 | Thierry Contaret |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Case 152 13397 Marseille Cedex 20 France | |
| téléphone : + 33 (0) 4 91 28 91 55 fax : +33 (0) 4 91 28 89 70 | |
| mail : thierry.contaret@im2np.fr |
| | Thierry Contaret |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Case 152 13397 Marseille Cedex 20 France | |
| téléphone : + 33 (0) 4 91 28 91 55 fax : +33 (0) 4 91 28 89 70 | |
| mail : thierry.contaret@im2np.fr |
Maître de conférences, Université d'Aix-Marseille
Domaines d'activité : Microcapteurs - bruit électronique - signal
Publications récentes
Contaret T., L. Varani and J.-C. Vaissière..- Simulation of current fluctuations in submicron n-MOSFETs operating in hot-carrier at RF frequencies using two-dimensional impedance field method..- Semiconductors Science Technology,.- vol. 19, p. S176-S178, 2004
Contaret T., G. Ghibaudo, A. Ferron and F. Bœuf..- Excess drain noise simulation in ultrathin oxides MOSFETs..- Journal of Computional Electronics,.- vol. 5, n° 2-3, p. 187-192, 2006
Contaret T., K. Romanjek, T. Boutchacha, G. Ghibaudo, and F. Bœuf..- Low frequency noise characterization and modeling in ultrathin oxide MOSFETs..- Solid State Electronics,.- vol. 50, p. 63-68, 2006
Contaret T., T. Boutchacha, G. Ghibaudo, F. Bœuf, T. Skotnicki..- Low frequency noise in biaxially strained silicon n-MOSFETs with ultrathin gate oxides..- Solid-State Electronics,.- vol. 51, n° 4, p. 633-637, 2007
Conférences internationales
T. Contaret, K. Romanjek, G. Ghibaudo, J. Chroboczek, F. Boeuf and T. Skotniki, "Drain and Gate Current Low Frequency Noise in advanced CMOS devices with Ultrathin gate Oxides", Proceeding of the 18th international Conference on Noise and Fluctuations edited by Tomas Gonzalez, Javier Mateos and Daniel Pardo, AIP CONFERENCE PROCEEDINGS 780, ICNF'2005, Salamanca, Spain, (septembre 2005).
T. Contaret, G. Ghibaudo, A. Ferron, and F. Boeuf, "Excess Drain Noise Simulation in Ultrathin Oxides MOSFETs", 15th international workshop on Modelling and Simulation of Electron Devices, MSED'2005, Pisa, Italie, poster session, (juillet 2005).
T. Contaret, K. Romanjek, T. Boutchacha, G. Guibaudo, and F. Boeuf, "Low Frequency Noise Characterization and Modelling in Ultrathin Oxide MOSFETs", 6th European Conference on Ultimate Integration of Silicon, ULIS'2005, Bologna, Italy, oral session, (avril 2005).
T. Contaret, L. Varani, J.C. Vaissière and D. Rigaud, "Noise Simulation in Submicron n-MOSFETs Operating at Low Frequencies Using Compact and Physical Models", Proceeding of the 14th international workshop on Modelling and Simulation of Electron Devices edited by F. Martin, J. Garcia, J. Sune, X. Oriols, J. Bonache and D. Jimenez, Barcelona, Servei de Publicacions de la Universitat Autonoma de Barcelona, pp 85-88, MSED'2003, Barcelona, Spain, oral session, (octobre 2003).
T. Contaret, L. Varani and J.C. Vaissière, "Simulation of current Fluctuations in Submicron n-MOSFETs Operating in Hot-Carrier Regime at RF Frequencies Using Two-Dimensional Impedance Field", 13th International Conference on Nonequilibrum Carrier Dynamics in Semiconductors, HCIS'2003, Modena, Italy, poster session, (juillet 2003).
T. Contaret, A. Eya'a, M. Valenza, A. Hoffmann and D. Rigaud, "Comments about 1/f noise modeling BSIM Software", Proceeding of the 16th International Conference on Noise in Physical Systemes and 1/f Fluctuations edited by Gijs Bosman, New Jersey, World Scientific, pp 669-672, ICNF'2001, Gainesville, Florida, USA, oral session, (octobre 2001).
J. Rhayem, D. Rigaud, T. Contaret, M. Valenza, N. Szydlo, H. Lebrun, "1/f noise modelling in a-Si TFTs by BSIM Software", 30th European Solid-State Device Research Conference, ESSDERC'2000, Cork, Ireland, oral session, (septembre 2000). Proceeding edited by H.E. Maes, R.P. Mertens, G. Declerck and H. Grünbacher, Neuilly, Editions Frontières, pp 152-155, (2000).
