Hector Mera Couto
IM2NP
Bâtiment IRPHE
49, rue Joliot Curie - BP 146
Technopôle de Château - Gombert
13384 Marseille Cedex 13
France
téléphone : +33 (0) 4 13 55 20 26
mail : hector.mera-couto@im2np.fr

Postdoc CNRS


Domaine d'activité :

Quantum transport in nanostructures: molecular junctions, nanowires, and quantum dots; non-equilibrium green's functions; many-body perturbation theory; density functional theory; tight-binding methods; effective mass approximation; model Hamiltonians; current-constrained Hamiltonians; maximum-entropy and information theory.Electron-electron, electron-phonon and  electron-impurity scattering in nanostructures.

Publications :

    1.- Many-electron quantum transport: models and theories. PhD Thesis. University of York. UK. (2005)

    2.- Asymptotic self-consistency in quantum transport calculations. Phys. Rev. B, 72, 085311 (2005)

    3.- Current-constraining variational approaches to quantum transport. Phys. Rev. B, 72, 165425 (2005)

    4.- Hartree-Fock theory of a current-carrying two-dimensional  homogeneous electron gas. Phys. Rev. B, 16, 125319 (2007)

   5.- Role of the virtual orbitals and HOMO-LUMO gap in mean-field approximations to the conductance of molecular junctions.  Phys. Rev. B, 77, 195432 (2008)

    6.-  Using Kohn-Sham density functional theory to describe charged excitations in finite systems. Phys. Rev. B 79, 125109 (2009)

    7.-  Assessing the accuracy of Kohn-Sham conductances using the Friedel sum-rule. Phys. Rev. B, 81, 035110 (2010)

    8.-  Accumulation capacitance of narrow band gap metal-oxide-semiconductor capacitors. App. Phys. Lett, 96, 233507 (2010)

    9.- Charged impurity scattering and mobility in silicon nanowires.  Phys. Rev. B 82, 115318 (2010)

   10.- Are Kohn-Sham conductances accurate? Phys. Rev. Lett. 105, 216408, (2010)

   11.-  Effective mass versus tight-binding: where is the discord?  Proceedings of the IEEE, ISBN 978-1-4244-9383-8  (2010)

   12.-  Impurity- and phonon-limited mobilities in <110>-oriented silicon nanowires. Proceedings of the IEEE, ISBN 978-1-4244-9383-8  (2010)

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