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Professeur, Université d'Aix-Marseille

Publications récentes dans des revues avec comité de lecture

Parmentier R., Lemarchand F., Cathelino M., Lesquine M., Amra C., Labat S., Bozzo S., Bocquet F., Charai A., Thomas O.- Piezoelectric tantalum pentoxide studied for optical tunable application.- Applied Optic 41, 3270-3276 (2002)

Alfonso C., Fares L., Huiban Y., Gallet D., Ismeur M., Charai A.- Interfacial reactions in relation with adhesion failures in Al/TiN/Ti/SiO2 and Al/TiN/Ti/borophosphososilicate glass systems, .- Eur. Phys. J.: Appl. Phys. 22, 3 (2003)

Mliki N., Kaabi H., Bessaïs B., Yangui B., Saikaly W., Dominici C., Charai A.- Morphology and Microstructure at different scales of Porous Silicon prepared by a non conventional technique.- Journal of Nanoscience ans Nanotechnology 3, 413-19 (2003)

Saikaly W., Bano X., Issartel C., Rigaut G., Charai A.- Powerful microscopy techniques available for resolving complex microstructure in multiphase steels, .- Rev. Met. Paris 5, 513-521(2003)

Bocquet F., Bigault T., Alfonso C., Labat S., Thomas O., Charai A.- In situ stress measurements during the growth at different temperatures of Ag-Cu(111) multilayers.- J. Appl. Phys. 95, 1152-61 (2004)

Lamzatouar A., Palais O., Hardouin-Duparc O.B.M., Thibault J., Charai A.- Relationship between structure, segregation and electrical activity in grain boundaries.- Journ. Mat. Sci. 40, 3163-7 (2005)

Kaabi H., Mliki N., Cheynet M., Saikaly W., Gilbert O., Bessais B., Yangui B., Charai A.- Structural and optical properties of vapour-etching based porous silicon.- Cryst. Res. Technol., vol. 41, p. 154, 2006

Bernier N., Bocquet F., Allouch A., Saikaly W., Brosset C., Thibault J., Charai A.- A methodology to quantify the sp2 carbon fraction from K EELS edge spectra.- Journal of Electron Spectroscopy and Related Phenomena, vol. 164, n° 1-3, p. 34-43, 2008