENCE 57 (4):1876-1883 2010 |
|
Conference Title 10th European Conference on Radiation and Its Effects on Components and Systems (RADECS - 09) |
|
Conference Date SEP 14-18, 2009 |
|
Conference Location Bruges, BELGIUM |
|
ISSN 0018-9499 |
|
DOI 10.1109/TNS.2010.2051039 |
|
Title Structural changes in amorphous GeS2 at high pressure |
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Author(s) Vaccari, M; Garbarino, G; Aquilanti, G; Coulet, MV; Trapananti, A; Pascarelli, S; Hanfland, M; Stavrou, E; Raptis, C |
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Source PHYSICAL REVIEW B 81 (1): Art No. 014205 2010 |
|
ISSN 0163-1829 |
|
DOI 10.1103/PhysRevB.81.014205 |
|
Title Stationary states and fractional dynamics in systems with long-range interactions |
|
Author(s) Van Den Berg, TL; Fanelli, D; Leoncini, X |
|
Source EPL 89 (5): Art No. 50010 2010 |
|
ISSN 0295-5075 |
|
DOI 10.1209/0295-5075/89/50010 |
|
Title Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction |
|
Author(s) Vaxelaire, N; Proudhon, H; Labat, S; Kirchlechner, C; Keckes, J; Jacques, V; Ravy, S; Forest, S; Thomas, O |
|
Source NEW JOURNAL OF PHYSICS 12 Art No. 035018 2010 |
|
ISSN 1367-2630 |
|
DOI 10.1088/1367-2630/12/3/035018 |
|
Title 3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology |
|
Author(s) Vaxelaire, N; Labat, S; Chamard, V; Thomas, O; Jacques, V; Picca, F; Ravy, S; Kirchlechner, C; Keckes, J |
|
Source NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 268 (3-4):388-393 2010 |
|
Conference Title Spring Meeting of the European-Materials-Research-Society |
|
Conference Date JUN 08-12, 2009 |
|
Conference Location Strasbourg, FRANCE |
|
ISSN 0168-583X |
|
DOI 10.1016/j.nimb.2009.09.010 |
|
Title Out-of-plane stresses arising from grain interactions in textured thin films |
|
Author(s) Vodnick, AM; Nowak, DE; Labat, S; Thomas, O; Baker, SP |
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Source ACTA MATERIALIA 58 (7):2452-2463 2010 |
|
ISSN 1359-6454 |
|
DOI 10.1016/j.actamat.2009.12.031 |
|
Title Effect of Si and He implantation in the formation of ultra shallow junctions in Si |
|
Author(s) Xu, M; Regula, G; Daineche, R; Oliviero, E; Hakim, B; Ntsoenzok, E; Pichaud, B |
|
Source THIN SOLID FILMS 518 (9):2354-2356 2010 |
|
Conference Title Symposium on Silicon and Germanium Issues for Future CMOS Devices held at the 2009 E-MRS Spring Meeting |
|
Conference Date JUN 08-12, 2009 |
|
Conference Location Strasbourg, FRANCE |
|
ISSN 0040-6090 |
|
DOI 10.1016/j.tsf.2009.09.153 |
|
Title Study of discharge after electron irradiation in sapphires and polycrystalline alumina |
|
Author(s) Zarbout, K; Moya, G; Ahmed, AS; Damamme, G; Kallel, A |
|
Source JOURNAL OF APPLIED PHYSICS 108 (9): Art No. 094109 2010 |
|
ISSN 0021-8979 |
|
DOI 10.1063/1.3504856 |
|
Title Three-Dimensional Linear Instability Analysis of Thermocapillary Return Flow on a Porous Plane |
|
Author(s) Zhao, SC; Liu, QS; Nguyen-Thi, H; Billia, B |
|
Source CHINESE PHYSICS LETTERS 27 (2): Art No. 024707 2010 |
|
ISSN 0256-307X |
|
DOI 10.1088/0256-307X/27/2/024707 |
|
Title Thermal effects on Rayleigh-Marangoni-Benard instability in a system of superposed fluid and porous layers |
|
Author(s) Zhao, SC; Liu, QS; Liu, R; Nguyen-Thi, H; Billia, B |
|
Source INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER 53 (15-16):2951-2954 2010 |
|
ISSN 0017-9310 |
|
DOI 10.1016/j.ijheatmasstransfer.2010.04.003 |
[dernière mise à jour : janvier 2011]