 | Yu-Jen Chen |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Case 231 13397 Marseille Cedex 20 France | |
| téléphone : +33 (0) 6 50 92 19 49 | |
| mail : yu-jen.chen@im2np.fr |
| | Yu-Jen Chen |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Case 231 13397 Marseille Cedex 20 France | |
| téléphone : +33 (0) 6 50 92 19 49 | |
| mail : yu-jen.chen@im2np.fr |
Directeur de thèse : François Flory
Financement : Fourier Scholarship
Ecole Doctorale : Physique, modélisation et sciences pour l'ingénieur
Publications :
1. Y. J. Chen, C.C.Lee, “ The simulation of uniformity in physical vapor deposition(PVD)”, Optics and Photonics Taiwan Conference, Taiwan (2003).
2. Y. J. Chen, C.C.Lee, “To analyze the uniformity of film-thickness with large area in different types of substrate holder”, Taiwan Vacuum Society Annual Meeting, Taiwan (2003).
3. Y. J. Chen, “Optical monitoring of thin-film through admittance diagram”, Master Thesis of the National Central University, Taiwan (2004).
4. Y. J. Chen, C.C.Lee, “Monitoring of multilayers by admittance diagram”, Optical Interference Coating, Topical Meeting, USA (2007)
5. Y. J. Chen, C.C.Lee, “Monitoring multilayer coatings with sensitive wavelength on admittance diagram”, Optics and Photonics Taiwan Conference, Taiwan (2007)
6. Y. J. Chen, C.C.Lee, “Wavelength sensitivity of optical admittance diagram for multilayer coatings”, International Conference on Optics Design and Fabrication, Taiwan (2008)
7. Y. J. Chen, C.C.Lee, “Monitoring multilayer coatings using admittance diagram”, Opt. Exp. 16, 6119-6124 (2008).
